公开(公告)号：US20190210068A1

公开(公告)日：2019-07-11

申请号：US15868027

申请日：2018-01-11

Applicant: Timothy L. Justice ,  Johan Calcoen ,  Gerald R. Richert ,  Bert Dirix

Inventor： Timothy L. Justice ,  Johan Calcoen ,  Gerald R. Richert ,  Bert Dirix

IPC: B07C5/342 ,  G01N21/84

CPC classification number: B07C5/342 ,  B07C5/3422 ,  B07C2501/0018 ,  G01N21/84 ,  G01N2201/06113 ,  G01N2201/10

Abstract: A method and apparatus for sorting is described, and which includes an arrangement for controllably and operably coupling to a controller, and then selectively energizing each of a background element; laser scanner; first and second electromagnetic radiation detectors; line scan imaging assembly; and selectively energizable radiators, so as to improve the detection of individual products and/or other objects of interest forming a product stream by increasing the contrast of the respective products or specific characteristics thereof, and/or objects of interest in a multiplicity of electrical signals which are received, and then processed by the controller, as the product stream passes through an inspection station.

公开(公告)号：US10082523B2

公开(公告)日：2018-09-25

申请号：US15693204

申请日：2017-08-31

Applicant: Anasys Instruments

Inventor： Honghua Yang ,  Kevin Kjoller ,  Sam Berweger ,  Craig Prater

IPC: G01Q60/18 ,  G01N21/47 ,  G01N21/35

CPC classification number: G01Q60/18 ,  G01N21/35 ,  G01N21/39 ,  G01N21/47 ,  G01N21/4738 ,  G01N2201/0612 ,  G01N2201/10 ,  G01Q30/02 ,  G01Q60/22

Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques. In other embodiments, phase and amplitude stability are improved with a novel s-SNOM configuration. In other embodiments an absorption spectrum may be obtained directly by comparing properties from a known and unknown region of a sample as a function of illumination center wavelength.

公开(公告)号：US09989466B2

公开(公告)日：2018-06-05

申请号：US14562060

申请日：2014-12-05

Applicant: Quidel Corporation

Inventor： David Dickson Booker ,  Jhobe Steadman

IPC: G01N21/27 ,  G01N21/64 ,  G01N33/543

CPC classification number: G01N21/645 ,  G01N21/274 ,  G01N21/278 ,  G01N33/54386 ,  G01N2201/062 ,  G01N2201/068 ,  G01N2201/10 ,  G01N2201/12746 ,  G01N2201/12753 ,  G01N2201/12761

Abstract: Disclosed herein is a method for improving the precision of a test result from an instrument with an optical system that detects a signal. The method comprises including in the instrument a normalization target disposed directly or indirectly in the optical path of the optical system. Also disclosed are instruments comprising a normalization target, and systems comprising such an instrument and a test device that receives a sample suspected of containing an analyte.

公开(公告)号：US09976192B2

公开(公告)日：2018-05-22

申请号：US15284396

申请日：2016-10-03

Applicant: LDIP, LLC

Inventor： Reuven Duer ,  Yun-Pei Chang ,  Ashutosh Shastry

IPC: G01N21/00 ,  C12Q1/70 ,  G01N21/64 ,  C12Q1/68 ,  B01L3/00 ,  G02B6/42 ,  G01N33/543

CPC classification number: C12Q1/703 ,  B01L3/502715 ,  B01L7/52 ,  B01L2300/0636 ,  B01L2300/0654 ,  B01L2300/0816 ,  B01L2300/0819 ,  C12Q1/6825 ,  G01N21/6428 ,  G01N21/6452 ,  G01N33/54373 ,  G01N2021/6463 ,  G01N2201/0853 ,  G01N2201/10 ,  G02B6/4226

Abstract: The invention provides methods and devices for generating optical pulses in one or more waveguides using a spatially scanning light source. A detection system, methods of use thereof and kits for detecting a biologically active analyte molecule are also provided. The system includes a scanning light source, a substrate comprising a plurality of waveguides and a plurality of optical sensing sites in optical communication with one or more waveguide of the substrate, a detector that is coupled to and in optical communication with the substrate, and means for spatially translating a light beam emitted from said scanning light source such that the light beam is coupled to and in optical communication with the waveguides of the substrate at some point along its scanning path. The use of a scanning light source allows the coupling of light into the waveguides of the substrate in a simple and cost-effective manner.

公开(公告)号：US09927371B2

公开(公告)日：2018-03-27

申请号：US14691966

申请日：2015-04-21

Applicant: KLA-Tencor Corporation

Inventor： Mark S. Wang ,  Chris Kirk ,  Andrey Kharisov

IPC: G01N21/00 ,  G01N21/88 ,  G02B21/00 ,  G02B21/36 ,  G01N21/95 ,  H01L21/66

CPC classification number: G01N21/8851 ,  G01N21/9501 ,  G01N2201/068 ,  G01N2201/10 ,  G01N2201/121 ,  G02B21/0028 ,  G02B21/0032 ,  G02B21/0072 ,  G02B21/365 ,  H01L22/12

Abstract: A line scan wafer inspection system includes a confocal slit aperture filter to remove sidelobes and enhance resolution in the scanning direction. A position detector associated with the slit aperture filter monitors and corrects illumination line image positions relative to the slit aperture to keep image position variations within tolerable limits. Each detector measures a line position and then uses the line position signal to adjust optical, mechanical, and electronic components in the collection path in a feedback loop. The feedback loop may be employed in a runtime calibration process or during inspection to enhance stability.

公开(公告)号：US09927356B2

公开(公告)日：2018-03-27

申请号：US15074840

申请日：2016-03-18

Applicant: SMS Sensors Incorporated

Inventor： Richard J. Skibo

IPC: G01N21/39 ,  G01S17/88 ,  G01N21/31 ,  G01N21/3504 ,  G01S17/95 ,  G01S7/48 ,  G01N21/53 ,  G01N21/17 ,  G01N21/47 ,  G06N99/00

CPC classification number: G01N21/39 ,  G01N21/31 ,  G01N21/3504 ,  G01N21/538 ,  G01N2021/1793 ,  G01N2021/1795 ,  G01N2021/394 ,  G01N2021/399 ,  G01N2021/4709 ,  G01N2201/10 ,  G01S7/4802 ,  G01S17/88 ,  G01S17/95 ,  G06N99/005 ,  Y02A90/19

Abstract: Systems and methods for detecting gases, airborne compounds, and other particulates, are provided. The system detects materials of interest, including but not limited to, volatile organic compounds, aerosols, particulates, and biological and other pathogens in a three dimensional volume over an area of interest. The system detects the concentration of analytes of interest in the presence of atmospheric contaminants. Data points form a three-dimensional “point cloud” to which particle swarm optimization and feature extraction algorithms are applied, providing leak detection, mapping of chemical plumes, and short-term and long-term flux measurements, among other functions.

公开(公告)号：US20170314991A1

公开(公告)日：2017-11-02

申请号：US15648035

申请日：2017-07-12

Applicant: TOKYO ELECTRON LIMITED

Inventor： Ching-Ling MENG ,  Holger TUITJE ,  Yan CHEN ,  Mihail MIHAYLOV

IPC: G01J3/443 ,  G01N21/31 ,  G01N21/68

CPC classification number: G01J3/443 ,  G01N21/31 ,  G01N21/68 ,  G01N2201/10

Abstract: Disclosed is a method, system, and apparatus for optical emission measurement. The apparatus includes a collection system for collecting a plasma optical emission spectra through an optical window disposed at a wall of a plasma processing chamber. The optical system includes a mirror configured to scan a plurality of non-coincident rays across the plasma processing chamber; and a telecentric coupler for collecting an optical signal from a plasma and directing the optical signal to a spectrometer for measuring the plasma optical emission spectra.

公开(公告)号：US09784677B2

公开(公告)日：2017-10-10

申请号：US14850730

申请日：2015-09-10

Applicant: Electronics and Telecommunications Research Institute

Inventor： Jong Deog Kim ,  Mi-ryong Park ,  Dongseung Shin

IPC: G01N21/55 ,  G01N21/59 ,  G01N21/17

CPC classification number: G01N21/59 ,  G01N21/5911 ,  G01N2021/1793 ,  G01N2201/06113 ,  G01N2201/10

Abstract: A vehicle window visible ray transmittance remote sensing system emits a plurality of laser beams to a driving vehicle, estimates transmittance of a window of the vehicle by acquiring a plurality of point data of a plurality of points from which a plurality of laser beams are reflected from a surface of the vehicle, and distinguishes a vehicle that deviates from a transmittance reference based on the estimated window transmittance.

公开(公告)号：US09719928B2

公开(公告)日：2017-08-01

申请号：US15189300

申请日：2016-06-22

Applicant: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.

Inventor： Stefan W. Hell

IPC: G01N21/64 ,  G01B11/14 ,  G02B21/00 ,  G02B21/16 ,  G02B21/36 ,  G02B27/58

CPC classification number: G01N21/6458 ,  G01B11/14 ,  G01N2201/068 ,  G01N2201/10 ,  G02B21/0032 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/16 ,  G02B21/367 ,  G02B27/58

Abstract: In order to determine the locations of individual fluorescent molecules in a sample, which keep a minimum distance with regard to each other, the individual molecules are excited for emission of fluorescence light by means of excitation light. The fluorescence light is registered for different positions of a zero point of an intensity distribution of the excitation light. The distance between these positions is at least half the minimum distance of the fluorescent molecules. The locations of the fluorescent molecules are derived from the course of the intensity of the fluorescence light over the positions of the zero point of the excitation light.

公开(公告)号：US20170176320A1

公开(公告)日：2017-06-22

申请号：US15379546

申请日：2016-12-15

Applicant: rap.ID Particle Systems GMBH

Inventor： Karsten GOEDE ,  Lothar HOLZ ,  Markus LANKERS ,  Oliver K. VALET

IPC: G01N21/03 ,  G01N33/483 ,  G01N21/65

CPC classification number: G01N21/03 ,  G01J3/44 ,  G01N21/65 ,  G01N33/483 ,  G01N2021/0385 ,  G01N2021/0389 ,  G01N2201/0846 ,  G01N2201/10

Abstract: The invention relates to a system (1) for confocal Raman-spectroscopic measurements, comprising at least the following components: a sample chamber (10), wherein said sample chamber (10) is configured to house a sample (2) in a closed chamber volume (12) of the sample chamber (10), an excitation light source (3), an objective lens (4), configured to focus excitation light (32) of the excitation light source (3) through a ceiling portion (11) of the sample chamber (10) in a focal volume (31) in the chamber volume (12) and to collect inelastically scattered light (33) stemming from the focal volume (31), a confocal detection arrangement (20), comprising means for a confocal detection (22, 23) of a Raman signal comprised in the inelastically scattered light (33) from the focal volume (31), and a detector (21) that is configured to detect and to record said Raman signal, wherein the distance (5) between the ceiling portion (11) of the sample chamber (10) and the focal volume (31) is greater than one millimetre during operation of the system (1).