Abstract:
A spectrograph having multiple excitation wavelength ranges is disclosed. The spectrograph can include a wavelength switching mechanism to switch between different wavelength ranges in accordance with the wavelength of an incoming light signal. The wavelength switching mechanism can include multiple optical assemblies (or elements) corresponding to the different wavelength ranges for processing the incoming light signal. The mechanism can also include a switching component for switching the optical assemblies to align the appropriate assembly with the incoming light signal. Each optical assembly can include one or more transmission gratings to disperse the incoming light signal into multiple wavelengths within a particular wavelength range and a reflecting mirror proximate to the grating(s) to reflect the wavelengths of light back through the grating(s) to photodetectors for measuring to wavelengths to generate a light spectrum. The spectrograph can be used in Raman spectroscopy.
Abstract:
System and method for spatially and spectrally parallelized FAST. A sample is illuminated to thereby produce interacted photons. The photons are passed through a filter and received at a two-dimensional end of a FAST device wherein said FAST device comprises a two-dimensional array of optical fibers drawn into a one-dimensional fiber stack so as to effectively convert a two-dimensional array of optical fibers into a curvilinear field of view, and wherein said two-dimensional array of optical fibers is configured to receive said photons and transfer said photons out of said fiber array spectral translator device and to a spectrograph through said one-dimensional fiber stack wherein said one-dimensional fiber stack comprises at least two columns of fibers spatially offset in parallel at the entrance slit of said spectrograph. The photons are then detected at a detector to thereby obtain a spectroscopic data set representative of the sample.
Abstract:
A detection system is used during irradiation of an interaction region of a structure with laser light. The structure includes embedded material. The detection system includes means for receiving light emitted from the interaction region. The detection system further includes means for separating the received light into a spectrum of wavelengths. The detection system further includes means for analyzing at least a portion of the spectrum for indications of embedded material within the interaction region.
Abstract:
A device and a method for implementing a photo-spectrometer unit (20), or PSU (20), for use with a spectrometry system (100) having optical means (12), and electronic means (13) is disclosed. The PSU is formed in a two-step manufacturing process to form a chip having a monolithic structure. The chip has a first surface and second surface. During the first manufacturing process step, optical means are integrally formed on the first surface (301), and during the second manufacturing process step, electronic means are formed on the second surface (302). The chip is transparent to electromagnetic radiations, and the PSU has at least one optical deflecting element (32) for guiding received radiations through the chip, for establishing direct optical path coupling between an optical element formed on the first surface and an electronic element formed on the second surface.
Abstract:
Systems and methods are disclosed for positioning or storing an electro-optical instrument (e.g., spectrophotometer) within a printing device to facilitate calibration or maintenance of the instrument. In various embodiments, the electro-optical instrument may be pivoted or moved to an inclined position to facilitate calibration of the instrument relative to one or more calibration references. The electro-optical instrument may also be moved or inclined along a travel path in the printing device to a position or positions adjacent to various calibration references.
Abstract:
System, method, and apparatus for determining the composition of a sample of material. In one embodiment, the method pertains to the counting of photons that were inelastically scattered by the sample, and for minimizing the effects of fluorescent or phosphorescent photons. In yet another embodiment of the invention, a sample is illuminated by a repetitive pulse of monochromatic light, and the resultant scattered photons from the samples are collected and counted during a predetermined integration period. Yet other embodiments pertain to a low-cost, computer-controlled system for repetitively counting inelastically scattered photons so as to create a Raman histogram and a Raman spectrogram of the photons.
Abstract:
Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.
Abstract:
In the spectrometer 1, a lens portion 3 having a spherical surface 35 on which a spectroscopic portion 4 is provided and a bottom plane 31 in which a light detecting element 5 is disposed, has a side plane 32 substantially perpendicular to the bottom plane 31 and a side plane 34 substantially perpendicular to the bottom plane 31 and the side plane 32. Then, a package 11 that houses a spectroscopy module 10 has side planes 16 and 18 respectively coming into planar-contact with the side planes 32 and 34, and contact portions 22 coming into contact with the spherical surface 35. Therefore, the side planes 32 and 34 of the lens portion 3 are respectively brought into planar-contact with the side planes 16 and 18 of the package 11 while bringing the spherical surface 35 of the lens portion 3 into contact with the contact portions 22 of the package 11, that positions the spectroscopic portion 4 and the light detecting element 5 with respect to a light incident window plate 25 of the package 11.
Abstract:
Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.
Abstract:
A system and method for determining at least one of: a disease state, a metabolic state, a clinical outcome, and a disease progression of a test renal or prostate sample. A test Raman data set is obtained from the sample wherein said test Raman data set may comprise at least one of a plurality of Raman spectra and a plurality of spatially accurate wavelength resolved Raman images. The test Raman data set is compared to a plurality of reference Raman data sets using a chemometric technique. For analysis of renal samples, each of these reference Raman data sets may have an associated known renal sample and an associated known metabolic state, clinical outcome, and/or disease progression. For analysis of prostate samples, each of these reference Raman data sets may have an associated known prostate sample and an associated known disease state, metabolic state, clinical outcome, and/or disease progression.