Abstract:
The present invention concerns a system and method for identifying and implementing a correction to spectrometer measurements in order to compensate for errors in the measurement values due to second order diffracted light. The present invention in one configuration, measures light reflectance percentages across the same wavelength range for at least one calibration target. From these measurements the portion of the reflectance values resulting from second order diffracted light is identified and corrected for, thereby generating a compensated measurement of the reflectance values of a sample. These compensated values are then provided to a user.
Abstract:
At least one terahertz-wave generation device configured to generate a terahertz wave includes a polarization control unit configured to control a polarization direction of light from a light source, and a waveguide including a nonlinear optical crystal disposed such that the light having the polarization direction controlled by the polarization control unit is incident on the nonlinear optical crystal. The nonlinear optical crystal emits a terahertz wave upon the light being incident thereon. The polarization control unit is further configured to control an electric-field intensity of the light to be incident on the nonlinear optical crystal in a direction of a Z-axis of the nonlinear optical crystal.
Abstract:
Infrared detection device comprising a gas detection device comprising: a resistive layer, a first portion of which is able to emit infrared radiation able to be absorbed by the gas to be detected, and a second portion of which is thermally coupled to a first element for the thermoresistive transduction of said infrared radiation; a substrate comprising an electronic circuit for controlling and reading the gas detection device; portions of electrically conductive material electrically connecting the first portion and the first thermoresistive transduction element to the electronic circuit, and providing mechanical holding of the first and second portions opposite the substrate so that a distance between the first portion and the substrate is substantially equal to a distance between the second portion and the substrate.
Abstract:
A device for recording an absorption spectrum of a fluid has a radiation source (1) that emits a radiation in a spectral range along a beam path (11), a measuring path (5), along which the radiation passes through the fluid and arranged in the beam path, a tunable Fabry-Perot interferometer (7), arranged in the beam path and transmitting radiation in the spectral range as a displaceable bandpass filter, and a detector (9, 35) measuring the intensity of the radiation in the spectral range. An etalon (3) is arranged for spectral modulation of radiation in the beam path and has a plurality of transmission maxima (17) in the spectral range. The bandpass filter, formed by the Fabry-Perot interferometer (7), is displacable across the spectral range such that spectral modulation of the radiation by the etalon (3) is measured by the detector (9, 35) as a modulation of radiation intensity over time.
Abstract:
A terahertz-wave generating element includes a waveguide including an electro-optic crystal; an optical coupling member that extracts a terahertz wave, which is generated from the electro-optic crystal as a result of light propagating through the waveguide, to a space; and at least two electrodes that cause a first-order electro-optic effect in the electro-optic crystal by applying an electric field to the waveguide so as to change a propagation state of the light propagating through the waveguide. A crystal axis of the electro-optic crystal of the waveguide is set such that the terahertz wave generated by a second-order nonlinear optical process and the light propagating through the waveguide are phase-matched.
Abstract:
Systems and methods for controlling the optical path length between a feedback enabled laser and a cavity, and hence the optical feedback phase. A phasor element, positioned along an optical path between the laser and the cavity coupling mirror, includes a gas medium within a volume defined by the phasor element. The phasor element is configured to adjust or control an optical path length of the laser light between the laser and the cavity coupling mirror by adjusting or controlling a density of the gas medium within the phasor volume.
Abstract:
Apparatus for analyzing, identifying, or imaging a target is configured to avoid and/or prevent nulls that may occur periodically during a terahertz sweep. Exemplary apparatus may utilize a second harmonic lock-in amplifier to generate an error signal used to adjust a DC bias of a phase modulator to maintain an in-phase relationship between beams to avoid nulls in an output signal during frequency sweeping.
Abstract:
Provided a terahertz-wave detection element with high spatial resolution and suppressing a crack occurrence. A method of manufacturing the detection element capable of detecting a spatial intensity distribution of a terahertz wave includes: a step of forming an oxide layer on one main surface of a first substrate consisting of an electro-optic crystal; a step of joining the one main surface of the first substrate and a second substrate by an adhesive consisting; a step of thinning the first substrate of a joined body, to a thickness of 1-30 μm by polishing the first substrate; and a step of obtaining a large number of terahertz-wave detection elements by cutting the joined body. The oxide layer is formed such that the first substrate becomes convex to a side of the one main surface by causing a tensile stress to act on it.
Abstract:
An optical system for use in material processing includes a plurality of semiconductor diodes coupled to a beam combiner to generate a multiplexed optical beam. A cladding pumped fiber amplifier or laser receives the multiplexed optical beam and forms an intermediate beam having at least a first wavelength. An optical element receives the intermediate beam and forms an output beam with an output beam wavelength, wherein the output beam wavelength is at least in part longer than the first wavelength. A subsystem includes lenses or mirrors to deliver a delivered portion of the output beam to a sample. The delivered output beam has a temporal duration greater than about 30 picoseconds, a repetition rate between continuous wave and Megahertz or higher, and a time averaged intensity of less than approximately 50 MW/cm2. The output beam has a time averaged output power of 20 mW or more.
Abstract translation:用于材料处理的光学系统包括耦合到光束组合器的多个半导体二极管以产生多路复用的光束。 包层泵浦光纤放大器或激光器接收复用的光束并形成具有至少第一波长的中间光束。 光学元件接收中间光束并形成具有输出光束波长的输出光束,其中输出光束波长至少部分地长于第一波长。 子系统包括透镜或反射镜,用于将输出光束的传送部分传送到样品。 所输出的输出光束具有大于约30皮秒的时间持续时间,连续波和兆赫兹或更高之间的重复频率以及小于约50MW / cm 2的时间平均强度。 输出光束的时间平均输出功率为20mW以上。
Abstract:
A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26).