Abstract:
Implementations of the present disclosure involve an apparatus and method to measure the long-wave irradiance of the atmosphere or long-wave source. The apparatus may involve a thermopile, a concentrator and temperature controller. The incoming long-wave irradiance may be reflected from the concentrator to a thermopile receiver located at the bottom of the concentrator to receive the reflected long-wave irradiance. In addition, the thermopile may be thermally connected to a temperature controller to control the device temperature. Through use of the apparatus, the long-wave irradiance of the atmosphere may be calculated from several measurements provided by the apparatus. In addition, the apparatus may provide an international standard of pyrgeometers' calibration that is traceable back to the International System of Units (SI) rather than to a blackbody atmospheric simulator.
Abstract:
An optoelectronic detector and method of using same. In order to avoid any condensation on a surface, it has been known to heat such a surface. However, heating an optoelectronic detector will create a stronger hissing noise due to the greater dark current that is caused thereby. The invention is intended to avoid any condensation on an optoelectronic detector without airtight encapsulation. To this end, the detector is cooled and equipped with a sensor for the determination of a current value of one of the variables ambient humidity and ambient dew point temperature and a control unit that is connected with the sensor and designed to control the cooling device in dependence of such a value. By taking into account the ambient humidity or, respectively, the dew point temperature in the control of the cooling device, condensation on the detector can be avoided. An airtight encapsulation of the detector and the cooling device is not required.
Abstract:
The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).
Abstract:
A method of visually detecting a leak of a chemical emanating from a component. The method includes: aiming a passive infrared camera system towards the component; filtering an infrared image with an optical bandpass filter, the infrared image being that of the leak; after the infrared image passes through the lens and optical bandpass filter, receiving the filtered infrared image with an infrared sensor device; electronically processing the filtered infrared image received by the infrared sensor device to provide a visible image representing the filtered infrared image; and visually identifying the leak based on the visible image. The passive infrared camera system includes: a lens; a refrigerated portion including therein the infrared sensor device and the optical bandpass filter (located along an optical path between the lens and the infrared sensor device). At least part of a pass band for the optical bandpass filter is within an absorption band for the chemical.
Abstract:
A radiation detecting apparatus includes a radiation conversion panel for detecting the radiation which has passed through the subject and converting the detected radiation into radiation image information, a temperature sensor for detecting a temperature of the radiation conversion panel, and a sensitivity corrector for correcting at least one of a sensitivity, a dark current, a density step, and a residual image of the radiation conversion panel based on the temperature detected by the temperature sensor.
Abstract:
A detector comprises a housing (1) having a window (3), a measuring and processing unit (2), a source (4) of electromagnetic radiation, a plurality of sensors (7), and a reflector (6). The measuring and processing unit (2), the electromagnetic radiation source (4) and the sensors (7) are mounted within the housing (1). The reflector (6) is mounted outside the housing (1). The reflector (6) is positioned to reflect electromagnetic radiation passing through the window (3) from the electromagnetic radiation source (4) onto the sensors (7) via the window. The sensors (7) are operatively associated with the measuring and processing unit (2) to provide that unit with an input indicative of the level of electromagnetic radiation reaching the sensors.
Abstract:
An optoelectronic detector and method of using same. In order to avoid any condensation on a surface, it has been known to heat such a surface. However, heating an optoelectronic detector will create a stronger hissing noise due to the greater dark current that is caused thereby. The invention is intended to avoid any condensation on an optoelectronic detector without airtight encapsulation. To this end, the detector is cooled and equipped with a sensor for the determination of a current value of one of the variables ambient humidity and ambient dew point temperature and a control unit that is connected with the sensor and designed to control the cooling device in dependence of such a value. By taking into account the ambient humidity or, respectively, the dew point temperature in the control of the cooling device, condensation on the detector can be avoided. An airtight encapsulation of the detector and the cooling device is not required.
Abstract:
The present invention relates to an integrating sphere for measuring a light-emitting property of a light source, and more particularly, to an integrating sphere having a means for controlling temperature inside the integrating sphere. An integrating sphere for measuring an optical property of a light source according to the present invention has a substantially spherical hollow space formed therein; a first through-hole provided such that a wire for supplying electric power to the light source installed inside the hollow space of the integrating sphere passes therethrough; and a second through-hole provided such that temperature-controlled air is supplied into the hollow space of the integrating sphere therethrough. A light source support, which has one end disposed at the center of the hollow space of the integrating sphere and the other end fixed to an inner peripheral surface so as to hermetically seal the first through-hole of the integrating sphere, is installed within the hollow space. The integrating sphere includes an air supply tube fixed to an outer peripheral surface of the integrating sphere where the second through-hole is formed, so that air can be supplied to the interior of the integrating sphere through the second through-hole; an air supply means for supplying air to the air supply tube; a temperature control means for controlling the temperature of air being supplied from the air supply means and passing through the air supply tube; and a shielding plate installed to be spaced apart by a predetermined distance from the second through-hole.
Abstract:
The present invention relates to an integrating sphere for measuring a light-emitting property of a light source, and more particularly, to an integrating sphere having a means for controlling temperature inside the integrating sphere. An integrating sphere for measuring an optical property of a light source according to the present invention has a substantially spherical hollow space formed therein; a first through-hole provided such that a wire for supplying electric power to the light source installed inside the hollow space of the integrating sphere passes therethrough; and a second through-hole provided such that temperature-controlled air is supplied into the hollow space of the integrating sphere therethrough. A light source support, which has one end disposed at the center of the hollow space of the integrating sphere and the other end fixed to an inner peripheral surface so as to hermetically seal the first through-hole of the integrating sphere, is installed within the hollow space. The integrating sphere includes an air supply tube fixed to an outer peripheral surface of the integrating sphere where the second through-hole is formed, so that air can be supplied to the interior of the integrating sphere through the second through-hole; an air supply means for supplying air to the air supply tube; a temperature control means for controlling the temperature of air being supplied from the air supply means and passing through the air supply tube; and a shielding plate installed to be spaced apart by a predetermined distance from the second through-hole.
Abstract:
Methods and apparatus for measuring and/or controlling the temperature on the surface or inside of micro chips are provided, including using thermally responsive polymers.