Abstract:
A method and apparatus for convolving spectroscopic data with certain phase information for practicing phase-compensated sensitivity-enhanced spectroscopy (PCSES). PCSES uses a beam of radiation in a polarization state PSp from a source emitting at a plurality of wavelengths, and places in the beam a compensator capable of altering polarization state PSp by applying a delimited phase shift Δ between two orthogonal polarization axes of the radiation to restrict a finely-vibrating spectrum. A sample disposed in the beam after the compensator generates a response beam by reflection, transmission or even both. A polarization state PSa of the response beam is passed to a detector to determine a spectrum of the response beam. A first spectrum is collected when polarization states PSp, PSa and the compensator are in a first polarization-altering configuration and a second spectrum is collected when polarization states PSp, PSa and the compensator are in a second polarization-altering configuration. A phase-compensated spectrum is then derived from just the first and second spectra thereby allowing the user to undertake optical characterization, including the measurement of film thickness t and complex indices of refraction n, k of the sample with as few as just two polarization-altering configurations.
Abstract:
The present invention relates to a system and methods for acquiring two-dimensional Fourier transform (2D FT) spectra. Overlap of a collinear pulse pair and probe induce a molecular response which is collected by spectral dispersion of the signal modulated probe beam. Simultaneous collection of the molecular response, pulse timing and characteristics permit real time phasing and rapid acquisition of spectra. Full spectra are acquired as a function of pulse pair timings and numerically transformed to achieve the full frequency-frequency spectrum. This method demonstrates the ability to acquire information on molecular dynamics, couplings and structure in a simple apparatus. Multi-dimensional methods can be used for diagnostic and analytical measurements in the biological, biomedical, and chemical fields.
Abstract:
Before the diffraction from a diffracting structure on a semiconductor wafer is measured, where necessary, the film thickness and index of refraction of the films underneath the structure are first measured using spectroscopic reflectometry or spectroscopic ellipsometry. A rigorous model is then used to calculate intensity or ellipsometric signatures of the diffracting structure. The diffracting structure is then measured using a spectroscopic scatterometer using polarized and broadband radiation to obtain an intensity or ellipsometric signature of the diffracting structure. Such signature is then matched with the signatures in the database to determine the grating shape parameters of the structure.
Abstract:
A method for manufacturing an optical element in which a display quality of a projection image is improved is provided. The method is for manufacturing an optical element having a polarization plate of which one side a transmissive member is bonded. The method includes preparing a light source, a polarization plate, a transmissive member, a certificating polarization plate and a spectrophotometer; arranging the polarization plate, the transmissive member, and the certificating polarization plate between the light source and the spectrophotometer; measuring a light transmittance spectrum of a predetermined wavelength at each rotational position of the transmissive member; determining the rotational position of the transmissive member that yields a smallest value for a difference between a maximum value and a minim value of the light transmittance spectrum; and bonding the transmissive member to the polarization plate at the determined rotational position.
Abstract:
An apparatus for separating fluorescent light from light elastically scattered/reflected from a material illuminated with a broadband illumination source includes a polarization discriminator, which separates the substantially polarized elastically scattered/reflected light from the unpolarized fluorescent light, and a spectrometer to analyze the full and separated reflectance spectra. A linear polarizer may be provided to polarize the illumination source. A method for separating fluorescence light induced in a material by broadband light from an elastic scattering/reflection component includes providing polarization discrimination to separate the components, the fluorescence light being substantially unpolarized, and spectrally analyzing the reflectance components. The method may include linearly polarizing the light source. A fluorescence spectra may be extracted from a minimum reflectance spectra or from a residual polarization reflectance spectra.
Abstract:
The invention is directed to an arrangement for an optical system for polarizalion-dependent, time-resolved optical spectroscopy, in particular a spectrometer that includes a polarization device which has a crystal polarizer and includes a light entry area which is arranged upstream of the polarization device and which is formed in such a way as to enclose a spatial acceptance angle of the crystal polarizer, and also that includes a light exit area which is arranged downstream of the polarization device, wherein an intermediate area which connects the light entry area and the light exit area is formed in the polarization device with a path length of at most approximately 4 mm which is traversed in the crystal polarizer by light impinging within the spatial acceptance angle. The invention also is directed to an optical measurement system comprising an arrangement, and also to a method for the polarization-dependent spectroscopic analysis of measurement light, in particular in time-resolved optical spectroscopy.
Abstract:
An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result of subwavelength dimensions and near-field effect, resolution can break the diffraction limit and even reach nanoscale. The microscope has a fast speed, works with soft sample and sample in solution, and is capable of dynamic observations. In addition, the array surface doubles as a platform for molecule manipulation.
Abstract:
A method and apparatus for polarization measurements. A polarization state of an optical signal can be determined using a polarization analyzer comprising a polarization controller, a polarizer, a wavelength dispersive element and a photo-detector. The method and apparatus can be applied to polarization and polarization mode dispersion measurements in wavelength division multiplexed communication systems.
Abstract:
An imaging spectrometer is disclosed that comprises imaging means for dividing a received image into two or more spatially separated images and means for detecting each spectral image, and is characterised in that the imaging means comprises at least one polarizing beam splitter. The polarizing beam splitter may be a Wollaston prism. In one embodiment of the invention, the imaging means comprises image replication means to produce two or more spatially separated images, and one or more filter elements such as dichroic filters which act to alter the spectral characteristics of one or more of the spatially separated images. In a further embodiment of the invention the imaging means comprises one or more spectral replication means arranged in optical series, each spectral replication means comprising an optical retardation element and a polarising beam splitter.
Abstract:
An optical path switch divides sample path radiation into a time series of alternating first polarized components and second polarized components. The first polarized components are transmitted along a first optical path and the second polarized components along a second optical path. A first gasless optical filter train filters the first polarized components to isolate at least a first wavelength band thereby generating first filtered radiation. A second gasless optical filter train filters the second polarized components to isolate at least a second wavelength band thereby generating second filtered radiation. A beam combiner combines the first and second filtered radiation to form a combined beam of radiation. A detector is disposed to monitor magnitude of at least a portion of the combined beam alternately at the first wavelength band and the second wavelength band as an indication of the concentration of the substance in the sample path.