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    APPARATUS AND METHOD FOR CONTROLLING FREQUENCY ANALYSIS PROCESSING, AND SENSOR MODULE
    11.
    发明申请
    APPARATUS AND METHOD FOR CONTROLLING FREQUENCY ANALYSIS PROCESSING, AND SENSOR MODULE 审中-公开

    公开(公告)号：US20170268932A1

    公开(公告)日：2017-09-21

    申请号：US15417448

    申请日：2017-01-27

    Applicant: FUJITSU LIMITED

    Inventor： Satoshi Tanabe

    IPC: G01J11/00

    CPC classification number: G01J11/00 ,  A61B5/0002 ,  A61B5/024 ,  A61B5/02416 ,  A61B5/7257 ,  G01J1/0228

    Abstract: An apparatus for controlling a frequency analysis processing includes: a memory; and a processor coupled to the memory and configured to execute a fast Fourier transform process that includes performing a fast Fourier transform operation on data of two groups into which sensor data sensed at a first sampling frequency by a sensor is divided, and execute a change process that includes changing, in a case where results of butterfly operations of the fast Fourier transform operation are similar between the two groups, a sampling frequency at which the sensor operates to a second sampling frequency lower than the first sampling frequency.

    Methods and apparatus for high speed camera
    13.
    发明授权
    Methods and apparatus for high speed camera 有权
    高速摄像机的方法和装置

    公开(公告)号：US09451177B2

    公开(公告)日：2016-09-20

    申请号：US14304507

    申请日：2014-06-13

    Applicant: Ramesh Raskar ,  Christopher Barsi

    Inventor： Ramesh Raskar ,  Christopher Barsi

    IPC: G01J1/42 ,  H04N5/243 ,  H04N5/235 ,  H04N5/30 ,  H01J31/50 ,  G01J11/00

    CPC classification number: H04N5/243 ,  G01J11/00 ,  H01J31/50 ,  H04N5/2354 ,  H04N5/30

    Abstract: In exemplary implementations of this invention, a camera can capture multiple millions of frames per second, such that each frame is 2D image, rather than a streak. A light source in the camera emits ultrashort pulses of light to illuminate a scene. Scattered light from the scene returns to the camera. This incoming light strikes a photocathode, which emits electrons, which are detected by a set of phosphor blocks, which emit light, which is detected by a light sensor. Voltage is applied to plates to create an electric field that deflects the electrons. The voltage varies in a temporal “stepladder” pattern, deflecting the electrons by different amounts, such that the electrons hit different phosphor blocks at different times during the sequence. Each phosphor block (together with the light sensor) captures a separate frame in the sequence. A mask may be used to increase resolution.

    Abstract translation: 在本发明的示例性实现中，相机可以每秒捕获数百万帧，使得每个帧是2D图像，而不是条纹。 相机中的光源会发出超短脉冲的光线照亮场景。 来自场景的散射光返回到相机。 该入射光照射发射电子的光电阴极，该光电子由一组由光传感器检测到的发光的磷光体块检测。 将电压施加到板上以产生使电子偏转的电场。 电压在时间“梯形图”模式中变化，使电子偏转不同的量，使得电子在序列期间的不同时间击中不同的荧光体块。 每个荧光体块（与光传感器一起）在序列中捕获单独的帧。 可以使用掩模来提高分辨率。

    MEASURING APPARATUS AND MEASURING METHOD
    14.
    发明申请
    MEASURING APPARATUS AND MEASURING METHOD 有权
    测量装置和测量方法

    公开(公告)号：US20160245703A1

    公开(公告)日：2016-08-25

    申请号：US15017730

    申请日：2016-02-08

    Applicant: SCREEN Holdings Co., Ltd.

    Inventor： Yasuhiro TAKASE ,  Hidetoshi NAKANISHI ,  Motohiro KONO ,  Kazuo KINOSE

    IPC: G01J11/00 ,  G01R29/08 ,  G01N33/20

    CPC classification number: G01J11/00 ,  G01N21/3586 ,  G01N21/8422 ,  G01N33/20 ,  G01N2021/8427 ,  G01R29/08

    Abstract: A measuring apparatus measure the amount of a metal catalyst supported on a sample that has a membrane of a metal catalyst layer containing the metal catalyst. The measuring apparatus includes a terahertz-wave emitting part that emits a terahertz wave in the range of 0.01 to 10 THz to the sample, a transmitted-terahertz-wave detection part that detects the electric field intensity of a transmitted terahertz wave that has passed through the sample, a storage that stores correlation information acquired in advance and indicating the correlation between the amount of the metal catalyst supported and the electric field intensity of the transmitted terahertz wave, and an amount-of-catalyst-supported acquisition module that acquires the amount of the metal catalyst supported on the sample, on the basis of the correlation information and the electric field intensity of the transmitted terahertz wave detected by the transmitted-terahertz-wave detection part.

    Abstract translation: 测量装置测量负载在具有含有金属催化剂的金属催化剂层的膜的样品上的金属催化剂的量。 测量装置包括向样品发射0.01至10THz范围内的太赫兹波的太赫兹波发射部分，检测已经通过的透射太赫兹波的电场强度的透射太赫兹波检测部分 存储器，其存储预先获取的相关信息，并且指示所支持的金属催化剂的量与所传输的太赫兹波的电场强度之间的相关性以及获得量的催化剂负载的获取模块 基于由透射太赫兹波检测部检测出的相关信息和透射太赫兹波的电场强度，支撑在样品上的金属催化剂。

    Optical systems and methods employing a polarimetric optical filter
    16.
    发明授权
    Optical systems and methods employing a polarimetric optical filter 有权
    使用偏振光学滤光器的光学系统和方法

    公开(公告)号：US09347832B2

    公开(公告)日：2016-05-24

    申请号：US14025224

    申请日：2013-09-12

    Applicant: Bodkin Design And Engineering LLC

    Inventor： Andrew Bodkin ,  James T. Daly

    IPC: G01J4/04 ,  G01J3/28 ,  G01J3/51 ,  G01J11/00 ,  G01J3/02

    CPC classification number: G01J4/04 ,  G01J3/0208 ,  G01J3/0224 ,  G01J3/2823 ,  G01J3/51 ,  G01J11/00 ,  G01J2003/2826

    Abstract: A birefringent filter includes an EM directing element in optical alignment with a first surface of the birefringent plate. A polarimetric imager includes a birefringent filter including a birefringent plate formed of a birefringent material and an EM directing element in optical alignment with a first surface of the birefringent plate. The imager further includes a detector in optical alignment with a second surface of the birefringent plate. A projection system includes an EM directing element and a birefringent filter. The filter includes (1) a birefringent plate formed of a birefringent material and having a first surface in optical alignment with the emissions source, and (2) an EM directing element in optical alignment with a second surface of the birefringent plate.

    Abstract translation: 双折射滤光器包括与双折射板的第一表面光学对准的EM引导元件。 偏振成像器包括双折射滤光器，其包括由双折射材料形成的双折射板和与双折射板的第一表面光学对准的EM引导元件。 成像器还包括与双折射板的第二表面光学对准的检测器。 投影系统包括EM定向元件和双折射滤光器。 滤光器包括（1）由双折射材料形成并具有与放射源光学对准的第一表面的双折射板，和（2）与双折射板的第二表面光学对准的EM引导元件。

    Device for processing an optical pulse to measure the contrast of this pulse, and contrast measurement system using the device
    17.
    发明授权
    Device for processing an optical pulse to measure the contrast of this pulse, and contrast measurement system using the device 有权
    用于处理光脉冲以测量该脉冲的对比度的装置，以及使用该装置的对比度测量系统

    公开(公告)号：US09335221B2

    公开(公告)日：2016-05-10

    申请号：US14435903

    申请日：2013-10-22

    Applicant: Commissariat à l'ènergie atomique et aux énergies alternatives

    Inventor： Jérôme Dubertrand

    IPC: G01J1/42 ,  G01J11/00

    CPC classification number: G01J11/00

    Abstract: Device for processing an optical pulse to measure the temporal contrast of this pulse, and system for measuring the contrast using the device. This device comprises: a device (2) receiving the pulse and providing the peak and pedestal of the pulse; a device (4) to create a temporal shift between the peak and the pedestal; a device (6) to attenuate the peak such that its level is of the same order of magnitude as the level of the pedestal; and a device (8) to multiplex the peak and the pedestal. The contrast is then equal to the ratio of the peak level to the pedestal level, these levels being corrected by the attenuations applied to them in the processing device.

    Abstract translation: 用于处理光脉冲以测量该脉冲的时间对比度的装置，以及使用该装置测量对比度的系统。 该装置包括：接收脉冲并提供脉冲的峰值和基准的装置（2）; 在所述峰和所述基座之间产生时间偏移的装置（4）; 用于衰减峰值使得其电平与基座的电平相同数量级的装置（6）; 以及用于复用峰值和基座的装置（8）。 然后，对比度等于峰值电平与基座电平的比值，这些电平通过在处理装置中施加到它们的衰减来校正。

    Spatiotemporally resolved far-field pulse contrast measuring method and device
    18.
    发明申请
    Spatiotemporally resolved far-field pulse contrast measuring method and device 审中-公开
    时空解析远场脉冲对比度测量方法及装置

    公开(公告)号：US20160033324A1

    公开(公告)日：2016-02-04

    申请号：US14530818

    申请日：2014-11-02

    Applicant: SHANGHAI JIAO TONG UNIVERSITY

    Inventor： Liejia Qian ,  Jingui Ma ,  Peng Yuan ,  Jing Wang ,  Yongzhi Wang ,  Guoqiang Xie ,  Dianyuan Fan

    IPC: G01J1/04

    CPC classification number: G01J11/00 ,  G06T3/0087 ,  G06T5/002

    Abstract: A spatiotemporally resolved far-field pulse contrast measuring device includes a plano-convex cylindrical lens, a nonlinear correlation crystal, a plano-convex imaging lens and a signal-receiving system. The signal-receiving system includes a fiber array, a photomultiplier and a digital oscilloscope. A measuring method of the device includes steps of: focusing an under-test beam in x dimension to make a focus of the under-test beam fall onto a front surface of the nonlinear correlation crystal; making a spatial correlation and a temporal correlation respectively in two transverse spatial dimensions (x-y) of the nonlinear correlation crystal by the far-field under-test beam and a sampling beam; generating a two-dimensional correlating signal by the spatiotemporal correlation; imaging the two-dimensional correlating signal by an imaging system onto a detection surface of a receiver system; and measuring the x-dimensional and y-dimensional intensity distributions of the correlating signal highly dynamically by the receiver system.

    Abstract translation: 时空解析的远场脉冲对比度测量装置包括平凸柱面透镜，非线性相关晶体，平凸成像透镜和信号接收系统。 信号接收系统包括光纤阵列，光电倍增管和数字示波器。 该装置的测量方法包括以下步骤：将未测试光束聚焦在x维度上，以使被测光束的焦点落在非线性相关晶体的前表面上; 通过远场测试光束和采样光束分别在非线性相关晶体的两个横向空间维度（x-y）中分别进行空间相关和时间相关; 通过时空相关产生二维相关信号; 通过成像系统将二维相关信号成像到接收机系统的检测表面上; 并且由接收机系统高度动态地测量相关信号的x维和y维强度分布。

    Device and method for characterizing a light beam
    20.
    发明授权
    Device and method for characterizing a light beam 有权
    用于表征光束的装置和方法

    公开(公告)号：US09243957B2

    公开(公告)日：2016-01-26

    申请号：US14124781

    申请日：2012-06-08

    Applicant: Fabien Quere

    Inventor： Fabien Quere

    IPC: G01B9/02 ,  G01J3/45 ,  G01J11/00 ,  G01J9/02

    CPC classification number: G01J3/45 ,  G01J9/02 ,  G01J11/00 ,  G01J2009/0238

    Abstract: Method of characterizing a light beam having the steps of: a) disposing the input ends of N >3 optical fibers on the path of the light beam, in such a way that a respective portion of the beam is coupled and propagates in each optical fiber and is emitted from its output end so as to form a respective secondary beam; b) introducing an angular spectral dispersion into the secondary beams by means of at least one dispersive element; c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of the interferogram; and e) extracting from the image of the interferogram an item of information relating to the spatial variation of the phase of the light beam at a plurality of wavelengths. Device for the implementation of such a method.

    Abstract translation: 表征光束的方法，具有以下步骤：a）将N> 3根光纤的输入端设置在光束的路径上，使得光束的相应部分耦合并在每条光纤中传播 并从其输出端发射以形成相应的次光束; b）借助于至少一个色散元件将角分光谱色散引入次光束; c）以这样的方式传播分散的次级束，使得它们重叠以形成干涉图; d）获取干涉图的图像; 以及e）从干涉图像的图像中提取与多个波长的光束的相位的空间变化有关的信息的项目。 设备实现这种方法。

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