公开(公告)号：US20240060879A1

公开(公告)日：2024-02-22

申请号：US18379653

申请日：2023-10-12

Applicant: Gemological Institute of America, Inc. (GIA)

Inventor： Hiroshi TAKAHASHI ,  Pradeep N. PERERA

IPC: G01N21/33 ,  G01N21/64 ,  G01N21/87

CPC classification number: G01N21/33 ,  G01N21/645 ,  G01N21/87 ,  G01N2201/0636 ,  G01N2201/061 ,  G01N2021/6471 ,  G01J3/4406

Abstract: Systems and methods here may be used for capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, for both reflective and transmission modes.

公开(公告)号：US20240027330A1

公开(公告)日：2024-01-25

申请号：US18254868

申请日：2021-11-30

Applicant: ZEON CORPORATION

Inventor： Tomofumi YAMADA

IPC: G01N21/21 ,  H01M50/403

CPC classification number: G01N21/211 ,  H01M50/403 ,  G01N2021/213 ,  G01N2201/061 ,  H01M10/0525

Abstract: It could be helpful to provide an inspection method that can determine the formed amount of an adhesive region on a separator substrate with high accuracy in producing a lithium ion secondary battery separator. The presently disclosed method of inspecting a lithium ion secondary battery separator is a method of inspecting a lithium ion secondary battery separator, in which an adhesive region made of a binder is formed on at least one surface of a separator substrate. This inspection method includes determining a formed amount of the adhesive region by spectroscopic ellipsometry that measures a change in deflection state of reflected light by irradiating the surface of the separator substrate on which the adhesive region is formed with linearly polarized light of white light as incident light.

公开(公告)号：US11828703B2

公开(公告)日：2023-11-28

申请号：US17382317

申请日：2021-07-21

Applicant: Gemological Institute of America, Inc. (GIA)

Inventor： Hiroshi Takahashi ,  Pradeep N. Perera

IPC: G01N21/33 ,  G01N21/64 ,  G01N21/87 ,  G01J3/44

CPC classification number: G01N21/33 ,  G01N21/645 ,  G01N21/87 ,  G01J3/4406 ,  G01N2021/6471 ,  G01N2201/061 ,  G01N2201/0636

Abstract: Systems and methods here may be used for capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, for both reflective and transmission modes.

公开(公告)号：US20230324288A1

公开(公告)日：2023-10-12

申请号：US18011570

申请日：2021-06-24

Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO

Inventor： Arjen BOERSMA ,  Javier NUNEZ VILLANUEVA ,  Evert Jonathan VAN DEN HAM

IPC: G01N21/3504 ,  C03C25/106

CPC classification number: G01N21/3504 ,  C03C25/1061 ,  G01N2201/0873 ,  G01N2201/061

Abstract: A sensor system, the manufacturing of such system, and the use of such system for optical detection of a target analyte in a gaseous medium are described. The sensor system includes a hollow waveguide that is provided with a reflective mirror layer along its inner wall and a concentrating coating of an inorganic sorption material. The mirror layer defines a light path for guiding light between a light inlet and a light outlet that are provided on opposing terminal ends of the hollow waveguide. The concentrating coating increases an effective concentration of target analytes, if present, and allows optical, preferably spectroscopic, analysis of the medium by recording transmission of light, preferably infrared light, guided through the hollow waveguide.

公开(公告)号：US20230236124A1

公开(公告)日：2023-07-27

申请号：US18179662

申请日：2023-03-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jongju Park ,  Raewon Yi ,  Hakseung Han ,  Seongsue Kim

IPC: G01N21/41 ,  G03F1/22 ,  G01J9/00 ,  G03F1/24 ,  G03F1/84 ,  G01N21/956

CPC classification number: G01N21/41 ,  G01J9/00 ,  G01N21/956 ,  G03F1/22 ,  G03F1/24 ,  G03F1/84 ,  G01N2021/335 ,  G01N2021/95676 ,  G01N2201/061 ,  G01N2201/0636

Abstract: An apparatus and a method for correctly measuring a phase of an extreme ultraviolet (EUV) mask and a method of fabricating an EUV mask including the method are described. The apparatus for measuring the phase of the EUV mask includes an EUV light source configured to generate and output EUV light, at least one mirror configured to reflect the EUV light as reflected EUV light incident on an EUV mask to be measured, a mask stage on which the EUV mask is arranged, a detector configured to receive the EUV light reflected from the EUV mask, to obtain a two-dimensional (2D) image, and to measure reflectivity and diffraction efficiency of the EUV mask, and a processor configured to determine a phase of the EUV mask by using the reflectivity and diffraction efficiency of the EUV mask.

公开(公告)号：US11686677B2

公开(公告)日：2023-06-27

申请号：US17424311

申请日：2020-01-24

Applicant: MultiSensor Scientific, Inc.

Inventor： Allen M. Waxman ,  Stefan Bokaemper ,  Terrence K. Jones ,  Claude V. Robotham

IPC: G01N21/359 ,  G01N21/3504

CPC classification number: G01N21/359 ,  G01N21/3504 ,  G01N2201/061 ,  G01N2201/0636

Abstract: Presented herein are systems and methods directed to a multispectral absorption-based imaging approach offering improved detection, localization, and quantification of gas emission. The imaging technology described herein utilizes an optical sensor and broadband illumination in combination with specialized reflector installments mounted about the site. The optical sensor detects light (e.g., reflected) from locations along the reflector installment. Lines-of-sight from the optical sensor to locations along the reflector installment sweep out an “optical curtain” partially enclosing and/or forming a boundary near various assets to be monitored. Optical absorption signatures from leaking gas crossing the optical curtain can be used to detect, localize, and obtain quantitative measures characterizing the leak. Measurements from reflector installments can be combined with measurements obtained via reflection of ambient light from background materials in a hybrid approach that expands monitoring capabilities and offers improvements in detection.

公开(公告)号：US11678805B2

公开(公告)日：2023-06-20

申请号：US17832340

申请日：2022-06-03

Applicant: Omni Medsci, Inc.

Inventor： Mohammed N. Islam

IPC: A61B5/00 ,  G01J3/10 ,  G01J3/28 ,  G01J3/14 ,  G01J3/453 ,  G01J3/42 ,  G01J3/02 ,  G01N21/35 ,  G16H40/67 ,  G01N21/359 ,  A61B5/145 ,  G01N33/15 ,  G01N33/49 ,  G01N21/3563 ,  G01N21/39 ,  G01N33/02 ,  G01N33/44 ,  G01N21/88 ,  A61B5/1455 ,  G16Z99/00 ,  A61C19/04 ,  G01N21/3504 ,  H01S3/30 ,  G01J3/18 ,  G01J3/12 ,  G01N21/85 ,  G01N21/95 ,  H01S3/067 ,  H01S3/00 ,  G01M3/38 ,  A61C1/00

CPC classification number: A61B5/0088 ,  A61B5/0013 ,  A61B5/0022 ,  A61B5/0075 ,  A61B5/0086 ,  A61B5/1455 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/4547 ,  A61B5/6801 ,  A61B5/7203 ,  A61B5/7257 ,  A61B5/742 ,  A61B5/7405 ,  A61C19/04 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/108 ,  G01J3/14 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/453 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/359 ,  G01N21/3563 ,  G01N21/39 ,  G01N21/88 ,  G01N33/02 ,  G01N33/025 ,  G01N33/15 ,  G01N33/442 ,  G01N33/49 ,  G16H40/67 ,  G16Z99/00 ,  A61B5/0024 ,  A61B2562/0233 ,  A61B2562/0238 ,  A61B2562/146 ,  A61B2576/02 ,  A61C1/0046 ,  G01J3/1838 ,  G01J2003/104 ,  G01J2003/1208 ,  G01J2003/2826 ,  G01M3/38 ,  G01N21/85 ,  G01N21/9508 ,  G01N2021/3513 ,  G01N2021/3595 ,  G01N2021/399 ,  G01N2201/061 ,  G01N2201/062 ,  G01N2201/06113 ,  G01N2201/08 ,  G01N2201/12 ,  G01N2201/129 ,  H01S3/0092 ,  H01S3/06758 ,  H01S3/302 ,  Y02A90/10

Abstract: An active remote sensing system is provided with an array of laser diodes that generate light directed to an object having one or more optical wavelengths that include at least one near-infrared wavelength between 700 nanometers and 2500 nanometers. One of the laser diodes pulses with pulse duration of approximately 0.5 to 2 nanoseconds at repetition rate between one kilohertz and about 100 megahertz. A beam splitter receives the laser light, separates the light into a plurality of spatially separated lights and directs the lights to the object. A detection system includes a photodiode array synchronized to the array of laser diodes and performs a time-of-flight measurement by measuring a temporal distribution of photons received from the object. The time-of-flight measurement is combined with images from a camera system, and the remote sensing system is configured to be coupled to a wearable device, a smart phone or a tablet.

公开(公告)号：US20230175983A1

公开(公告)日：2023-06-08

申请号：US17730116

申请日：2022-04-26

Applicant: KLA CORPORATION

Inventor： Andrew CROSS ,  Kaushik SAH ,  Martin PLIHAL

IPC: G01N21/95 ,  G06T7/00 ,  G03F7/20

CPC classification number: G01N21/9505 ,  G06T7/0006 ,  G03F7/7065 ,  G03F7/70641 ,  G06T2207/30148 ,  G01N2201/061

Abstract: Process window qualification (PWQ) layouts can be used to determine a presence of a pattern anomaly associated with the pattern, patterning process, or patterning apparatus. For example, a modulated die or field can be compared to a slightly lower offset modulated die or field. In another example, the high to low corners for a particular condition or combination of conditions are compared. In yet another example, process modulation parameters can be used to estimate criticality of particular weak points of interest.

公开(公告)号：US11668707B2

公开(公告)日：2023-06-06

申请号：US16468963

申请日：2017-12-12

Applicant: Siemens Healthcare Diagnostics Inc.

Inventor： Jacques Brunelle

IPC: G01N33/536 ,  G01N21/27 ,  G01N21/31 ,  G01N21/77 ,  G01N33/72 ,  G01N35/10 ,  G01N21/82 ,  G01J3/10 ,  G01J3/00 ,  G01N33/70 ,  G01N33/68 ,  G01J3/42

CPC classification number: G01N33/536 ,  G01N21/272 ,  G01N21/3151 ,  G01N21/77 ,  G01N33/721 ,  G01N35/1002 ,  B01L2300/0663 ,  G01J3/00 ,  G01J3/10 ,  G01J3/42 ,  G01N21/82 ,  G01N33/6827 ,  G01N33/70 ,  G01N33/726 ,  G01N2021/3129 ,  G01N2021/3148 ,  G01N2021/825 ,  G01N2201/061

Abstract: Analyzers and methods for making and using analyzers are described such as a method in which multiple absorption readings of a liquid assay are obtained by a photodetector using multiple light sources having at least three separate and independent wavelength ranges and with each of the absorption readings taken at a separate instant of time. Using at least one processor and calibration information of the liquid assay, an amount of at least two analytes within the liquid assay using the multiple absorption readings is determined.

公开(公告)号：US11656173B2

公开(公告)日：2023-05-23

申请号：US16980504

申请日：2019-03-07

Applicant: KEIO UNIVERSITY

Inventor： Hideyuki Maki ,  Yusuke Fukazawa

IPC: G01N21/35 ,  G01N21/55 ,  G01N21/59

CPC classification number: G01N21/35 ,  G01N21/55 ,  G01N21/59 ,  G01N2201/061

Abstract: A configuration of a time and space-resolved infrared spectroscopic analysis which can be integrated onto a chip is provided. An infrared analysis system includes a light source having a nanocarbon material as a luminescent material, and a photodetector configured to detect an infrared light emitted from the light source and transmitted through or reflected from a sample, wherein the nanocarbon material is provided on a surface of a substrate and configured to output a surface-emitted light.