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    Long path gas absorption cell
    11.
    发明授权
    Long path gas absorption cell 失效
    长途气体吸收池

    公开(公告)号：US5125742A

    公开(公告)日：1992-06-30

    申请号：US558076

    申请日：1990-07-25

    Applicant: Paul A. Wilks, Jr.

    Inventor： Paul A. Wilks, Jr.

    IPC: G01N21/03 ,  G01N21/05 ,  G01N21/35

    CPC classification number: G01N21/05 ,  G01N2021/052 ,  G01N21/031 ,  G01N21/3504 ,  G01N2201/0668

    Abstract: The multi-pass, multi-reflection (MIR) cell used for spectrographic analysis, in a spectrophotometer, for example, is a right circular cylinder having flat end plates perpendicular to its axis. The interior of the cylinder is appropriately coated to reflect the radiation employed and small transparent windows are provided on axis at each end plate. Appropriate input and output tubing is provided. The cell is not much longer than it is in diameter and may have a diameter greater than its length, thus it is either drum or disk-shaped in contrast to the long light pipes of the prior art. The cell is preferably illuminated by a cone of radiation, such as that employed in multiple internal reflection instruments, for liquid analysis employing frustrated total internal reflection in circular rod. A spectrophotometer employing the cell is disclosed.

    Abstract translation: 例如，在分光光度计中用于光谱分析的多遍多反射（MIR）单元是具有垂直于其轴线的平坦端板的右圆柱体。 圆筒的内部被适当地涂覆以反映所使用的辐射，并且在每个端板的轴上设置小的透明窗口。 提供适当的输入和输出管道。 电池的直径不比其长度长，并且可以具有大于其长度的直径，因此与现有技术的长光管相比是鼓或盘形。 细胞优选由诸如在多个内部反射仪器中使用的辐射锥照射，用于在圆形棒中使用沮丧的全内反射的液体分析。 公开了一种使用该电池的分光光度计。

    SYSTEM AND METHOD FOR AUTHENTICATING AND CLASSIFYING PRODUCTS USING HYPER-SPECTRAL IMAGING
    12.
    发明公开
    SYSTEM AND METHOD FOR AUTHENTICATING AND CLASSIFYING PRODUCTS USING HYPER-SPECTRAL IMAGING 审中-公开

    公开(公告)号：US20240310278A1

    公开(公告)日：2024-09-19

    申请号：US18121057

    申请日：2023-03-14

    Applicant: BottleVin, Inc.

    Inventor： Leslie Young Harvill

    IPC: G01N21/3577 ,  G01N21/01 ,  G01N21/33

    CPC classification number: G01N21/3577 ,  G01N21/33 ,  G01N2021/0181 ,  G01N2201/0668 ,  G01N2201/068

    Abstract: In some implementations, a method for authenticating and classifying a set of materials comprises: determining a set of characteristics of light spectra reflected or transmitted by a set of materials when the set of materials is illuminated by a plurality of light wavelengths; constructing one or more classifiers configured to classify each material of the set of materials based on the set of characteristics of the light spectra; using the classifiers, mapping each of the light spectra onto an area of an image sensor; based on the mapping, generating a holographic optical element that has a plurality of regions, that receives input light reflected or transmitted through a new material, and that filters the input light to a filtered light by each characteristic light spectra, and mapping the filtered light onto the area of the image sensor.

    Device for measuring polarization degree and refractive index
    19.
    发明授权
    Device for measuring polarization degree and refractive index 有权

    公开(公告)号：US09709489B2

    公开(公告)日：2017-07-18

    申请号：US14895305

    申请日：2015-06-01

    Applicant: ATAGO CO., LTD.

    Inventor： Hideyuki Amamiya ,  Masanosuke Tanaka

    IPC: G01N21/00 ,  G01N21/41 ,  G01N33/02 ,  G01N21/21 ,  G01J4/04 ,  G01N21/17

    CPC classification number: G01N21/4133 ,  G01J4/04 ,  G01N21/03 ,  G01N21/21 ,  G01N21/43 ,  G01N33/02 ,  G01N2021/1734 ,  G01N2201/0668 ,  G01N2201/068

    Abstract: A device includes a sample chamber (1) configured to receive the object, a polarization degree measuring member (2) configured to measure the polarization degree of the object received in the sample chamber (1), and a refractive index measuring member (3) configured to measure information corresponding to the refractive index of the object received in the sample chamber (1). The polarization degree measuring member (2) includes a polarization modulation member (11) configured to perform polarization modulation on a light beam (9) for analyzing the object and allow the modulated light beam to enter the sample chamber (1), an intensity detection member (12) configured to detect an intensity of the light beam (5) exiting from the sample chamber, and a polarization degree calculation member (13). The refractive index measuring member (3) includes a position detection member (26) and a refractive index (concentration) calculation member (13).

    Infrared-based metrology for detection of stress and defects around through silicon vias
    20.
    发明授权
    Infrared-based metrology for detection of stress and defects around through silicon vias 有权

    公开(公告)号：US09506874B2

    公开(公告)日：2016-11-29

    申请号：US14691392

    申请日：2015-04-20

    Applicant: GLOBALFOUNDRIES Inc.

    Inventor： Ming Lei

    IPC: G01J3/00 ,  G01N21/95 ,  G01N21/88 ,  G01N21/956 ,  G01B11/16

    CPC classification number: G01N21/9505 ,  G01B11/161 ,  G01N21/8806 ,  G01N21/95692 ,  G01N2201/061 ,  G01N2201/0668 ,  G01N2201/12

    Abstract: An approach for IR-based metrology for detecting stress and/or defects around TSVs of semiconductor devices is provided. Specifically, in a typical embodiment, a beam of IR light will be emitted from an IR light source through the material around the TSV. Once the beam of IR light has passed through the material around the TSV, the beam will be analyzed using one or more algorithms to determine information about TSV stress and/or defects such as imbedded cracking, etc. In one embodiment, the beam of IR light may be split into a first portion and a second portion. The first portion will be passed through the material around the TSV while the second portion is routed around the TSV. After the first portion has passed through the material around the TSV, the two portions may then be recombined, and the resulting beam may be analyzed as indicated above.

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