公开(公告)号：US08552366B2

公开(公告)日：2013-10-08

申请号：US12528454

申请日：2008-02-26

Applicant: John Brian Hoyes

Inventor： John Brian Hoyes

IPC: H01J49/06 ,  H01J49/40 ,  H01J49/42

CPC classification number: H01J49/062 ,  H01J49/408 ,  H01J49/42

Abstract: A mass spectrometer is disclosed comprising an ion guide or ion mobility spectrometer having helical, toroidal, part-toroidal, hemitoroidal, semitoroidal or spiral ion guiding region. The ion guide may comprise a tube made from a leaky dielectric wherein an RF voltage is applied to outer electrodes in order to confine ions radially within the ion guide. A DC voltage is applied to a resistive inner layer in order to urge ions along the ion guide. Alternatively, the ion guide may comprise a plurality of electrodes each having an aperture through which ions are transmitted.

Abstract translation: 公开了一种质谱仪，其包括具有螺旋，环形，部分环形，椭圆形，半形或螺旋离子引导区的离子导向或离子迁移谱仪。 离子导向器可以包括由泄漏电介质制成的管，其中RF电压被施加到外部电极以便将离子径向限制在离子引导件内。 DC电压被施加到电阻内层，以沿着离子导向器迫使离子。 或者，离子导向器可以包括多个电极，每个电极都具有一个孔，通过该孔可传输离子。

公开(公告)号：US20120104245A1

公开(公告)日：2012-05-03

申请号：US13345329

申请日：2012-01-06

Applicant: Alexander Alekseevich MAKAROV

Inventor： Alexander Alekseevich MAKAROV

IPC: H01J49/26

CPC classification number: H01J49/406 ,  H01J49/004 ,  H01J49/025 ,  H01J49/061 ,  H01J49/408

Abstract: A mass spectrometer and method of mass spectrometry wherein charged particles in a beam undergo multiple changes of direction. A detection arrangement detects a first portion of the charged particle beam, and provides a first output based upon the intensity of the detected first portion of the charged particle beam. The detection arrangement detects a second portion of the charged particle beam that has traveled a greater path length through the mass spectrometer than the first portion of the charged particle beam, and provides a second output based upon the detected second portion of the charged particle beam. A controller adjusts the parameters of the charged particle beam and/or the detection arrangement, based upon the first output of the detection arrangement, so as to adjust the second output of the detection arrangement.

Abstract translation: 质谱仪和质谱法，其中光束中的带电粒子经历多个方向改变。 检测装置检测带电粒子束的第一部分，并且基于所检测到的带电粒子束的第一部分的强度提供第一输出。 检测装置检测带电粒子束的第二部分，该第二部分已经比通过质谱仪行进了比带电粒子束的第一部分更大的路径长度，并且基于检测到的带电粒子束的第二部分提供第二输出。 控制器基于检测装置的第一输出调整带电粒子束和/或检测装置的参数，以便调整检测装置的第二输出。

公开(公告)号：US20110248161A1

公开(公告)日：2011-10-13

申请号：US13122382

申请日：2008-10-02

Applicant: Kengo Takeshita ,  Hideaki Izumi

Inventor： Kengo Takeshita ,  Hideaki Izumi

IPC: H01J49/46

CPC classification number: H01J49/004 ,  H01J49/408 ,  H01J49/424

Abstract: The present invention aims at automatically obtaining a mass spectrum over a wide mass range with a high mass resolution, without the need of the complicated determination of the number of turns or other troublesome computations due to the overtaking of ions on a loop orbit. First, a mass analysis of a target sample is performed under conditions which ensure that the overtaking of ions does not occur, to obtain a mass spectrum with a low mass resolution (S1 and S2). One or more peaks appearing on the mass spectrum are extracted based on predetermined conditions, the mass ranges corresponding to the extracted peaks are determined, and the analysis conditions which ensure that the overtaking of ions does not occur are determined for each of the mass ranges (S3 and S4). Then, in accordance with the analysis conditions, ions within a restricted mass range are selected and ejected from the ion trap to be made to fly along the loop orbit, and mass spectra with a high mass resolution are obtained (S5 and S6). The mass spectrum with a low mass spectrum and the mass spectra with a high mass resolution are eventually combined to create a mass spectrum over a wide mass range (S8).

Abstract translation: 本发明旨在以高质量分辨率自动获得在宽质量范围内的质谱，而不需要复杂的匝数确定或由于在环路轨道上超越离子而引起的其他麻烦的计算。 首先，在确保不发生离子超驰的条件下进行目标样品的质量分析，以获得质量分辨率低的质谱（S1和S2）。 基于预定条件提取出现在质谱上的一个或多个峰，确定与提取的峰相对应的质量范围，并且确定每个质量范围确保离子超驰的分析条件（ S3和S4）。 然后，根据分析条件，选择限制质量范​​围内的离子并从离子阱排出，使其沿着环轨道飞行，并获得质量分辨率高的质谱（S5和S6）。 具有低质谱的质谱和具有高质量分辨率的质谱最终被组合以在宽质量范围内产生质谱（S8）。

公开(公告)号：US08026480B2

公开(公告)日：2011-09-27

申请号：US12600375

申请日：2007-05-22

Applicant: Shinichi Yamaguchi ,  Masaru Nishiguchi

Inventor： Shinichi Yamaguchi ,  Masaru Nishiguchi

IPC: H01J49/48 ,  H01J49/40 ,  B01D59/44

CPC classification number: H01J49/408

Abstract: A basic ion optical system (2) in which the temporal focusing of ions is ensured includes a plurality of sector-shaped electrodes (11, 12, 13, and 14), an ion injection slit (15), and an ion ejection slit (16), which are placed on the same plane. A plurality of basic ion optical systems (2) are placed in such a manner as to be mutually separated at predetermined intervals in the direction approximately orthogonal to their planes. The ion ejection slit (16) of the lower-stage basic ion optical system (2) and the ion injection slit (15) of the next-stage basic ion optical system (2) are connected to each other via another basic ion optical system (3) in which the temporal focusing of the ions is ensured. Accordingly, the flight distance can be elongated while assuredly achieving the temporal focusing of the ions as an entire ion optical system (1), and a three-dimensional space can be efficiently utilized to compactify the ion optical system (1).

Abstract translation: 确保离子的时间聚焦的基本离子光学系统（2）包括多个扇形电极（11,12,13,14），离子注入狭缝（15）和离子喷射狭缝（ 16），它们放置在同一平面上。 多个基本离子光学系统（2）以与其平面大致正交的方向以预定间隔相互分离的方式放置。 下级碱性离子光学系统（2）的离子喷射狭缝（16）和下一级碱性离子光学系统（2）的离子注入狭缝（15）通过另一种碱性离子光学系统 （3），其中确保离子的时间聚焦。 因此，飞行距离可以延长，同时可靠地实现作为整个离子光学系统（1）的离子的时间聚焦，并且可以有效地利用三维空间来压缩离子光学系统（1）。

公开(公告)号：US20080006768A1

公开(公告)日：2008-01-10

申请号：US11333214

申请日：2006-01-18

Applicant: Shinichi Yamaguchi

Inventor： Shinichi Yamaguchi

IPC: H01J49/40

CPC classification number: H01J49/408

Abstract: A time of flight mass spectrometer according to the present invention includes: a) an ion source at which an ion starts flying; b) an energizer for giving a predetermined amount of energy to the ion to let the ion start flying from the ion source; c) an ion guide for forming a time-focusing flight path on which the ion flies once or repeatedly; d) a detector for detecting the ion after flying the flight path; e) an analysis controller for giving different amounts of energy to ions of the same kind using the energizer, and for measuring the values of the flight time of the ions from the ion source to the detector for the amount of energy; and f) a mass calculator for calculating or estimating the mass to charge ratio of the ion based on the difference in the values of the flight time of the ions. Since the flight time of ions on the time-focusing flight path does not depend on their kinetic energy, the difference in the flight time of an ion having two different amounts of energy gives the estimation of the mass to charge ratio of the ion. Thus, a mass spectrometry of an ion for a wide range of mass to charge ratio can be made by simply performing two measurements on the same sample. This greatly reduces the time and labor of mass analysis, and a wide range of mass spectrum can be obtained on a scarce sample on which many-time measurements are impossible.

Abstract translation: 根据本发明的飞行时间质谱仪包括：a）离子开始飞行的离子源; b）用于给予离子预定量的能量以使离子从离子源开始飞行的激发器; c）用于形成离子飞行一次或重复的时间聚焦飞行路径的离子导向器; d）用于在飞行路径飞行之后检测离子的检测器; e）分析控制器，用于使用激发器为相同种类的离子提供不同量的能量，并且用于测量离子源到检测器的离子的能量的飞行时间的值; 以及f）质量计算器，用于基于离子的飞行时间的值的差异来计算或估计离子的质荷比。 由于时间聚焦飞行路径上的离子飞行时间不取决于其动能，所以具有两个不同能量的离子的飞行时间差异给出了离子质荷比的估计。 因此，通过简单地对相同的样品进行两次测量，可以进行宽范围的质荷比的离子的质谱分析。 这大大减少了质量分析的时间和人力，并且可以在不可能进行多次测量的稀缺样品上获得广泛的质谱。

公开(公告)号：US20070194223A1

公开(公告)日：2007-08-23

申请号：US10592299

申请日：2005-05-17

Applicant: Takaya Sato ,  Michisato Toyoda ,  Morio Ishihara

Inventor： Takaya Sato ,  Michisato Toyoda ,  Morio Ishihara

IPC: H01J49/00

CPC classification number: H01J49/164 ,  H01J49/408

Abstract: A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.

Abstract translation: 用于飞行时间（TOF）质谱的方法和装置。 该装置改善了正交方向上的离子聚焦性能，并且允许与正交加速度离子源的连接以提高灵敏度。 该装置包括用于以脉冲方式发射离子的离子源，用于实现螺旋轨迹的分析器和用于检测离子的检测器。 分析仪由多层叠环形电场组成，实现螺旋轨迹。

公开(公告)号：US07247846B2

公开(公告)日：2007-07-24

申请号：US11148865

申请日：2005-06-08

Applicant: Sidney E Buttrill, Jr.

Inventor： Sidney E Buttrill, Jr.

IPC: H01J49/40

CPC classification number: H01J49/282 ,  H01J49/408

Abstract: The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.

Abstract translation: 本发明提供了用于执行飞行时间（TOF）质谱的装置和方法。 本发明的TOF质谱仪包括一个或多个离子聚焦电扇区。 电扇区中的至少一个与离子光学元件相关联。 离子光学元件包括至少一个可调电极，使得可调节电极能够改变进入或离开与其相关联的电扇区的离子所经历的电位。

公开(公告)号：US20050103992A1

公开(公告)日：2005-05-19

申请号：US10983571

申请日：2004-11-09

Applicant: Shinichi Yamaguchi ,  Morio Ishihara ,  Michisato Toyoda

Inventor： Shinichi Yamaguchi ,  Morio Ishihara ,  Michisato Toyoda

IPC: G01N27/62 ,  B01D59/44 ,  H01J49/00 ,  H01J49/06 ,  H01J49/40

CPC classification number: H01J49/408 ,  H01J49/0027

Abstract: The present invention provides a time of flight mass spectrometer having a spiral flight path, whose mass resolution can be appropriately changed with respect to the analysis object or other factor without any complicated alteration or addition of the mechanical construction. In a specific form of the invention, the mass spectrometer includes deflecting electrodes 20-23 located between semi-cylindrical electrodes 11 and 12 for making ions fly along a spiral path. The deflecting electrodes 20-23 generate deflecting electric fields for shifting the ions in the axial direction of the semi-cylindrical electrodes 11 and 12. The voltage applied to the deflecting electrodes 20-23 is changed according to the mass resolution required. The deflecting electric fields are generated or removed with the change of the voltage, which makes the ions fly either along a spiral path or in the same loop orbit. The flight distance of the ions can be controlled as desired by regulating the voltage so that the ions fly in the loop orbit an appropriate number of times. Thus, the mass resolution can be arbitrarily controlled.

Abstract translation: 本发明提供了具有螺旋飞行路径的飞行时间质谱仪，其质量分辨率可以相对于分析对象或其他因素适当地改变，而没有任何复杂的改变或添加机械结构。 在本发明的具体形式中，质谱仪包括位于半圆柱形电极11和12之间的偏转电极20-23，用于使离子沿着螺旋路线飞行。 偏转电极20-23产生用于使离子沿半圆柱形电极11和12的轴向移动的偏转电场。 施加到偏转电极20-23的电压根据所需的质量分辨率而改变。 随着电压的变化产生或去除偏转电场，这使得离子沿着螺旋路径或相同的环轨道飞行。 通过调节电压可以根据需要控制离子的飞行距离，使得离子在环轨道中飞行适当次数。 因此，质量分辨率可以任意控制。

公开(公告)号：US06300625B1

公开(公告)日：2001-10-09

申请号：US09183224

申请日：1998-10-30

Applicant: Morio Ishihara

Inventor： Morio Ishihara

IPC: B01D5944

CPC classification number: H01J49/408

Abstract: A small-sized, high-resolution, time-of-flight (TOF) mass spectrometer has a closed ion orbit formed by plural electric sectors. Ions can make plural revolutions in the closed orbit. An entrance path is formed in the closed orbit to introduce ions into the closed orbit. An exit path is formed in the closed orbit to take ions from the closed orbit. The entrance and exit paths can be formed at the exit and entrance of the electric sectors forming the closed orbit or can be positioned in the orbit between the electric sectors forming the closed orbit.

Abstract translation: 小型，高分辨率，时间飞行（TOF）质谱仪具有由多个电气部门形成的闭合离子轨道。 离子可以在闭路轨道上进行复数转。 在闭合轨道中形成入口路径以将离子引入闭合轨道。 在闭合轨道中形成出口路径以从闭合轨道取离子。 入口和出口路径可以形成在形成闭合轨道的电扇区的出口和入口处，或者可以位于形成闭合轨道的电扇区之间的轨道中。

公开(公告)号：US5128543A

公开(公告)日：1992-07-07

申请号：US425568

申请日：1989-10-23

Applicant: David A. Reed ,  Bruno W. Schueler

Inventor： David A. Reed ,  Bruno W. Schueler

IPC: H01J37/256 ,  H01J49/14 ,  H01J49/40

CPC classification number: H01J37/256 ,  H01J49/142 ,  H01J49/408 ,  H01J2237/2527

Abstract: A time-of-flight analyzer, such as a secondary ion surface analyzer, and method are disclosed wherein a beam of charged particles is created, magnified, directed along a path to a detector, detected and the time of flight measured. An emission lens is positioned on the path to produce the magnification and an additional lens can be provided along the path to produce variable magnification. A field aperture along the path limits the size of the image and a contrast diaphragm limits the lateral ion velocity. Two or more, preferably three, particle steering analyzers are sequentially positioned along the path from the emission lens to the detector with each of the three analyzers steering the particles through substantially 90 degrees.

Abstract translation: 公开了一种飞行时间分析仪，例如二次离子表面分析仪和方法，其中产生，放大，沿检测器的路径被引导的带电粒子束，并且测量飞行时间。 发射透镜位于路径上以产生放大倍数，并且可以沿着路径提供附加透镜以产生可变放大倍率。 沿着路径的场孔径限制了图像的尺寸，而对比度膜片限制了横向离子速度。 两个或更多个，优选三个，颗粒转向分析器沿着从发射透镜到检测器的路径顺序地定位，三个分析器中的每一个分别将颗粒转向大致90度。