公开(公告)号：US08998453B2

公开(公告)日：2015-04-07

申请号：US13322396

申请日：2010-05-18

Applicant: Thomas Näegele ,  Detlef Hannak ,  Simon Sturm

Inventor： Thomas Näegele ,  Detlef Hannak ,  Simon Sturm

IPC: F21V29/00 ,  G01J3/10 ,  G01J1/08 ,  G01J5/52 ,  H05B33/08 ,  G01J1/02 ,  G01J3/02

CPC classification number: G01J3/10 ,  F21V29/00 ,  G01J1/0252 ,  G01J1/08 ,  G01J3/0286 ,  G01J5/522 ,  H05B33/0803

Abstract: The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).

Abstract translation: 本发明涉及一种包括以下的校准辐射源：具有开口（12），保持在壳体（2）中的板（22））的壳体（2），安装在板（22）上的半导体辐射源 ）和在所述开口（12）的区域中具有光出射开口（15）的出射开口支撑元件（14），所述光束通过所述光出射开口（15）从所述壳体（2）向外辐射。 出口开口支撑元件（14）与壳体（2）分离，并且附接到半导体辐射源（18）的板（22）。

公开(公告)号：US08981319B2

公开(公告)日：2015-03-17

申请号：US13729285

申请日：2012-12-28

Applicant: Tsinghua University ,  Hon Hai Precision Industry Co., Ltd.

Inventor： Jun Zhu ,  Jing-Lei Zhu ,  Kai-Li Jiang ,  Chen Feng ,  Ji-Qing Wei ,  Guo-Fan Jin ,  Shou-Shan Fan

IPC: G01J1/58 ,  G01J1/42 ,  G01J1/04 ,  G01J1/08

CPC classification number: G01J1/58 ,  G01J1/0411 ,  G01J1/08 ,  G01J1/4228 ,  G01J1/4257 ,  G01J2001/4247

Abstract: A system for measuring intensity distribution of light includes a carbon nanotube array located on a surface of a substrate, a reflector and an imaging element. The carbon nanotube array absorbs photons of a light source and radiates a visible light. The reflector is used to reflect the visible light, and the reflector is spaced from the carbon nanotube array. The carbon nanotube array is located between the reflector and the substrate. The imaging element is used to image the visible light. The imaging element is spaced from the substrate.

Abstract translation: 用于测量光的强度分布的系统包括位于基板，反射器和成像元件的表面上的碳纳米管阵列。 碳纳米管阵列吸收光源的光子并辐射可见光。 反射器用于反射可见光，并且反射器与碳纳米管阵列间隔开。 碳纳米管阵列位于反射器和基板之间。 成像元件用于对可见光进行成像。 成像元件与衬底间隔开。

公开(公告)号：US20140284460A1

公开(公告)日：2014-09-25

申请号：US14296828

申请日：2014-06-05

Applicant: OLYMPUS CORPORATION

Inventor： Junichi NISHIMURA

IPC: G01J1/04 ,  G01J1/08

CPC classification number: G01J1/0403 ,  A61B1/00009 ,  A61B1/00096 ,  A61B1/00172 ,  A61B1/045 ,  A61B1/07 ,  G01J1/0425 ,  G01J1/08

Abstract: There is provided a scanning endoscope including an optical scanning unit in which an angle at which illumination light is emitted from a leading edge of an insertion portion is changed to scan the emitted illumination light on an object, a plurality of light receiving portions which is circumferentially spaced apart at the leading edge of the insertion portion and receives return light returning from the object as a result of the optical scanning unit scanning the illumination light, a light detection unit that detects the intensity of the received return light, a return light selection unit that selects the return light whose intensity is equal to or smaller than a predetermined threshold, and a storage unit that stores the intensity of the return light selected by the return light selection unit in association with the position where the optical scanning unit scans the illumination light.

Abstract translation: 提供了一种扫描内窥镜，其包括光学扫描单元，其中从插入部分的前缘发射照明光的角度被改变以扫描物体上发射的照明光，多个光接收部分 在插入部分的前缘处间隔开，并且由于光扫描单元扫描照明光而接收从物体返回的返回光，检测接收到的返回光的强度的光检测单元，返回光选择单元 其选择强度等于或小于预定阈值的返回光;以及存储单元，其将由返回光选择单元选择的返回光的强度与光学扫描单元扫描照明光的位置相关联地存储 。

公开(公告)号：US08830453B2

公开(公告)日：2014-09-09

申请号：US13729300

申请日：2012-12-28

Applicant: Jun Zhu ,  Jing-Lei Zhu ,  Kai-Li Jiang ,  Chen Feng ,  Ji-Qing Wei ,  Guo-Fan Jin ,  Shou-Shan Fan

Inventor： Jun Zhu ,  Jing-Lei Zhu ,  Kai-Li Jiang ,  Chen Feng ,  Ji-Qing Wei ,  Guo-Fan Jin ,  Shou-Shan Fan

IPC: G01J1/00 ,  G01J1/42

CPC classification number: G01J1/42 ,  G01J1/0411 ,  G01J1/08 ,  G01J1/4228 ,  G01J1/4257 ,  G01J1/58 ,  G01J2001/4247

Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.

Abstract translation: 用于测量光的强度分布的方法包括提供位于基底表面上的碳纳米管阵列的步骤。 碳纳米管阵列具有远离衬底的顶表面。 具有基板的碳纳米管阵列位于惯性环境或真空环境中。 光源照射碳纳米管阵列的顶面，使碳纳米管阵列发出可见光。 设置反射器，可见光被反射器反射。 成像元件对由反射器反射的可见光进行成像，以获得光源的强度分布。

公开(公告)号：US20140224970A1

公开(公告)日：2014-08-14

申请号：US14161690

申请日：2014-01-23

Applicant: OTSUKA ELECTRONICS CO., LTD.

Inventor： Kazuaki OHKUBO

IPC: G01J1/08 ,  G01J1/42

CPC classification number: G01J1/08 ,  G01J1/42 ,  G01J2001/061 ,  G01J2001/4252

Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.

Abstract translation: 具有更简化结构的新型标准光源，其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量，以及使用该标准光源的测量方法 提供。 标准光源包括发光部分，电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分，用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。

公开(公告)号：US20140184197A1

公开(公告)日：2014-07-03

申请号：US13727959

申请日：2012-12-27

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Sergei Ivanovich Dolinsky

IPC: G01R15/24

CPC classification number: G01R31/2837 ,  G01J1/08 ,  G01J1/4228 ,  G01J11/00 ,  G01T1/2018 ,  G01T1/208

Abstract: Exemplary embodiments are directed to characterizing a solid state photomultiplier (SSPM). The SSPM can be exposed to a light pulse that triggers a plurality of microcells of the SSPM and an output signal of the SSPM generated in response to the light pulse can be processed. The output signal of the SSPM can be proportional to a gain of the SSPM and a quantity of microcells in the SSPM and a value of an electrical parameter of the SSPM can be determined based on a relationship between the output signal of the SSPM and an over voltage applied to the SSPM.

Abstract translation: 示例性实施例涉及表征固态光电倍增管（SSPM）。 SSPM可以暴露于触发SSPM的多个微单元的光脉冲，并且可以处理响应于光脉冲而产生的SSPM的输出信号。 SSPM的输出信号可以与SSPM的增益成比例，并且SSPM中的微小区的数量和SSPM的电参数的值可以基于SSPM的输出信号与上一个之间的关系来确定 施加到SSPM的电压。

公开(公告)号：US08724100B1

公开(公告)日：2014-05-13

申请号：US13694047

申请日：2012-10-22

Applicant: Mehdi Asghari ,  Dazeng Feng

Inventor： Mehdi Asghari ,  Dazeng Feng

IPC: G01N21/00

CPC classification number: G01J1/0425 ,  G01J1/0209 ,  G01J1/08 ,  G01J2001/083 ,  G01J2001/4247 ,  G02B6/12004 ,  G02B6/125 ,  G02B2006/12097

Abstract: A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.

Abstract translation: 晶片包括多个光学器件，每个光学器件包括一个或多个光学部件。 光学部件包括发光部件，每个发光部件响应于从晶片外部的电子器件向发光部件施加电能而产生光信号。 光学部件还包括响应于光的接收而输出电信号的接收器部件。 晶片还包括测试波导，每个波导从光学器件中的一个光学器件的边界内延伸穿过光学器件的边界，并且还提供光学部件的第一部分和光学部件的第二部分之间的光学连通。 光学部件的第一部分包括一个或多个发光部件，并且光学部件的第二部分包括一个或多个接收器部件。

公开(公告)号：US08592742B2

公开(公告)日：2013-11-26

申请号：US12971053

申请日：2010-12-17

Applicant: Michael J. Lorello ,  Gary S. Jacobson ,  George J. Doutney

Inventor： Michael J. Lorello ,  Gary S. Jacobson ,  George J. Doutney

IPC: H01J40/14 ,  H03F3/08

CPC classification number: G01J1/32 ,  G01J1/0228 ,  G01J1/08

Abstract: A system and method for adjusting the LED current of an optical sensor that does not decrease the effectiveness of the optical sensor or the length of its operating life, or significantly increase the cost due to hardware requirements. The LED current of an optical sensor is adjusted using a high frequency pulse-width modulated signal generated from a microcontroller. Based on feedback provided by the photo-detector, the duty cycle of the signal can be adjusted by the microcontroller. The signal passes through a low pass filter which averages the modulated signal into a DC voltage, which is then used to control a current amplifier circuit that provides current to the LED of the optical sensor. This adjustability enables the system to compensate for variations in sensor LED's and the LED brightness reduction to due aging and/or build-up of contaminants on the photo-detector and/or LED.

Abstract translation: 用于调整不会降低光学传感器的有效性或其使用寿命长度的光学传感器的LED电流的系统和方法，或由于硬件要求而显着增加成本。 使用从微控制器产生的高频脉冲宽度调制信号调整光学传感器的LED电流。 基于光电检测器提供的反馈信号，可以通过微控制器调整信号的占空比。 该信号通过低通滤波器，其将调制信号平均为直流电压，然后将其用于控制​​向光学传感器的LED提供电流的电流放大器电路。 这种可调性使得系统能够补偿传感器LED的变化以及LED亮度降低到光电检测器和/或LED上的污染物的适当老化和/或累积。

公开(公告)号：US20130301051A1

公开(公告)日：2013-11-14

申请号：US13813241

申请日：2011-06-17

Applicant: Andrew Pogosyan ,  Sergey I. Pogosyan ,  Sergey V. Galchuk

Inventor： Andrew Pogosyan ,  Sergey I. Pogosyan ,  Sergey V. Galchuk

IPC: G01N21/01 ,  G01N21/59 ,  G01N21/55 ,  G01N21/64

CPC classification number: G01N21/01 ,  G01J1/0411 ,  G01J1/0488 ,  G01J1/08 ,  G01N21/4738 ,  G01N21/474 ,  G01N21/55 ,  G01N21/59 ,  G01N21/64 ,  G01N21/645 ,  G01N2021/4709 ,  G01N2021/4735 ,  G01N2021/4754 ,  G01N2201/06126

Abstract: The present invention relates to a scattering light source photometer. In particular, the present invention relates to a portable, low cost, multi-wavelength photometer and methods for its use.

Abstract translation: 散射光源光度计技术领域本发明涉及散射光源光度计。 特别地，本发明涉及便携式，低成本，多波长光度计及其使用方法。

公开(公告)号：US08581572B2

公开(公告)日：2013-11-12

申请号：US13759796

申请日：2013-02-05

Applicant: Alpha-Omega Power Technologies, Ltd. Co.

Inventor： William Ray Cravey

IPC: G01R31/00

CPC classification number: G01R31/2605 ,  F21S8/006 ,  F21V11/06 ,  F21Y2105/00 ,  G01J1/0411 ,  G01J1/08 ,  H02S50/10

Abstract: An apparatus for testing photovoltaic cells wherein an array of light sources are provided. The light sources can have a collimating lens. In addition, one or more feedback circuits can be provided which monitor and maintain one or more of the light sources.

Abstract translation: 一种用于测试光伏电池的装置，其中提供了光源阵列。 光源可以具有准直透镜。 此外，可以提供监视和维护一个或多个光源的一个或多个反馈电路。