Abstract:
The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).
Abstract:
A system for measuring intensity distribution of light includes a carbon nanotube array located on a surface of a substrate, a reflector and an imaging element. The carbon nanotube array absorbs photons of a light source and radiates a visible light. The reflector is used to reflect the visible light, and the reflector is spaced from the carbon nanotube array. The carbon nanotube array is located between the reflector and the substrate. The imaging element is used to image the visible light. The imaging element is spaced from the substrate.
Abstract:
There is provided a scanning endoscope including an optical scanning unit in which an angle at which illumination light is emitted from a leading edge of an insertion portion is changed to scan the emitted illumination light on an object, a plurality of light receiving portions which is circumferentially spaced apart at the leading edge of the insertion portion and receives return light returning from the object as a result of the optical scanning unit scanning the illumination light, a light detection unit that detects the intensity of the received return light, a return light selection unit that selects the return light whose intensity is equal to or smaller than a predetermined threshold, and a storage unit that stores the intensity of the return light selected by the return light selection unit in association with the position where the optical scanning unit scans the illumination light.
Abstract:
A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.
Abstract:
A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
Abstract:
Exemplary embodiments are directed to characterizing a solid state photomultiplier (SSPM). The SSPM can be exposed to a light pulse that triggers a plurality of microcells of the SSPM and an output signal of the SSPM generated in response to the light pulse can be processed. The output signal of the SSPM can be proportional to a gain of the SSPM and a quantity of microcells in the SSPM and a value of an electrical parameter of the SSPM can be determined based on a relationship between the output signal of the SSPM and an over voltage applied to the SSPM.
Abstract:
A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components.
Abstract:
A system and method for adjusting the LED current of an optical sensor that does not decrease the effectiveness of the optical sensor or the length of its operating life, or significantly increase the cost due to hardware requirements. The LED current of an optical sensor is adjusted using a high frequency pulse-width modulated signal generated from a microcontroller. Based on feedback provided by the photo-detector, the duty cycle of the signal can be adjusted by the microcontroller. The signal passes through a low pass filter which averages the modulated signal into a DC voltage, which is then used to control a current amplifier circuit that provides current to the LED of the optical sensor. This adjustability enables the system to compensate for variations in sensor LED's and the LED brightness reduction to due aging and/or build-up of contaminants on the photo-detector and/or LED.
Abstract:
The present invention relates to a scattering light source photometer. In particular, the present invention relates to a portable, low cost, multi-wavelength photometer and methods for its use.
Abstract:
An apparatus for testing photovoltaic cells wherein an array of light sources are provided. The light sources can have a collimating lens. In addition, one or more feedback circuits can be provided which monitor and maintain one or more of the light sources.