Method and apparatus for measuring light intensity for imaging

    公开(公告)号:US11864866B2

    公开(公告)日:2024-01-09

    申请号:US17296023

    申请日:2019-12-04

    Abstract: A method of measuring light intensity for imaging using a light detector array comprising a plurality of light detectors arranged to generate an output corresponding to an intensity of incident light. In a first measurement mode the light detector array generates a first plurality of output signals, each generated by one group of proximate light detectors, each group comprising a light detector pair, the first plurality of output signals each corresponding to a difference between the light intensity detected by the light detectors of the group, and generating a light intensity measurement for each group from each received output signal of the first plurality of output signals. In a second measurement mode the light detector array generates a second plurality of output signals, and a light intensity measurement is generated for each light detector from the second plurality of output signals.

    Systems, devices, and methods for hyperspectral imaging

    公开(公告)号:US11860034B2

    公开(公告)日:2024-01-02

    申请号:US17233225

    申请日:2021-04-16

    Inventor: Scott Ritter

    CPC classification number: G01J3/0248 G01J3/2823

    Abstract: A technology is described for hyperspectral imaging. An example of the technology can include receiving an event stream of events from an event camera coupled to an interferometer. The event camera can receive light output from the interferometer and generate the event stream, comprising event data that corresponds to the light output. The events in the event stream can indicate a pixel that detected an event, a time of the event, and a polarity of change in brightness detected by the pixel. Spectral data can be generated for the events in the event stream using a demodulation and frequency transform to convert temporospatial aggregates of events in the event stream to frequency domain data that corresponds to an optical spectrum. A hyperspectral image of an input scene in a spectral range can be generated using the spectral data.

    PHOTONIC INTEGRATED CIRCUIT
    35.
    发明公开

    公开(公告)号:US20230400354A1

    公开(公告)日:2023-12-14

    申请号:US18035271

    申请日:2021-11-04

    Inventor: Richard GROTE

    Abstract: A photonic integrated circuit for use in hyperspectral spectroscopy. The photonic integrated circuit comprising: a multi-spectral laser source, configured to produce a multi-spectral optical signal; a modulator, the modulator configured to split the multi-spectral optical signal into a first component and a second component, and apply an up-chirp modulation profile to the first component and a down-chirp modulation profile to the second component; a first transmitter and receiver module, configured to transmit the modulated first component and receive reflections of the first component; and a second transmitter and receiver module, configured to transmit the modulated second component and receive reflections of the second component.

    Spectrometer
    36.
    发明授权

    公开(公告)号:US11841270B1

    公开(公告)日:2023-12-12

    申请号:US17824614

    申请日:2022-05-25

    Abstract: The spectrometer includes a lightguide substrate, an upper grating layer, a lower grating layer, an image sensor, and a readout circuit. The upper grating layer is disposed on the lightguide substrate and configured to receive a light. The upper grating layer includes a first grating structure, a second grating structure, and a third grating structure, and the first, second, and third grating structures have different grating periods. The lightguide substrate is configured to diffract the light when the light propagates into the lightguide substrate, such that multiple diffraction lights are formed and each of the multiple diffraction lights has different wavelengths and different optical path. The lower grating layer is disposed under the lightguide substrate and configured to emit the multiple diffraction lights. The image sensor is disposed under the lower grating layer. The readout circuit is disposed under the image sensor.

    DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING

    公开(公告)号:US20230392984A1

    公开(公告)日:2023-12-07

    申请号:US18203125

    申请日:2023-05-30

    Applicant: IMEC VZW

    Abstract: According to an aspect of the present inventive concept there is provided a device for polarization dependent imaging, comprising a detector comprising an array of light sensitive elements; a plurality of light propagating units, each comprising: a funnel element having a collecting end and a transmitting end, the funnel element being configured to collect light at the collecting end and propagate the light to the transmitting end; a waveguide having a receiving end and a distributing end, the waveguide being configured to receive the light from the transmitting end at the receiving end and propagate the light to the distributing end, wherein the waveguide is configured to propagate the light through the waveguide in dependence of polarization such that a distribution of the light at different locations of the distributing end is dependent on polarization of the light.

    CURVED-SLIT IMAGING SPECTROMETER
    40.
    发明公开

    公开(公告)号:US20230332953A1

    公开(公告)日:2023-10-19

    申请号:US17636844

    申请日:2020-12-09

    CPC classification number: G01J3/2823 G01J3/04 G01J3/021 G01J3/0218

    Abstract: The invention provides a curved-slit imaging spectrometer, wherein a fiber bundle transfers a straight line image of a front objective lens to a curved slit, and the front objective lens doesn't need to have a curved image plane to directly abut the spectrometer, so that the system is less complicated, and the front objective lens and spectrometer have a simple structure. The arc-shaped or approximately arc-shaped curved slit matches the optimum imaging circle of the Offner-type spectrometer, thereby achieving an extra-long slit. The arced slit is 5 to 10 times longer than the straight slit of the classical Offner-type spectrometer. In the case of a compact size, the length of the slit can be greater than 100 mm. Also, the same spectral response function applies in different fields of view while presenting desirable imaging quality.

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