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公开(公告)号：US20180113074A1
公开(公告)日：2018-04-26
申请号：US15566009
申请日：2015-04-30
Applicant: Siemens Aktiengesellschaft
Inventor： Alexander Michael Gigler , Harry Hedler , Remigiusz Pastusiak , Anton Schick
CPC classification number: G01N21/63 , G01J3/0208 , G01J3/0229 , G01J3/0237 , G01N2201/0636 , G02B21/082 , G02B21/16 , G02B21/362 , G02B26/007 , G02B26/0833
Abstract: The present disclosure relates to measuring light emission. The teachings thereof may be embodied in emission-measuring devices. For example, a device may include: a sample region; an illumination unit for irradiating the sample region and a sample positioned therein; and a radiation detector. The illumination unit may include: a radiation source; a first dispersive element arranged downstream, decomposing the radiation into spectral components; a first micromirror field arranged downstream; and a second dispersive element arranged downstream of the first micromirror field. The second dispersive element may unify spectral components selected by the first micromirrror field into a common excitation beam.
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公开(公告)号：US09952150B2
公开(公告)日：2018-04-24
申请号：US14782755
申请日：2014-04-07
Applicant: L.U.M. GmbH
Inventor： Gert Sinn , Klaus-Henrik Mittenzwey
CPC classification number: G01N21/4738 , G01N21/41 , G01N21/53 , G01N21/55 , G01N21/59 , G01N2201/0636 , G01N2201/0638
Abstract: The invention relates to a device for measuring the scattering of a sample. Said device includes at least one first and one second scattering receiver for capturing scattered rays from the sample; and at least one imaging element via which rays can reach the sample and from the sample to the scattering receiver. According to the invention, the first and second scattering receivers are arranged in a common flat or approximately spherically curved surface, which is oriented perpendicular to an optical axis of the imaging element. The first scattering receiver is designed and arranged to capture saturated scattered rays from the sample and the second scattering receiver is designed and arranged to capture linearly scattered rays from the sample.
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43.发明申请公开(公告)号：US20180088057A1
公开(公告)日：2018-03-29
申请号：US15668092
申请日：2017-08-03
Applicant: CASIO COMPUTER CO., LTD.
Inventor： Tamotsu Hashikami
CPC classification number: G01N21/8851 , B25J9/1674 , B60L53/30 , G01N2021/8887 , G01N2201/0636 , G06K9/00664 , G06K9/6215 , G07C5/006 , G07C5/0808 , G07C5/0825 , H04N5/2252 , H04N5/2253
Abstract: Provided are a robot, a status determining system, a status determining method, and a non-transitory recording medium, capable of determining a status of the robot. This robot includes an image information obtainer that captures a mirror image of the robot on a mirror surface that reflects visible light, and a determiner that determines a status of the robot based on the mirror image of the robot captured by the image information obtainer.
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公开(公告)号：US20180088049A1
公开(公告)日：2018-03-29
申请号：US15715165
申请日：2017-09-26
Applicant: AZURE BIOSYSTEMS, INC.
Inventor： Diping Che
CPC classification number: G01N21/6428 , C12Q1/6876 , G01N21/645 , G01N21/6454 , G01N21/76 , G01N2021/6463 , G01N2201/06113 , G01N2201/0636
Abstract: The present disclosure provides methods and devices for characterizing light-generating analytes.
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公开(公告)号：US09891176B2
公开(公告)日：2018-02-13
申请号：US15308001
申请日：2015-08-04
Applicant: MACHINE VISION LIGHTING INC.
Inventor： Shigeki Masumura
CPC classification number: G01N21/8806 , G01N2201/062 , G01N2201/0636 , G01N2201/0638 , G01N2201/068 , G02B27/02 , G02B27/144 , G02B27/30
Abstract: In the inspection lighting device, between a surface light source for emitting an inspection light and the inspection object, at least one shielding mask is disposed, and a lens is disposed on a side closer to the inspection object than the shielding mask such that the shielding mask is positioned across the focus position of this lens as a center. In an irradiation solid angle of the inspection light for the inspection object formed when the light emitted from the surface light source is irradiated on to the inspection object by the lens the shielding mask forms a dark area. So that, in accordance with a change in reflection, transmission, scattering occurring at a feature point on the inspection object, a shape, a size, a tilt of the irradiation solid angle of the inspection light can be changed.
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Patent Agency Ranking
公开(公告)号：US20170343542A1
公开(公告)日：2017-11-30
申请号：US15608358
申请日：2017-05-30
Applicant: Sysmex Corporation
Inventor： Kosuke JITSUHARA , Jianyin LU
IPC: G01N33/543 , B01L3/00 , G06T7/00 , G01N21/64
CPC classification number: G01N33/54326 , B01L3/502 , B01L3/502761 , B01L2200/025 , B01L2200/143 , B01L2300/0654 , B01L2300/0816 , B01L2300/087 , B01L2300/168 , B01L2400/043 , G01N15/1484 , G01N21/6428 , G01N33/54366 , G01N35/0098 , G01N2015/1465 , G01N2021/6439 , G01N2201/0636 , G06T7/0012 , G06T2207/10088 , G06T2207/30024
Abstract: Disclosed is an analysis method including: moving a complex, by means of a magnet unit, in a flow path of a specimen cartridge which includes the flow path and a detection vessel, the complex containing a test substance formed on magnetic particles and a labeled substance binding to the test substance; taking an image of the magnetic particles in the specimen cartridge; and measuring a label of the labeled substance contained in the complex in the detection vessel.
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公开(公告)号：US20170241766A1
公开(公告)日：2017-08-24
申请号：US15502147
申请日：2015-08-07
Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
Inventor： Yoel Arieli , Yoel Cohen
CPC classification number: G01B9/02091 , G01B9/02019 , G01J3/0208 , G01J3/0224 , G01J3/447 , G01J3/453 , G01N21/31 , G01N2201/0636 , G01N2201/0683
Abstract: In a system for analyzing optical properties of an object (350) a point source of light (100) composed of multiple spectral bands each having a respective amplitude, phase and polarization is converted by first optics (120, 150) into a line light source to illuminate an object line on the object. A beam splitter (200) splits the light exiting the first optics and directs a first portion of light on to the object (350) as an illuminated line and a second portion of the light on to a reference mirror (450). Second optics (500) collects respective first and second lines of light reflected by the object and mirror of and collinearly images the reflected lines of light as an image line on to an imaging spectrometer (550) wherein mutual interference allows determination of the optical properties of the object at each point along the object line.
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公开(公告)号：US09682686B2
公开(公告)日：2017-06-20
申请号：US15189165
申请日：2016-06-22
Applicant: Hyundai Motor Company , Kia Motors Corporation
Inventor： Jin Sang Lee , Yong Pyo Hong , Nam Joon Yoo , Jong Min Park
IPC: G01N21/55 , B60S1/08 , G01N21/552
CPC classification number: B60S1/0833 , B60S1/0837 , G01N21/552 , G01N2201/0636
Abstract: A rain sensor has a frost sensing function, and is attached to a windshield glass of a vehicle. The frost sensor includes a casing provided with a frost sensing region formed by recessing a part of the casing to contact indoor air; a light emitting unit that emits light such that the light is incident on the windshield glass; a light receiving unit that receives the light emitted from the light emitting unit and reflected from the windshield glass and the frost sensing region; and a control unit that outputs the light received by the light receiving unit as a control signal and activates a wiper and an air conditioner of the vehicle.
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公开(公告)号：US09677935B2
公开(公告)日：2017-06-13
申请号：US14581935
申请日：2014-12-23
Applicant: TruTag Technologies, Inc.
Inventor： Timothy Learmonth , Hod Finkelstein
CPC classification number: G01J3/26 , B82Y20/00 , G01J3/0208 , G01J3/0237 , G01J3/0259 , G01J3/0272 , G01J3/10 , G01J2003/102 , G01N21/255 , G01N21/27 , G01N2201/061 , G01N2201/0636
Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length but that is less than the long coherence lengths.
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公开(公告)号：US20170102319A1
公开(公告)日：2017-04-13
申请号：US15126798
申请日：2015-02-18
Inventor： Antonello De Martino , Dominique Pagnoux , Jérémy Vizet , Sandeep Manhas , Jean-Charles Vanel , Stanislas Deby
CPC classification number: G01N21/21 , A61B1/07 , G01N2201/0636 , G01N2201/0683 , G01N2201/08 , G01N2201/12
Abstract: According to one aspect, the invention relates to a device (100) for remote polarimetric characterisation of a sample (S). It comprises a source (10) for emitting at least one incident light wave at at least one first wavelength (λE); a monomode optical fibre (30) in which the incident light wave is intended to propagate; a polarisation state generator (PSG) arranged on the proximal side of the optical fibre; a reflector (40) intended to be arranged on the distal side of the optical fibre; a polarisation state analyser (PSA) arranged on the proximal side of the optical fibre and allowing, for each probe state of the incident wave generated by the polarisation state generator, the polarisation of the light wave obtained after propagation of the incident wave in the optical fibre (30), reflection from the distal side of the optical fibre and reverse propagation in the optical fibre (30), to be analysed. Processing means (70) make it possible to determine, from a first polarimetric characterisation of the optical fibre, a Mueller matrix (MF) associated with the optical fibre, and, from a second polarimetric characterisation of the assembly comprising the optical fibre and the sample, a Mueller matrix (MT) associated with said assembly. The Mueller matrix (Mo) associated with the sample is determined from the Mueller matrices associated with the optical fibre and the assembly comprising the optical fibre and the sample, respectively.
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