公开(公告)号：US07253896B1

公开(公告)日：2007-08-07

申请号：US10148787

申请日：2000-11-28

Applicant: Natalia Novikov, legal representative

Inventor： Valerie Alexey Novikov, deceased

IPC: G01J3/28

CPC classification number: G01J3/447 ,  G01J3/433 ,  G01N21/3504

Abstract: A filter for use in a spectrometer to filter transmitted radiation and wherein the filter has a birefringent element responsive to an applied signal, a first polarizer for polarizing the radiation transmitted by a sample, a second polarizer for polarizing the radiation transmitted by the birefringent element, and wherein the birefringent element has a birefringent member having a first birefringence and the birefringent member being responsive to a force applied thereto to generate an additional second birefringence; and the filter having a driver for applying a force to the birefringent member in accordance with the applied signal, and the driver has a piezoelectric member coupled to the birefringent member on one end or at two opposite ends.

Abstract translation: 一种用于光谱仪过滤透射辐射的滤光器，其中所述滤光片具有响应于所施加的信号的双折射元件，用于偏振由样品透射的辐射的第一偏振器，用于偏振由所述双折射元件透射的辐射的第二偏振器， 并且其中所述双折射元件具有具有第一双折射率的双折射元件，并且所述双折射元件响应于施加到其上的力以产生另外的第二双折射; 并且所述滤波器具有根据所施加的信号向所述双折射构件施加力的驱动器，并且所述驱动器具有在一端或两相对端耦合到所述双折射构件的压电构件。

公开(公告)号：US07183553B1

公开(公告)日：2007-02-27

申请号：US11227477

申请日：2005-09-15

Applicant: Bert Willing ,  Markus Kohli ,  Andreas Seifert

Inventor： Bert Willing ,  Markus Kohli ,  Andreas Seifert

IPC: G01J5/02

CPC classification number: G01N21/39 ,  G01J3/433 ,  G01N21/3504 ,  G01N2201/0691

Abstract: The gas detector device comprises at least a VCSEL source and at least a light sensor for detecting a light beam having passed through a sample chamber containing a given gas to be detected. The detection signal of the sensor directly provided to or is time derivated by an electronic derivator and then provided to respective lock-in amplifiers in order to generate a two different 2f-detection, f being the frequency of a wavelength modulation of the source, and thus to provide two corresponding measuring signals the division of which gives a precise value of the gas concentration. The invention uses at least a first modulation reference signal at twice and a second modulation reference signal at twice of the modulation frequency of the laser source. Providing at least a first 2f modulation reference signal has advantages over the prior art, because by using such a reference modulation signal it is possible measure the absolute intensity and therefore to receive the same result at different temperatures or at mode hopping of the laser. A further advantage is that the measurement accuracy is independent from the gas concentration.

公开(公告)号：US20070031154A1

公开(公告)日：2007-02-08

申请号：US11197873

申请日：2005-08-05

Applicant: Gregory VanWiggeren ,  Douglas Baney ,  Scott Corzine

Inventor： Gregory VanWiggeren ,  Douglas Baney ,  Scott Corzine

IPC: H04B10/00

CPC classification number: G01B11/306 ,  G01J3/433 ,  G01N21/45 ,  G01N21/553

Abstract: A measurement system has a modulated laser source that illuminates a target within the measurement system. The modulated laser source has a first coherence length in an unmodulated state, and a second coherence length in a modulated state that is shorter than the first coherence length. The measurement system includes a detector that receives a deflected signal from the target and provides a detected signal having a signal component and a drift component, wherein the drift component is lower in the modulated state than in the unmodulated state of the modulated laser source.

Abstract translation: 测量系统具有照亮测量系统内的目标的调制激光源。 调制激光源具有处于未调制状态的第一相干长度和处于比第一相干长度短的调制状态的第二相干长度。 该测量系统包括一个检测器，其接收来自目标的偏转信号，并提供具有信号分量和漂移分量的检测信号，其中漂移分量在调制状态下比调制激光源的未调制状态低。

公开(公告)号：US20070023664A1

公开(公告)日：2007-02-01

申请号：US11470370

申请日：2006-09-06

Applicant: Christian-Peter Christiansen ,  Hans-Joachim Ploss ,  Richard Mertens ,  Heino Prinz

Inventor： Christian-Peter Christiansen ,  Hans-Joachim Ploss ,  Richard Mertens ,  Heino Prinz

IPC: G01J5/02

CPC classification number: G01N21/9027 ,  G01J3/28 ,  G01J3/42 ,  G01J3/433 ,  G01N21/274 ,  G01N21/3563 ,  G01N21/359 ,  G01N21/90 ,  G01N2201/08

Abstract: The present invention relates to a method for quantifying the composition of a product, with the following steps: irradiating the product with a radiation source in the near infrared range; receiving radiation which is reflected by or transmitted through the product, and providing an output signal corresponding to the intensity of the radiation received at a number of different wavelengths; determining whether or not the product lies within predetermined integrity criteria on the basis of the output signal using a mathematical method, wherein the product contains a solution or homogeneous dispersion, and the content of at least one substance contained in the dispersion or solution is quantitatively determined on the basis of the output signal., The present invention also relates to an apparatus for carrying out this method.

Abstract translation: 本发明涉及一种用于量化产品组成的方法，其具有以下步骤：用近红外范围的辐射源照射产品; 接收由产品反射或透过产品的辐射，并提供对应于以多个不同波长接收的辐射的强度的输出信号; 使用数学方法确定产品是否处于基于输出信号的预定完整性标准内，其中产品包含溶液或均匀分散体，并且定量确定分散体或溶液中所含的至少一种物质的含量 基于输出信号，本发明还涉及一种用于执行该方法的装置。

公开(公告)号：US20060187976A1

公开(公告)日：2006-08-24

申请号：US10548394

申请日：2005-02-10

Applicant: Hiroshi Mori ,  Tomoyuki Kikugawa ,  Yoshio Takahashi ,  Toshiyuki Suzuki ,  Kiyoshi Kimura

Inventor： Hiroshi Mori ,  Tomoyuki Kikugawa ,  Yoshio Takahashi ,  Toshiyuki Suzuki ,  Kiyoshi Kimura

IPC: H01S3/10 ,  H01S5/20 ,  H01S5/00

CPC classification number: H01S5/12 ,  G01J3/433 ,  G01N21/39 ,  H01S5/02415 ,  H01S5/0683 ,  H01S5/1039 ,  H01S5/227

Abstract: A tunable wavelength semiconductor laser includes an n-type semiconductor substrate, an active layer which is disposed above the n-type semiconductor substrate and which generates light, a p-type cladding layer disposed above the active layer, and wavelength selecting section for causing to selectively oscillate only a specific wavelength from the light generated in the active layer. The tunable wavelength semiconductor layer capable of oscillating at the specific wavelength can be performed by injecting current into the active layer, and the specific wavelength can be varied by changing the magnitude of the current. A device length showing a length in a propagation direction of the light generated in the active layer is about 200 μm to 500 μm, and a width of the active layer orthogonal to the propagation direction of the light generated in the active layer, and showing a length in a direction parallel to the n-type semiconductor substrate is about 1 μm to 2 μm. The p-type cladding layer includes a lightly doped cladding layer having a low impurity concentration and a heavily doped cladding layer having a high impurity concentration which are sequentially arranged from the active layer side.

Abstract translation: 可调波长半导体激光器包括n型半导体衬底，设置在n型半导体衬底上方并产生光的有源层，设置在有源层上方的p型覆层;以及波长选择部分，用于使 从有源层中产生的光中选择性地仅振荡特定波长。 能够以特定波长振荡的可调谐波长半导体层可以通过将有效层注入电流来进行，通过改变电流的大小来改变特定的波长。 表示在有源层中产生的光的传播方向上的长度的器件长度为约200μm至500μm，并且有源层的宽度与在有源层中产生的光的传播方向垂直，并且显示为 在与n型半导体基板平行的方向上的长度为1〜2μm左右。 p型包覆层包括具有低杂质浓度的轻掺杂包层和从有源层侧依次布置的具有高杂质浓度的重掺杂包层。

公开(公告)号：US20060072632A1

公开(公告)日：2006-04-06

申请号：US10953043

申请日：2004-09-29

Applicant: Dale Flanders ,  Walid Atia ,  Mark Kuznetsov

Inventor： Dale Flanders ,  Walid Atia ,  Mark Kuznetsov

IPC: H01S3/10 ,  H01S3/08

CPC classification number: H01S5/141 ,  G01J1/4257 ,  G01J3/02 ,  G01J3/0213 ,  G01J3/0256 ,  G01J3/10 ,  G01J3/26 ,  G01J3/433 ,  G01J2003/2866 ,  G01N21/39 ,  G01N2021/399 ,  H01S3/08013 ,  H01S3/083 ,  H01S5/02252

Abstract: An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.

Abstract translation: 用于半导体源光谱系统的光功率控制系统控制来自光谱系统的可调谐信号中的功率波动，从而改善系统的噪声性能。 该通用解决方案相对于在扫描期间简单地检测参考功率电平然后在与样品相互作用之后校正检测到的信号的其它系统具有优点，通过减少协调样品检测器和功率或参考检测器的操作的要求。 光谱系统包括半导体源和可调谐滤波器。 半导体源和可调信号的组合用可调信号照射样品，可在扫描带上调谐。 功率控制系统包括用于检测可调谐光信号的功率的振幅检测器系统和用于响应于其检测到的功率来调节可调谐光信号的幅度的功率控制系统。

公开(公告)号：US20060017923A1

公开(公告)日：2006-01-26

申请号：US11188064

申请日：2005-07-22

Applicant: Timothy Ruchti ,  Alexander Lorenz ,  Kevin Hazen

Inventor： Timothy Ruchti ,  Alexander Lorenz ,  Kevin Hazen

IPC: G01J3/28

CPC classification number: G01N21/274 ,  G01J3/28 ,  G01J3/433 ,  G01N21/359 ,  G01N2201/129 ,  G01N2201/1293

Abstract: The invention comprises a method and apparatus for enhancing the analysis of noninvasive spectra, resulting in improved analytical performance. More particularly, the invention comprises a method and apparatus for processing noninvasive spectra with an analyte filter that preferably rejects variation likely to be detrimental to the measurement system, while passing signal that probabilistically is unique to the target analyte. Subsequently, the analyte filtered data are used to estimate an analyte property, such as a glucose concentration, in the presence of noise, interferences, state changes, and/or across analyzers.

Abstract translation: 本发明包括用于增强非侵入光谱分析的方法和装置，从而提高分析性能。 更具体地，本发明包括用分析物过滤器处理非侵入光谱的方法和装置，其优选地拒绝可能对测量系统有害的变化，同时传递概率地对目标分析物是唯一的信号。 随后，分析物过滤的数据用于在存在噪声，干扰，状态变化和/或跨分析仪的情况下估计分析物质（例如葡萄糖浓度）。

公开(公告)号：US20050201661A1

公开(公告)日：2005-09-15

申请号：US11079478

申请日：2005-03-15

Applicant: Hans-Peter Loock ,  Zhaoguo Tong

Inventor： Hans-Peter Loock ,  Zhaoguo Tong

IPC: G02B6/00

CPC classification number: G01J3/433 ,  G01J3/0218 ,  G01J9/00 ,  G01N21/7703 ,  G01N2021/7779

Abstract: The invention provides a method and apparatus for measuring one or more optical properties, such as absorbance and refractive index, of a test medium such as a gas, a liquid, or solid material. The method comprises providing a passive optical waveguide loop comprising the test medium, launching in the optical loop an intensity-modulated light at a reference phase, detecting a phase of said light along the optical waveguide loop, and comparing the detected phase of said light along the loop with the reference phase, wherein the comparison provides information about one or more optical properties of the test medium.

Abstract translation: 本发明提供了一种用于测量诸如气体，液体或固体材料的测试介质的一种或多种光学性质（例如吸光度和折射率）的方法和装置。 该方法包括提供包括测试介质的无源光波导环路，在光环路中发射参考相位的强度调制光，检测沿着光波导环路的所述光的相位，并将所检测到的相位沿着 具有参考相位的循环，其中比较提供关于测试介质的一个或多个光学特性的信息。

公开(公告)号：US20050185179A1

公开(公告)日：2005-08-25

申请号：US11064956

申请日：2005-02-25

Applicant: Sean Wang

Inventor： Sean Wang

IPC: G01J3/10 ,  G01J3/28 ,  G01J3/433 ,  G01J3/453

CPC classification number: G01J3/10 ,  G01J3/021 ,  G01J3/433 ,  G01J3/453

Abstract: A Fourier Transform (FT) spectrometer apparatus uses multi-element MEMS (Micro-Electro-Mechanical-Systems) or D-MEMS (Diffractive Micro-Electro-Mechanical-Systems) devices. A polychromatic light source is first diffracted or refracted by a dispersive component such as a grating or prism. The dispersed beam is intersected by a multi-element MEMS apparatus. The MEMS apparatus encodes each spectral component thereof with different time varying modulation through corresponding MEMS element. The light radiation is then spectrally recombined as a single beam. The beam is further split into to a reference beam and a probe beam. The probe light is directed to a sample and then the transmitted or reflected light is collected. Both the reference beam and probe beam are detected by a photo-detector. The detected time varying signal is analyzed by Fourier transformation to resolve the spectral components of the sample under measurement.

Abstract translation: 傅立叶变换（FT）光谱仪装置使用多元件MEMS（微机电系统）或D-MEMS（衍射微机电系统）装置。 多色光源首先被诸如光栅或棱镜之类的色散成分衍射或折射。 分散的光束由多元件MEMS装置相交。 MEMS装置通过相应的MEMS元件对其每个频谱分量进行不同的时变调制。 然后将光辐射作为单个光束进行光谱重组。 光束进一步分成参考光束和探测光束。 探针光被引导到样品，然后收集透射或反射的光。 参考光束和探测光束均由光电检测器检测。 通过傅里叶变换分析检测到的时变信号，以解析测量样品的光谱分量。

公开(公告)号：US06897952B1

公开(公告)日：2005-05-24

申请号：US09869371

申请日：1999-06-25

Applicant: Thomas W. Hagler

Inventor： Thomas W. Hagler

IPC: G01J3/12 ,  G01J3/28 ,  G01J3/32 ,  G01J3/433 ,  G01J3/04

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0213 ,  G01J3/0229 ,  G01J3/0289 ,  G01J3/12 ,  G01J3/18 ,  G01J3/32 ,  G01J3/433 ,  G01J2001/4242 ,  G01J2003/2866

Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(mθ+pπ/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by corresponding filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

Abstract translation: 用作空间辐射调制器的盘在其上具有分散的辐射滤波器。 每个滤光器具有形式为sinθ2（mta + ppi / 4）的透射率或反射调制函数，其中m是正整数，p具有四个值0,1,2,3中的一个 包括所选择的波长分量的辐射束被衍射成根据波长分散的细长图像。 不同的波长分量聚焦在调制器上的不同滤波器上，并由相应的滤波器编码。 由于滤波器的调制功能彼此正交，因此可以在一次测量期间从总检测信号对相应的滤波器进行编码或调制之后提取每个波长分量的振幅。