公开(公告)号：US09708908B2

公开(公告)日：2017-07-18

申请号：US14762194

申请日：2014-06-13

Applicant: HALLIBURTON ENERGY SERVICES, INC.

Inventor： Li Gao ,  Michael T. Pelletier ,  David L. Perkins

IPC: E21B49/08 ,  E21B47/10 ,  G01B11/25 ,  G01N21/01 ,  G01J3/00 ,  G01N21/31 ,  H05K1/02 ,  H05K1/09 ,  H05K3/12 ,  G02B27/60

CPC classification number: E21B49/08 ,  E21B47/10 ,  G01B11/25 ,  G01J3/00 ,  G01J2003/1213 ,  G01J2003/1243 ,  G01N21/01 ,  G01N21/31 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/3581 ,  G01N22/00 ,  G01N33/2823 ,  G02B27/60 ,  H05K1/0296 ,  H05K1/09 ,  H05K3/125 ,  H05K3/1275 ,  H05K2201/0323 ,  H05K2201/0329

Abstract: An optical analysis tool includes an integrated computational element (ICE). The ICE includes a plurality of layers stacked along a first axis. Constitutive materials of the layers are electrically conductive and patterned with corresponding patterns. An arrangement of the patterns with respect to each other is related to a characteristic of a sample.

公开(公告)号：US20170118455A1

公开(公告)日：2017-04-27

申请号：US15096783

申请日：2016-04-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yongchul CHO ,  Myungjae JEON ,  Yonghwa PARK

IPC: H04N13/02 ,  G01J3/00

CPC classification number: H04N13/254 ,  G01J3/00 ,  G01S7/4814 ,  G01S7/4816 ,  G01S7/497 ,  G01S17/36 ,  G01S17/89 ,  G02F1/015 ,  G02F1/03

Abstract: Provided are a three-dimensional (3D) camera including a wavelength-variable light source for directly measuring transmittance and a method of measuring the transmittance. The 3D camera includes, as well as a light source, a transmission type shutter, and an image sensor, and a wavelength-variable light source capable of irradiating a light with a variable wavelength without being thermally affected by the light source, the image sensor, and the transmission type shutter. The wavelength-variable light source may directly measure a change in transmittance by irradiating light toward the transmission type shutter while the 3D camera operates.

公开(公告)号：US09605949B2

公开(公告)日：2017-03-28

申请号：US15287869

申请日：2016-10-07

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Atsushi Tsujii ,  Naomichi Chida ,  Kazufumi Nishida

IPC: G01J3/00 ,  G01J3/04 ,  G01J3/42 ,  G01J3/52 ,  G01N21/55 ,  G01B11/14 ,  G01J3/02 ,  G01J3/50

CPC classification number: G01B11/14 ,  G01B11/026 ,  G01B11/0608 ,  G01B2210/50 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0216 ,  G01J3/027 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/42 ,  G01J3/50

Abstract: A displacement sensor includes a light source unit configured to apply light with different plural wavelengths in a direction oblique to a measurement region of a planar measured object, a spectroscope configured to measure spectral distribution of light reflected by the measurement region, a feature amount extracting module configured to extract a feature amount of the spectral distribution, and a displacement calculating module configured to calculate displacement of the measurement region based on the extracted feature amount and a relation between displacement and a feature amount acquired previously.

公开(公告)号：US09599533B2

公开(公告)日：2017-03-21

申请号：US14284870

申请日：2014-05-22

Applicant: ABL IP HOLDING LLC

Inventor： Januk Aggarwal ,  Jack C. Rains, Jr. ,  David P. Ramer

IPC: G01J3/00 ,  G01M11/00 ,  G01J3/50 ,  H04N5/225 ,  G03B17/56

CPC classification number: G01M11/00 ,  G01J3/0205 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/28 ,  G01J3/502 ,  G01J3/505 ,  G01J5/522 ,  G01J5/60 ,  G03B17/565 ,  H04N5/2254

Abstract: An example of an optical accessory configured to produce an optical image depicting spectral characteristics of light. The produced optical image is captured by an image capture sensor of a mobile device. The captured image is processed by the mobile device to produce a measured value corresponding to a lighting-related parameter.

公开(公告)号：US20170067825A1

公开(公告)日：2017-03-09

申请号：US15122516

申请日：2015-03-24

Applicant: SHARP KABUSHIKI KAISHA

Inventor： TAKANOBU SATO ,  NOBORU IWATA ,  TAZUKO KITAZAWA

IPC: G01J3/00 ,  H01S5/068 ,  H01S5/00 ,  G01N21/53 ,  G01N21/61

CPC classification number: G01N21/53 ,  G01N21/61 ,  G01N21/77 ,  G01N2021/7773 ,  G01N2021/7776 ,  G01N2021/7783 ,  G01N2201/0612 ,  G03G15/043 ,  G03G15/50 ,  G03G15/55 ,  G03G21/20 ,  H01S5/0014 ,  H01S5/0028 ,  H01S5/06804 ,  H01S5/0683

Abstract: An optical sensor system is provided which can be used not only as an ordinary light source, but also to calculate an environmental parameter. Rear surface outgoing light (31) output from a rear surface (21) of a semiconductor laser (10) is used in a process of calculating an environmental parameter by control and arithmetic device (60) to, while front surface outgoing light (30) output from a front surface (20) is used in an application other than the calculation of the environmental parameter.

Abstract translation: 提供了一种不仅可以用作普通光源，还可用于计算环境参数的光学传感器系统。 在半导体激光器（10）的后表面（21）输出的后表面出射光（31）在通过控制和运算装置（60）计算环境参数的过程中被使用，而前表面出射光（30） 来自前表面（20）的输出用于除了计算环境参数之外的应用中。

公开(公告)号：US09568437B2

公开(公告)日：2017-02-14

申请号：US14895618

申请日：2014-05-19

Applicant: Hitachi High-Technologies Corporation

Inventor： Shunichi Matsumoto ,  Akira Hamamatsu ,  Takahiro Jingu

IPC: G01J3/00 ,  G01N21/00 ,  G01N21/88 ,  G01N21/956 ,  G01N21/95

CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/0636

Abstract: An inspection device is required to detect a minute defect, that is, to have high sensitivity as semiconductor devices become finer. There are some approaches for improving the sensitivity. One is to shorten the wavelength of illuminating light radiated onto a sample. This is because, assuming that the wavelength of the illuminating light is λ, I∝λ−4 is established between the magnitude of scattered light is I and λ. Another approach is to use illuminating light including multiple wavelengths. An approach for taking in more scattered light generated from the sample is also possible. However, an optical system suitable for these approaches has not been sufficiently found in conventional techniques. One feature of the present invention is to detect a defect by using a Wolter optical system including a Wolter mirror.

Abstract translation: 需要检查装置来检测微小缺陷，即，随着半导体器件变得更细，具有高灵敏度。 有一些提高灵敏度的方法。 一个是缩短辐射到样品上的照明光的波长。 这是因为，假设照明光的波长为λ，则在散射光的大小为I和λ之间建立Iαλ-4。 另一种方法是使用包括多个波长的照明光。 采用从样品产生的更多散射光的方法也是可能的。 然而，适用于这些方法的光学系统在常规技术中尚未充分发现。 本发明的一个特征是通过使用包括Wolter反射镜的Wolter光学系统来检测缺陷。

公开(公告)号：US09566005B2

公开(公告)日：2017-02-14

申请号：US14356020

申请日：2012-09-10

Applicant: Yoichi Toriumi ,  Hideo Kawabe ,  Kenichi Kabasawa ,  Tatsuya Suzuki ,  Hirokazu Imai ,  Masatoshi Ueno

Inventor： Yoichi Toriumi ,  Hideo Kawabe ,  Kenichi Kabasawa ,  Tatsuya Suzuki ,  Hirokazu Imai ,  Masatoshi Ueno

IPC: G01J3/00 ,  A61B5/00 ,  G01N21/47

CPC classification number: A61B5/0075 ,  A61B5/0079 ,  G01N21/474 ,  G01N2021/4761

Abstract: There is provided a measuring apparatus, including a light receiving element, provided at a position facing a measurement object region on which is placed a measurement object, which forms an image with light from the measurement object region, light emitting elements, arranged surrounding the light receiving element, which emit light for measuring the measurement object, and reflective optical elements, provided above the light emitting elements, which guide, to the measurement object region, emission light radiated from the light emitting elements. A light receiving surface of the light receiving element and light emission surfaces of the light emitting elements are positioned mutually on a same plane. The emission light radiated from the light emitting elements is reflected by the reflective optical elements, and center lines of the emission light radiated from each of the light emitting elements pass through an approximate center of the measurement object region.

Abstract translation: 提供了一种测量装置，包括：光接收元件，设置在面向测量对象区域的位置，测量对象区域上放置有测量对象的光，其与来自测量对象区域的光形成图像;发光元件，布置在光周围 发射用于测量测量对象的光的接收元件和设置在发光元件上方的反射光学元件，其将从发光元件辐射的发射光引导到测量对象区域。 光接收元件的光接收表面和发光元件的发光表面相互位于同一平面上。 从发光元件照射的发射光被反射光学元件反射，从每个发光元件辐射的发射光的中心线通过测量对象区域的大致中心。

公开(公告)号：US09541532B2

公开(公告)日：2017-01-10

申请号：US14466088

申请日：2014-08-22

Applicant: SunChrom Wissenschaftliche Geräte GmbH

Inventor： Günes Barka

IPC: G01J3/00 ,  G01N30/86 ,  G01N30/74 ,  G01J3/28 ,  G01N21/33 ,  G01N30/02

CPC classification number: G01N30/8658 ,  G01J3/28 ,  G01J2003/283 ,  G01N21/33 ,  G01N30/74 ,  G01N2030/027

Abstract: An ultraviolet-visible spectrophotometry (UV/Vis) high-performance liquid chromatography (HPLC) photometer includes a nano flow cell in which a light source feeds a reference light channel and a sample light channel, a reference photodiode for evaluating the reference light channel, and a sample photodiode for evaluating the sample light channel, which extends through the nano flow cell. To create a photometer whose signal evaluation is improved, respective effective exposure times of the sample photodiode and the reference photodiode are settable separately from one another.

Abstract translation: 紫外可见分光光度法（UV / Vis）高效液相色谱（HPLC）光度计包括其中光源馈送参考光通道和样品光通道的纳米流动池，用于评估参考光通道的参考光电二极管， 以及用于评估延伸穿过纳米流动池的样品光通道的样品光电二极管。 为了创建其信号评估提高的光度计，样品光电二极管和参考光电二极管的相应有效曝光时间可以彼此分开地设置。

公开(公告)号：US09453764B2

公开(公告)日：2016-09-27

申请号：US14805221

申请日：2015-07-21

Applicant: H2Optx Inc.

Inventor： Rudolf J. Hofmeister ,  Donald A. Ice ,  Scott W. Tandy

IPC: G01N21/25 ,  G01J3/42 ,  G01J3/44 ,  G01J3/06 ,  G01J3/10 ,  B01D46/00 ,  B01D46/42 ,  G01N1/06 ,  G01N33/15 ,  G01N21/01 ,  G01N23/00 ,  G01N35/10 ,  G01N21/3504 ,  G01J3/00 ,  G01N21/33 ,  G01N21/3577 ,  G01N21/65

CPC classification number: G01J3/42 ,  B01D46/0002 ,  B01D46/42 ,  G01J3/00 ,  G01J3/0267 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/10 ,  G01J3/44 ,  G01N1/06 ,  G01N21/01 ,  G01N21/25 ,  G01N21/253 ,  G01N21/33 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/65 ,  G01N23/00 ,  G01N33/15 ,  G01N35/10 ,  G01N2021/0106 ,  G01N2201/0231

Abstract: The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.

Abstract translation: 本公开一般涉及用于分析和处理样品或分析物的系统，装置和方法。 在一个示例性配置中，分析分析物的方法包括剃刮分析物的多个层的第一层以暴露分析物的第一表面。 该方法包括将分析物的第一表面定位在高光谱分析子组件的窗口上。 该方法还包括通过高光谱分析子组件扫描分析物的第一表面以获得关于第一表面附近的分析物的信息。 本文公开了其它系统，装置和方法。

公开(公告)号：US09429515B2

公开(公告)日：2016-08-30

申请号：US14604337

申请日：2015-01-23

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Jiang-Tao Wang ,  Tian-Yi Li ,  Qing-Yu Zhao ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: G01J3/00 ,  G01N21/47 ,  B82Y15/00 ,  G02B21/36

CPC classification number: G01N21/47 ,  B82Y15/00 ,  G01N21/4738 ,  G02B21/365

Abstract: A optical microscopy vapor-condensation-assisted device comprises an air blowing device, a vapor producing device and a guide pipe connected with each other in seal. One end of the vapor producing device is connected to the air blowing device, another end of the vapor producing device is connected to the guide pipe. The vapor producing device produces vapor. The air blowing device blows air through the vapor producing device into the guide pipe.

Abstract translation: 光学显微镜蒸气冷凝辅助装置包括在密封件中彼此连接的送风装置，蒸汽产生装置和导管。 蒸汽发生装置的一端与送风装置连接，蒸汽发生装置的另一端连接到导管。 蒸气产生装置产生蒸气。 送风装置将空气通过蒸气产生装置吹入导管。