SPECTROMETER MODULE
    61.
    发明申请
    SPECTROMETER MODULE 审中-公开

    公开(公告)号:US20170184452A1

    公开(公告)日:2017-06-29

    申请号:US15389043

    申请日:2016-12-22

    Applicant: IMEC VZW

    Abstract: A spectrometer module comprising a plurality of separate electronic circuit modules is disclosed. Each separate electronic module comprises an integrated sensor circuit including a light sensitive area occupying part of an area of the integrated sensor circuit, the integrated sensor circuit being arranged to detect incident light. In one aspect, the plurality of separate electronic circuit modules includes a group of adjacent electronic circuit modules. The light sensitive areas of the electronic circuit modules in the group are so arranged on the respective integrated sensor circuits that the group of adjacent electronic circuit modules is mounted so that the light sensitive areas thereof are arranged in vicinity to each other. The spectrometer module includes an optical module, which is common to said plurality of separate electronic circuit modules and arranged to direct incident light towards the light sensitive areas of each of said electronic circuit modules.

    Photodiode array for spectrometric measurements and spectrometric measurement system
    64.
    发明授权
    Photodiode array for spectrometric measurements and spectrometric measurement system 有权
    用于光谱测量和光谱测量系统的光电二极管阵列

    公开(公告)号:US09429471B2

    公开(公告)日:2016-08-30

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

    SPECTRAL CHARACTERISTIC OBTAINING APPARATUS, IMAGE EVALUATION APPARATUS AND IMAGE FORMING APPARATUS
    65.
    发明申请
    SPECTRAL CHARACTERISTIC OBTAINING APPARATUS, IMAGE EVALUATION APPARATUS AND IMAGE FORMING APPARATUS 审中-公开
    光谱特征获取装置,图像评估装置和图像形成装置

    公开(公告)号:US20150253190A1

    公开(公告)日:2015-09-10

    申请号:US14718499

    申请日:2015-05-21

    Abstract: A spectral characteristic obtaining apparatus including a light irradiation unit configured to emit light onto a reading object; a spectroscopic unit configured to separate at least a part of diffused reflected light from the light emitted onto the reading object by the light irradiation unit into a spectrum; and a light receiving unit configured to receive the diffused reflected light separated into the spectrum by the spectroscopic unit and to obtain a spectral characteristic. The light receiving unit is configured to be a spectroscopic sensor array including plural spectroscopic sensors arranged in a direction, and the spectroscopic sensors include a predetermined number of pixels arranged in the direction to receive lights with different spectral characteristics from each other.

    Abstract translation: 一种光谱特征获取装置,包括被配置为将光发射到读取对象上的光照射单元; 分光单元,被配置为将由所述光照射单元发射到所述读取对象的光的漫反射光的至少一部分分离成光谱; 以及光接收单元,被配置为接收由分光单元分离成光谱的扩散反射光并获得光谱特性。 光接收单元被配置为包括沿方向排列的多个分光传感器的分光传感器阵列,并且分光传感器包括沿着彼此具有不同光谱特性的光的方向排列的预定数量的像素。

    IMAGING DEVICE
    66.
    发明申请
    IMAGING DEVICE 有权
    成像装置

    公开(公告)号:US20150234150A1

    公开(公告)日:2015-08-20

    申请号:US14404552

    申请日:2013-05-23

    Abstract: Provided is an imaging device (1) having: a front optical system (10) that transmits light from an object; a spectral filter array (20) that transmits light from the front optical system (10) via a plurality of spectral filters; a small lens array (30) that transmits the light from the plurality of spectral filters via a plurality of small lenses respectively, and forms a plurality of object images; a picture element (50) that captures the plurality of object images respectively; and an image processor (60) that determines two-dimensional spectral information on the object images based on image signals output from the picture element (50). The front optical system (10) is configured to transmit the light from the focused object to collimate the light into a parallel luminous flux.

    Abstract translation: 提供了一种成像装置(1),具有:从物体透射光的前光学系统(10) 经由多个光谱滤光器从前光学系统(10)透射光的光谱滤波器阵列(20); 分别通过多个小透镜透过来自所述多个光谱滤光器的光的小透镜阵列(30),并形成多个物体图像; 分别捕获多个对象图像的图像元素(50); 以及图像处理器(60),其基于从所述图像元素(50)输出的图像信号来确定所述对象图像上的二维光谱信息。 前光学系统(10)被配置为透射来自被聚焦物体的光以将光准直成平行光通量。

    Spectral characteristic obtaining apparatus, image evaluation apparatus and image forming apparatus
    67.
    发明授权
    Spectral characteristic obtaining apparatus, image evaluation apparatus and image forming apparatus 有权
    光谱特征获取装置,图像评估装置和图像形成装置

    公开(公告)号:US09068893B2

    公开(公告)日:2015-06-30

    申请号:US13138428

    申请日:2010-03-24

    Abstract: A spectral characteristic obtaining apparatus including a light irradiation unit configured to emit light onto a reading object; a spectroscopic unit configured to separate at least a part of diffused reflected light from the light emitted onto the reading object by the light irradiation unit into a spectrum; and a light receiving unit configured to receive the diffused reflected light separated into the spectrum by the spectroscopic unit and to obtain a spectral characteristic. In at least one example embodiment, the light receiving unit is configured to be a spectroscopic sensor array including plural spectroscopic sensors arranged in a direction, and the spectroscopic sensors include a predetermined number of pixels arranged in the direction to receive lights with different spectral characteristics from each other.

    Abstract translation: 一种光谱特征获取装置,包括被配置为将光发射到读取对象上的光照射单元; 分光单元,被配置为将由所述光照射单元发射到所述读取对象的光的漫反射光的至少一部分分离成光谱; 以及光接收单元,被配置为接收由分光单元分离成光谱的扩散反射光并获得光谱特性。 在至少一个示例性实施例中,光接收单元被配置为包括沿方向布置的多个分光传感器的分光传感器阵列,并且光谱传感器包括沿着方向布置的预定数量的像素,以接收具有不同光谱特性的光 彼此。

    SINGLE-SENSOR HYPERSPECTRAL IMAGING DEVICE
    68.
    发明申请
    SINGLE-SENSOR HYPERSPECTRAL IMAGING DEVICE 有权
    单传感器超高速成像装置

    公开(公告)号:US20150177429A1

    公开(公告)日:2015-06-25

    申请号:US13844737

    申请日:2013-03-15

    Abstract: The present disclosure generally relates to hyperspectral spectroscopy, and in particular, to systems, methods and devices enabling a single-sensor hyperspectral imaging device. Hyperspectral (also known as “multispectral”) spectroscopy is an imaging technique that integrates multiples images of an object resolved at different narrow spectral bands (i.e., narrow ranges of wavelengths) into a single data structure, referred to as a three-dimensional hyperspectral data cube. Data provided by hyperspectral spectroscopy allow for the identification of individual components of a complex composition through the recognition of spectral signatures of individual components within the three-dimensional hyperspectral data cube.

    Abstract translation: 本公开通常涉及高光谱光谱学,特别涉及能够实现单传感器超光谱成像装置的系统,方法和装置。 高光谱(也称为“多光谱”)光谱学是一种成像技术,其将在不同窄谱带(即,窄波长范围)分辨的物体的多个图像集成为单个数据结构,称为三维高光谱数据 立方体。 通过高光谱谱提供的数据可以通过识别三维高光谱数据立方体内各个成分的光谱特征来识别复合物组成的各个成分。

    Apparatus and Methods for Hyperspectral Imaging with Parallax Measurement
    69.
    发明申请
    Apparatus and Methods for Hyperspectral Imaging with Parallax Measurement 有权
    具有视差测量的高光谱成像的装置和方法

    公开(公告)号:US20150136954A1

    公开(公告)日:2015-05-21

    申请号:US14539981

    申请日:2014-11-12

    Applicant: EO Vista, LLC

    Inventor: Steven J. Wein

    Abstract: An apparatus and corresponding method for line-scan imaging includes a 2D array of light-sensitive detector elements divided into a plurality of sub-arrays. An electrical circuit can be configured to determine a correction for parallax based on detector element values from at least two rows of parallax detecting elements to enable images captured by the sub-arrays to be co-aligned with each other. The 2D array and parallax detecting elements can be located on the same substrate chip. Image data from sub-arrays can be co-aligned with each other based on parallax data from the parallax detecting elements and used to produce hyperspectral images corrected for parallax.

    Abstract translation: 用于线扫描成像的装置和相应方法包括被分成多个子阵列的光敏检测器元件的2D阵列。 电路可以被配置为基于来自至少两行视差检测元件的检测器元件值来确定视差的校正,以使由子阵列捕获的图像能够彼此对齐。 2D阵列和视差检测元件可以位于相同的衬底芯片上。 来自子阵列的图像数据可以基于来自视差检测元件的视差数据彼此共同对准,并且用于产生针对视差校正的高光谱图像。

    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM
    70.
    发明申请
    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM 有权
    用于光谱测量和光谱测量系统的光电子阵列

    公开(公告)号:US20150048239A1

    公开(公告)日:2015-02-19

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

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