公开(公告)号：US07319529B2

公开(公告)日：2008-01-15

申请号：US11154520

申请日：2005-06-17

Applicant: Noam Babayoff

Inventor： Noam Babayoff

IPC: G01B11/30 ,  G01B9/02

CPC classification number: H04N13/15 ,  A61B1/00009 ,  A61B1/00096 ,  A61B1/0615 ,  A61B1/0638 ,  A61B1/0646 ,  A61B1/0676 ,  A61B1/0684 ,  A61B1/24 ,  A61B1/247 ,  A61B5/0068 ,  A61B5/0088 ,  A61B5/1077 ,  A61B5/1079 ,  A61C9/0053 ,  A61C9/0066 ,  A61C19/04 ,  G01B11/24 ,  G01B11/25 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/10 ,  G01J3/462 ,  G01J3/50 ,  G01J3/501 ,  G01J3/508 ,  G01J3/51 ,  G01N21/255 ,  G06F19/00 ,  G06T7/0012 ,  G06T7/12 ,  G06T7/90 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/30036 ,  H01L27/14868 ,  H04N13/207 ,  H04N13/257 ,  H04N13/271 ,  H04N13/296

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

公开(公告)号：US07245376B2

公开(公告)日：2007-07-17

申请号：US11284213

申请日：2005-11-22

Applicant: Martin M. Liphardt ,  Blaine D. Johs ,  Jeffrey S. Hale ,  Craig M. Herzinger ,  Steven E. Green ,  Ping He ,  John A. Woollam

Inventor： Martin M. Liphardt ,  Blaine D. Johs ,  Jeffrey S. Hale ,  Craig M. Herzinger ,  Steven E. Green ,  Ping He ,  John A. Woollam

IPC: G01J4/00

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0243 ,  G01J4/00 ,  G01N21/21 ,  G01N21/211 ,  G01N2021/213 ,  G02B17/008

Abstract: Low aberration relay systems modified to perform as spatial filters in rotating compensator ellipsometer, polarimeter and the like systems.

Abstract translation: 改进的低像差继电器系统在旋转补偿器椭圆偏振器，偏振计等系统中作为空间滤波器。

公开(公告)号：US20060197948A1

公开(公告)日：2006-09-07

申请号：US11399133

申请日：2006-04-06

Applicant: Adam Norton ,  Kenneth Johnson ,  Fred Stanke

Inventor： Adam Norton ,  Kenneth Johnson ,  Fred Stanke

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0224 ,  G01J3/0243 ,  G01J3/28 ,  G01N21/21 ,  G01N21/31 ,  G01N21/956 ,  G01N2021/213 ,  G02B5/3083 ,  G02B27/28 ,  G02B27/286 ,  G02B27/288 ,  G03F7/70625 ,  G03F7/70991

Abstract: A small-spot imaging, spectrometry instrument for measuring properties of a sample has a polarization-scrambling element, such as a birefringent plate depolarizer, incorporated between the polarization-introducing components of the system, such as the beamsplitter, and the microscope objective of the system. The plate depolarizer varies polarization with wavelength, and may be a Lyot depolarizer with two plates, or a depolarizer with more than two plates (such as a three-plate depolarizer). Sinusoidal perturbation in the resulting measured spectrum can be removed by data processing techniques or, if the depolarizer is thick or highly birefringent, the perturbation may be narrower than the wavelength resolution of the instrument.

公开(公告)号：US20060087728A1

公开(公告)日：2006-04-27

申请号：US11258741

申请日：2005-10-26

Applicant: Johannes Winterot

Inventor： Johannes Winterot

IPC: G02B21/00

CPC classification number: G02B17/0884 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G02B17/08 ,  G02B17/0852 ,  G02B17/0856 ,  G02B21/002 ,  G02B21/082 ,  G02B27/30

Abstract: An optical system, in particular a microscope, is provided, comprising an optical unit and a collimator, which collimator is arranged preceding or following the optical unit in a beam path of the optical system, said optical unit imposing a predetermined longitudinal chromatic aberration on a beam supplied to said beam path and said beam impinging on the collimator as a diverging beam or a parallel beam and being converted by said collimator into a parallel beam or a converging beam, with the collimator comprising at least one lens (L) as well as a curved mirror which folds the beam path such that the supplied beam passes twice through the lens.

Abstract translation: 提供了一种光学系统，特别是显微镜，包括光学单元和准直器，该准直器布置在光学系统的光束路径中的光学单元之前或之后，所述光学单元在一个光学单元上施加预定的纵向色差 提供给所述光束路径的光束和所述光束作为发散光束或平行光束入射到准直器上，并且由所述准直器转换成平行光束或会聚光束，准直器包括至少一个透镜（L）以及 弯曲的镜子折叠光束路径，使得所提供的光束通过两次透镜。

公开(公告)号：US20050280906A1

公开(公告)日：2005-12-22

申请号：US11003012

申请日：2004-12-03

Applicant: David Scheiner ,  Michael Winik ,  Yakov Lyubchik

Inventor： David Scheiner ,  Michael Winik ,  Yakov Lyubchik

IPC: G01N21/21 ,  G01N21/47 ,  G01N21/956 ,  G02B20060101 ,  G02B17/00 ,  G02B17/06 ,  G02B21/04 ,  G02B21/16

CPC classification number: G02B21/16 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0224 ,  G01J3/0243 ,  G01N21/211 ,  G01N21/47 ,  G01N21/956 ,  G02B17/06 ,  G02B17/0605 ,  G02B19/0023 ,  G02B19/0047 ,  G02B19/0095 ,  G02B21/04 ,  G02B27/10 ,  G02B27/283

Abstract: A lens arrangement is presented. The lens arrangement comprises a first element having a concave reflective surface and defining an optical axis of the lens arrangement, and a second substantially flat and at least partially reflective element spaced-apart from the first element along the optical axis. The second element is configured to allow light passage therethrough and is oriented with respect to the optical axis and the first element such that at a predetermined angle of incidence of an input light beam onto the second element, the input light beam is reflected onto the reflective surface of the first element and reflected therefrom to pass through the second element.

Abstract translation: 呈现镜头布置。 透镜装置包括具有凹面反射表面并限定透镜装置的光轴的第一元件以及沿着光轴与第一元件间隔开的第二基本平坦且至少部分反射的元件。 第二元件被配置为允许光通过其并且相对于光轴和第一元件定向，使得在输入光束到第二元件的预定入射角度处，输入光束被反射到反射 第一元件的表面并从其反射以穿过第二元件。

公开(公告)号：US20050036141A1

公开(公告)日：2005-02-17

申请号：US10945404

申请日：2004-09-20

Applicant: Isaac Richman

Inventor： Isaac Richman

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28

CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/2823

Abstract: Spectral imaging apparatus and methods are disclosed. In one embodiment, a spectral imaging apparatus includes a spectral imaging apparatus includes a diffraction grating having one or more entrance apertures formed therein, a collecting reflecting element for reflecting said incident radiation to a diffractive surface of said diffraction grating, and a reimaging system adapted to provide a spectral image at a focal surface. The collecting reflecting element may include an aspherically-shaped portion, and the entrance apertures may be distributed along a straight or a non-straight axis. Alternately, optical fibres may be disposed in the entrance apertures. The spectral image provides a spectrum of radiation such that a first portion of the spectrum of radiation from a first region can be distinguished from a second portion of the spectrum of radiation from a second region.

Abstract translation: 公开了光谱成像装置和方法。 在一个实施例中，光谱成像设备包括光谱成像设备，其包括具有形成在其中的一个或多个入射孔的衍射光栅，用于将所述入射辐射反射到所述衍射光栅的衍射表面的收集​​反射元件，以及适于 在焦点表面提供光谱图像。 收集反射元件可以包括非球面形状的部分，并且入口孔可以沿直线或非直线轴线分布。 或者，光纤可以设置在入口孔中。 光谱图像提供辐射光谱，使得来自第一区域的辐射光谱的第一部分可以与来自第二区域的辐射光谱的第二部分区分开。

公开(公告)号：US06765609B1

公开(公告)日：2004-07-20

申请号：US09577622

申请日：2000-05-25

Applicant: Katsuyuki Kinoshita

Inventor： Katsuyuki Kinoshita

IPC: H04N5228

CPC classification number: G01J3/2823 ,  G01J3/0243 ,  G01J3/0248 ,  G01J3/2803 ,  H04N5/33

Abstract: A solid-state image sensor, which has a two-dimensional matrix of a plurality of pixels used to sense the two-dimensional spatial distribution of radioactive rays, light rays, electrons, ions, or the like, is provided with an aperture that extends through a substrate at an image sensing unit on which the pixels are arranged, and a signal transfer path that connects signal transfer electrodes for reading images of the respective pixels kept clear of the aperture. Furthermore, the image sensing unit is divided into at least two regions by a boundary including the aperture, and these regions have individual signal read registers. With this structure, the image sensor serves as both an image sensor for sensing the two-dimensional distribution of radiation or the like, and an aperture for passing such radiation.

Abstract translation: 具有用于感测放射线，光线，电子，离子等的二维空间分布的多个像素的二维矩阵的固态图像传感器设置有延伸的孔径 通过其上布置有像素的图像感测单元的衬底以及连接用于读取各个像素的图像的信号传送电极的信号传送路径保持远离孔径。 此外，图像感测单元通过包括孔径的边界被划分为至少两个区域，并且这些区域具有单独的信号读取寄存器。 利用这种结构，图像传感器用作用于感测辐射等的二维分布的图像传感器和用于通过这种辐射的孔。

公开(公告)号：US06549280B2

公开(公告)日：2003-04-15

申请号：US09871538

申请日：2001-05-31

Applicant: Paolinetti Riccardo ,  Pieri Silvano ,  Romoli Andrea

Inventor： Paolinetti Riccardo ,  Pieri Silvano ,  Romoli Andrea

IPC: G01J328

CPC classification number: G02B17/0888 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0243 ,  G01J3/14 ,  G02B19/0028 ,  G02B19/0085

Abstract: The spectrometer comprises, in combination: a slit (1) for the entry of a light beam; a collimator; a dispersion system (9); focusing means and a detector (13). The collimator comprises at least a first concave spherical mirror (3) and at least a first Schmidt plate (5) in an off-axis arrangement.

公开(公告)号：US20030053048A1

公开(公告)日：2003-03-20

申请号：US10211558

申请日：2002-08-05

Applicant: RENISHAW PLC

Inventor： Robert Bennett ,  Andrew Mark Woolfrey ,  John Charles Clifford Day ,  Angus Bewick

IPC: G01J003/44

CPC classification number: H01J37/228 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0243 ,  G01J3/44 ,  H01J37/256 ,  H01J2237/2445 ,  H01J2237/2808

Abstract: An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.

Abstract translation: 电子显微镜10适于使得能够对样品16进行光谱分析。抛物面反射镜18具有中心孔20，电子束可以穿过中心孔20。 反射镜18将来自横向光路24的激光照明聚焦到样品上，并收集拉曼和/或其他散射光，将其返回到光学系统30.反射镜18可以在电子显微镜的真空中收缩（在电子显微镜的真空中） 滑动臂组件22。

公开(公告)号：US20020103439A1

公开(公告)日：2002-08-01

申请号：US10028568

申请日：2001-12-19

Inventor： Haishan Zeng ,  Stephen Lam ,  Branko Mihael Palcic

IPC: A61B006/00

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0289 ,  G01J3/10 ,  G01J3/36 ,  G01N23/223 ,  G01N2223/076

Abstract: Optical systems that provide for simultaneous images and spectra from an object, such as a tissue sample, an industrial object such as a computer chip, or any other object that can be viewed with an optical system such as a microscope, endoscope, telescope or camera. In some embodiments, the systems provide multiple images corresponding to various desired wavelength ranges within an original image of the object, as well as, if desired, directional pointer(s) that can provide both an identification of the precise location from which a spectrum is being obtained, as well as enhancing the ability to point the device.

Abstract translation: 提供来自物体的同时图像和光谱的光学系统，例如组织样本，诸如计算机芯片的工业对象或可以用诸如显微镜，内窥镜，望远镜或照相机的光学系统观察的任何其它物体 。 在一些实施例中，系统提供对应于对象的原始图像内的各种期望波长范围的多个图像，以及如果需要的方向指针，其可以提供频谱的精确位置的识别 获得，以及增强指向设备的能力。