Abstract:
An engraving apparatus for producing a printing cylinder with an electron beam, a device for producing the beam and having a vacuum chamber housing, the vacuum chamber housing forming a gap with the cylinder during engraving, the lower part of the housing being removable and has a curvature to fit a predetermined cylinder size to form a gap therewith.
Abstract:
A METHOD IS DISCLOSED FOR DRILLING HOLES, EXCAVATING AND/OR TUNNELING IN ROCKY TERRAIN OR CUTTING OR BREAKING UP ROCK OR GLASS WITH A CORPUSCULAR BEAM, OF ELECTRONS OR IONS OF HIGH ENERGY DENSITY, TYPICALLY EXCEEDING ABOUT 10**6 WATTS PER SQUARE CENTIMETER. THE BEAM IS PROJECTED INTO THE ATMOSPHERE FROM THE CHAMBER IN WHICH IT IS GENERATED. MOLTEN MATERIAL, FUMES AND DUST MAY BE BLASTED AWAY BY A STREAM OF GAS, WATER OR STEAM. THE SURFACE BEING IMPINGED BY THE BEAM MAY ADVANTAGEOUSLY BE UNDER WATER. THE PARTICLES OF THE BEAM MAY ALSO HAVE VERY HIGH ENERGY (ACCELERATING VOLTAGE ONE MILLION TO 100 MILLION VOLTS) TO PRODUCE A BLASTING EFFECT UNDER THE SURFACE OF THE MATERIAL BEING DISRUPTED.
Abstract:
An interface, a scanning electron microscope and a method for observing an object that is positioned in a non-vacuum environment. The method includes: passing at least one electron beam that is generated in a vacuum environment through at least one aperture out of an aperture array and through at least one ultra thin membrane that seals the at least one aperture; wherein the at least one electron beam is directed towards the object; wherein the at least one ultra thin membrane withstands a pressure difference between the vacuum environment and the non-vacuum environment; and detecting particles generated in response to an interaction between the at least one electron beam and the object.
Abstract:
A device (2; 2I; 2II; 2IV; 2V; 2VI; 2VII; 2VIII) for generating plasma and for directing an electron beam towards a target (3); the device (2; 2I; 2II; 2IV; 2V; 2VI; 2VII; 2VIII) comprises a hollow element (5); an activation group (21), which is designed to impose a difference in potential between the hollow element (5) and another element which is separate from it, in such a way as to direct the electron beam towards said separate element; and a de Laval nozzle (23), having at least one tapered portion (13), which is tapered towards the separate element and is designed to accelerate a gas flow towards the separate element.
Abstract:
A charged particle lithography system for transferring a pattern onto the surface of a target, comprising a source for generating a charged particle beam, a first chamber housing the source, a collimating system for collimating the charged particle beam, a second chamber housing the collimating system, and a first aperture array element for generating a plurality of charged particle subbeams from the collimated charged particle beam.