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    DRIFT TUBES
    62.
    发明公开
    DRIFT TUBES 审中-公开

    公开(公告)号：US20240213009A1

    公开(公告)日：2024-06-27

    申请号：US18590320

    申请日：2024-02-28

    Applicant: Decision Sciences International Corporation

    Inventor： Joshua Malowney ,  Dustin Caldwell

    IPC: H01J47/00

    CPC classification number: H01J47/008

    Abstract: Disclosed include a drift tube for particle detection, a detection system including one or more of the drift tubes, a method of producing a drift tube, and a detection method using a drift tube and/or a detection systems. The drift tube may include: a housing tube extending along a longitudinal axis and structured to include a first end, a second end, and an internal surface configured as a cathode, a first end cap and a second end cap hermetically engaged to and electrically isolated from the first end and the second end of the housing tube, respectively; a detection gas enclosed inside the housing tube and configured for undergo ionization by charged particles; and an anode wire traversing the housing tube along the longitudinal axis and being configured to detect the ionization that indicates a track of the charged particles inside the drift tube.

    Method of mass separating ions and mass separator
    66.
    发明授权
    Method of mass separating ions and mass separator 有权

    公开(公告)号：US09922812B2

    公开(公告)日：2018-03-20

    申请号：US15346684

    申请日：2016-11-08

    Applicant: Thermo Fisher Scientific (Bremen) GmbH

    Inventor： Alexander Makarov

    IPC: H01J47/00 ,  H01J49/40 ,  H01J49/42

    CPC classification number: H01J49/406 ,  H01J49/4245

    Abstract: An analyzer for separating ions according to their time of flight comprising two opposing ion mirrors abutting at a first plane, each mirror comprising inner and outer field-defining electrode systems elongated along an analyzer axis, the outer field-defining electrode system surrounding the inner field-defining electrode system. The outer field-defining electrode system of one mirror comprises two sections, the sections abutting at a second plane, comprising a first section between the first plane and the second plane, and a second section adjacent to the first section. The first section has at least a portion which extends radially from the analyzer axis a greater extent than an adjacent portion of the second section at the second plane. The outer field-defining electrode system comprises an exit port and the analyzer comprises a detector located downstream of the exit port.

    Microcavity plasma panel radiation detector
    67.
    发明授权
    Microcavity plasma panel radiation detector 有权
    微腔等离子体面板辐射探测器

    公开(公告)号：US09529099B2

    公开(公告)日：2016-12-27

    申请号：US14080218

    申请日：2013-11-14

    Applicant: Integrated Sensors LLC ,  University of Michigan

    Inventor： Peter S. Friedman ,  Daniel S. Levin

    IPC: G01T1/185 ,  G01T1/29 ,  H01J47/00 ,  H01J47/02

    CPC classification number: G01T1/2935 ,  G01T1/185 ,  G01T1/2921 ,  H01J47/002 ,  H01J47/02

    Abstract: A position-sensitive ionizing-radiation counting detector includes a first substrate and a second substrate, and a defined gas gap between the first substrate and the second substrate. The first and second substrates comprise dielectrics and a discharge gas is contained between the first and second substrate. A microcavity structure comprising microcavities is coupled to the second substrate. An anode electrode is coupled to the first substrate and a cathode electrode is coupled to the microcavity structure on the second substrate. The detector further includes pixels defined by a microcavity and an anode electrode coupled to a cathode electrode, and a resistor coupled to each of the cathode electrodes. Each pixel may output a gas discharge counting event pulse upon interaction with ionizing-radiation. The detector further includes a voltage bus coupled to each of the resistors and a power supply coupled to at least one of the electrodes.

    Abstract translation: 位置敏感电离辐射计数检测器包括第一衬底和第二衬底，以及第一衬底和第二衬底之间限定的气隙。 第一和第二基板包括电介质，并且放电气体包含在第一和第二基板之间。 包括微腔的微腔结构耦合到第二衬底。 阳极电极耦合到第一衬底，并且阴极电极耦合到第二衬底上的微腔结构。 检测器还包括由微腔限定的像素和耦合到阴极电极的阳极电极和耦合到每个阴极电极的电阻器。 每个像素可以在与电离辐射相互作用时输出气体放电计数事件脉冲。 检测器还包括耦合到每个电阻器的电压总线和耦合到至少一个电极的电源。

    Wavelength detector and wavelength calibration system
    68.
    发明授权
    Wavelength detector and wavelength calibration system 有权
    波长检测器和波长校准系统

    公开(公告)号：US09478933B2

    公开(公告)日：2016-10-25

    申请号：US13535641

    申请日：2012-06-28

    Applicant: Toru Suzuki ,  Shinichi Matsumoto

    Inventor： Toru Suzuki ,  Shinichi Matsumoto

    IPC: H01S3/13 ,  G01J1/42 ,  H01S3/137 ,  H01S3/225 ,  G01J9/00 ,  G01J9/02 ,  H01J47/00 ,  H01S3/08 ,  H01S3/10

    CPC classification number: H01S3/13 ,  G01J1/429 ,  G01J9/00 ,  G01J9/0246 ,  H01J47/00 ,  H01S3/08004 ,  H01S3/08009 ,  H01S3/10069 ,  H01S3/1303 ,  H01S3/137 ,  H01S3/225

    Abstract: The wavelength detector includes a diffusion element that diffuses the laser beam; a light collection optical system provided downstream from the diffusion element; a member, including an aperture, provided downstream from the light collection optical system; a discharge tube that is provided downstream from the member and that includes a cylindrical anode and a cylindrical cathode that each have a through-hole formed therein, and that is configured so that an electrical property between the anode and the cathode changes due to an opto-galvanic effect when a laser beam having a predetermined wavelength passes through the through-hole of the cathode in a state in which a DC voltage is applied to the anode; and a high-voltage DC power source. The discharge tube is disposed so that the laser beam that passes through the aperture passes through the through-hole of the cathode of the discharge tube without directly irradiating the cathode.

    Abstract translation: 波长检测器包括扩散激光束的扩散元件; 设置在扩散元件下游的光收集光学系统; 包括孔的构件，设置在所述光收集光学系统的下游; 放电管，其设置在所述构件的下游，并且包括圆柱形阳极和圆柱形阴极，每个具有形成在其中的通孔，并且被配置为使得阳极和阴极之间的电特性由于光电而改变 当具有预定波长的激光束在向阳极施加直流电压的状态下穿过阴极的通孔时， 和高压直流电源。 放电管被布置成使得穿过孔的激光束通过放电管的阴极的通孔而不直接照射阴极。

    Electron microscope and method of adjusting monochromator
    70.
    发明授权
    Electron microscope and method of adjusting monochromator 有权
    电子显微镜和调光单色仪的方法

    公开(公告)号：US09362082B2

    公开(公告)日：2016-06-07

    申请号：US14823141

    申请日：2015-08-11

    Applicant: JEOL Ltd.

    Inventor： Masaki Mukai

    IPC: H01J47/00 ,  H01J37/05 ,  H01J37/21

    CPC classification number: H01J37/05 ,  H01J37/21 ,  H01J37/26 ,  H01J2237/057 ,  H01J2237/24535

    Abstract: An electron microscope is offered which can facilitate adjusting a monochromator. The electron microscope (100) includes the monochromator (20) having an energy filter (22) for dispersing the beam (EB) according to energy and a slit plate (24) disposed on an energy dispersive plane. The slit plate (24) is provided with plural energy-selecting slits (25) which are different in width taken in a direction where the beam (EB) is dispersed. The microscope (100) further includes a lens system (30) on which the beam impinges after being monochromatized by the monochromator (20), a first measuring section (50) for measuring the intensity of the beam (EB) emitted from an electron beam source (10), a second measuring section (60) for measuring the intensity of the beam (EB) that has passed through an active one (25-L) of the energy-selecting slits (25), and a slit identifying portion (72) for identifying the active energy-selecting slit (25-L) from the plural energy-selecting slits (25) on the basis of the results of measurements made by the first and second measuring sections (50, 60).

    Abstract translation: 提供了一种可以方便调整单色仪的电子显微镜。 电子显微镜（100）包括具有用于根据能量分散光束（EB）的能量过滤器（22）和设置在能量分散平面上的狭缝板（24）的单色仪（20）。 狭缝板（24）设置有多个能量选择狭缝（25），其沿着分散光束（EB）的方向而具有不同的宽度。 所述显微镜（100）还包括透镜系统（30），所述透镜系统（30）在由所述单色仪（20）单色化之后入射到所述透镜系统（30）上;第一测量部分（50），用于测量从电子束 源极（10），用于测量已经穿过能量选择狭缝（25）的有源（25-L）的光束（EB）的强度的第二测量部分（60）和狭缝识别部分 72），用于基于由第一和第二测量部（50,60）进行的测量结果，从多个能量选择缝（25）识别活动能量选择缝（25-L）。

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