公开(公告)号：US20170074803A1

公开(公告)日：2017-03-16

申请号：US15122686

申请日：2015-04-21

Applicant: ADVANTEST CORPORATION

Inventor： Fumikazu TAKAYANAGI ,  Akiyoshi IRISAWA

IPC: G01N21/88 ,  G01N21/59

CPC classification number: G01N21/8806 ,  G01N21/3581 ,  G01N21/55 ,  G01N21/59 ,  G01N21/8422 ,  G01N2201/0696 ,  G01N2201/12

Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device and an electromagnetic wave detector. The electromagnetic wave output device outputs and electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a sample acquired by adhering a plurality of specimens to each other by an adhesive. The electromagnetic wave detector detects a transmitted electromagnetic wave, which is the electromagnetic wave having transmitted through the sample. The electromagnetic wave having transmitted through the sample. The electromagnetic wave measurement device determines wherein whether a joint by the adhesive is excellent or not based on the detected transmitted electromagnetic wave.

Abstract translation: 根据本发明，电磁波测量装置包括电磁波输出装置和电磁波检测器。 电磁波输出装置对通过粘合剂使多个试样彼此粘合而获得的样品，输出频率等于或大于0.01 [THz]且等于或小于100 [THz]的频率的电磁波。 电磁波检测器检测发射的电磁波，其是通过样品的电磁波。 透过样品的电磁波。 电磁波测量装置根据检测到的发送的电磁波来确定粘合剂的接合是否良好。

公开(公告)号：US20170072834A1

公开(公告)日：2017-03-16

申请号：US15123214

申请日：2014-03-03

Applicant: G. LUFFT MESS- UND REGELTECHNIK GMBH

Inventor： Axel Schmitz-Hübsch

IPC: B60Q1/00 ,  G01B11/06 ,  G01N21/47 ,  B60Q1/04 ,  F21S8/10

CPC classification number: B60Q1/0023 ,  B60Q1/04 ,  B60W40/068 ,  B60W2420/40 ,  B60W2422/00 ,  F21S41/28 ,  F21S41/30 ,  G01B11/0633 ,  G01N21/3151 ,  G01N21/3554 ,  G01N21/359 ,  G01N21/4738 ,  G01N2021/3181 ,  G01N2021/4709 ,  G01N2201/0216 ,  G01N2201/0627 ,  G01N2201/0696 ,  G08G1/0112 ,  G08G1/0133 ,  G08G1/0141 ,  G08G1/096716 ,  G08G1/096758 ,  G08G1/096775 ,  G08G1/096791

Abstract: A vehicle headlight comprising: a lighting unit, a reflector and a headlight glass; a device for determining road conditions, said device being provided in the interior of the vehicle headlight behind the headlight glass and comprising: an infrared transmitter configured for emitting light at predetermined wavelengths through the headlight glass onto a road surface; a detection unit configured for detecting the light emitted by the infrared transmitter and reflected by the road surface through the headlight glass; a processing unit configured for determining surface parameters of the road surface on the basis of the light detected by the detection unit.

Abstract translation: 一种车头灯，包括：照明单元，反射器和头灯玻璃; 一种用于确定道路状况的装置，所述装置设置在前灯玻璃后面的车辆前灯的内部，并且包括：红外发射器，被配置为将预定波长的光通过头灯玻璃发射到路面上; 检测单元，被配置为检测由所述红外线发射器发射并通过所述头灯玻璃被所述路面反射的光; 基于由检测单元检测到的光来确定路面的表面参数的处理单元。

公开(公告)号：US20160370291A1

公开(公告)日：2016-12-22

申请号：US15255245

申请日：2016-09-02

Applicant: Quantum-Si Incorporated

Inventor： Jonathan M. Rothberg ,  Ali Kabiri ,  Jason W. Sickler ,  Brett J. Gyarfas ,  Jeremy Lackey ,  Gerard Schmid ,  Lawrence C. West ,  Keith G. Fife ,  Benjamin Cipriany ,  Farshid Ghasemi

IPC: G01N21/64 ,  C12Q1/68

CPC classification number: G01N21/6408 ,  C12Q1/6869 ,  C12Q1/6874 ,  G01N21/6428 ,  G01N21/6454 ,  G01N21/648 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6439 ,  G01N2021/6463 ,  G01N2201/0696 ,  G01N2201/08 ,  G01N2201/12

Abstract: System and methods for analyzing single molecules and performing nucleic acid sequencing. An integrated device includes multiple pixels with sample wells configured to receive a sample, which when excited, emits radiation. The integrated device includes at least one waveguide configured to propagate excitation energy to the sample wells from a region of the integrated device configured to couple with an excitation energy source. A pixel may also include at least one element for directing the emission energy towards a sensor within the pixel. The system also includes an instrument that interfaces with the integrated device. The instrument may include an excitation energy source for providing excitation energy to the integrated device by coupling to an excitation energy coupling region of the integrated device. One of multiple markers distinguishable by temporal parameters of the emission energy may label the sample and configuration of the sensor within a pixel may allow for detection of a temporal parameter associated with the marker labeling the sample.

公开(公告)号：US09464992B2

公开(公告)日：2016-10-11

申请号：US15093130

申请日：2016-04-07

Applicant: Rudolph Technologies, Inc.

Inventor： Jeffrey L. O'Dell ,  Thomas Verburgt ,  Mark Harless ,  Cory Watkins

IPC: G06K9/00 ,  G01N21/95 ,  G01N21/88 ,  G06T7/00 ,  H04N5/225

CPC classification number: G01N21/9501 ,  G01N21/8803 ,  G01N21/8806 ,  G01N2021/8838 ,  G01N2201/06113 ,  G01N2201/0696 ,  G01N2201/0697 ,  G01N2201/12 ,  G06T7/0004 ,  G06T2207/30148 ,  H01L21/67242 ,  H01L21/67271 ,  H01L21/67288 ,  H01L22/12 ,  H01L2924/0002 ,  H04N5/2256 ,  H01L2924/00

Abstract: An automated defect inspection system has been invented and is used on patterned wafers, whole wafers, broken wafers, partial wafers, sawn wafers such as on film frames, JEDEC trays, Auer boats, die in gel or waffle packs, MCMs, etc., and is specifically intended and designed for second optical wafer inspection for such defects as metalization defects (such as scratches, voids, corrosion, and bridging), diffusion defects, passivation layer defects, scribing defects, glassivation defects, chips and cracks from sawing, solder bump defects, and bond pad area defects.

Abstract translation: 已经发明了一种自动化缺陷检查系统，并且用于图案化晶片，整个晶片，破碎的晶片，部分晶片，锯状晶片，例如胶片框架，JEDEC托盘，Auer船，凝胶或华夫饼包，MCM等中， 并且专门用于第二光学晶片检查，例如金属化缺陷（例如划痕，空隙，腐蚀和桥接），扩散缺陷，钝化层缺陷，划线缺陷，玻璃化缺陷，切屑和锯切裂纹等缺陷 凸起缺陷和焊盘区域缺陷。

公开(公告)号：US09389174B2

公开(公告)日：2016-07-12

申请号：US14308296

申请日：2014-06-18

Applicant: WEATHERFORD/LAMB, INC.

Inventor： Domino Taverner ,  John J. Grunbeck ,  Jason Scott Kiddy

IPC: G01N21/47 ,  G01M11/00 ,  G01M11/02 ,  E21B47/00 ,  G01D5/353

CPC classification number: G01N21/4788 ,  E21B47/0002 ,  G01D5/35383 ,  G01D5/3539 ,  G01M11/02 ,  G01M11/33 ,  G01N2201/061 ,  G01N2201/0696 ,  G01N2201/08

Abstract: Methods and apparatus for interrogating sets of optical elements having characteristic wavelengths spanning a sweep range while avoiding overlapping reflections from the different sets when performing a wavelength sweep are provided. One example method generally includes introducing a pulse of light, by an optical source, into an optical waveguide to interrogate at least first and second sets of optical elements, wherein the optical elements within each set have different characteristic wavelengths and wherein the first and second sets are separated in time such that a first time window over which light is reflected from the optical elements in the first set and reaches a receiver does not overlap with a second time window over which light is reflected from the optical elements in the second set and reaches the receiver; and processing the reflected light to determine one or more parameters corresponding to the optical elements.

Abstract translation: 提供了用于询问具有跨越扫描范围的特征波长的光学元件组的方法和装置，同时避免当执行波长扫描时来自不同组的重叠反射。 一个示例性方法通常包括通过光源将光脉冲引入到光波导中以询问至少第一组和第二组光学元件，其中每组中的光学元件具有不同的特征波长，并且其中第一和第二组 在时间上分离，使得光从第一组中的光学元件反射并到达接收器的第一时间窗口不与第二时间窗口重叠，在第二时间窗口中光从第二组中的光学元件反射，并且到达第二时间窗口 收件人; 以及处理所述反射光以确定与所述光学元件对应的一个或多个参数。

公开(公告)号：US20160178573A1

公开(公告)日：2016-06-23

申请号：US14978292

申请日：2015-12-22

Applicant: Magellan Diagnostics, Inc.

Inventor： Norman F. Sheppard, JR. ,  Gary Conrad Jensen

IPC: G01N27/416 ,  G01N27/30 ,  G01N21/31 ,  G01N33/49 ,  G01N21/55

CPC classification number: G01N21/31 ,  G01N21/474 ,  G01N33/49 ,  G01N2201/062 ,  G01N2201/0625 ,  G01N2201/0696

Abstract: A sensor and analyzer for measuring an analyte in a liquid sample are disclosed. The sensor includes a substrate with a reservoir disposed therein. The reservoir may include a top surface and a bottom surface, at least one transparent portion forming at least a part of the bottom surface of the reservoir, and a reflector disposed on the upper surface of the reservoir at a location opposite the at least one transparent portion. The analyzer may include a support surface, an aperture extending through the support surface, a light source disposed below the support surface and oriented so that at least a portion of the light emitted from the light source passes through the aperture, and a detector configured to measure an intensity of light received at the detector.

Abstract translation: 公开了一种用于测量液体样品中分析物的传感器和分析仪。 传感器包括其中设置有储存器的基板。 储存器可以包括顶表面和底表面，形成储存器的底表面的至少一部分的至少一个透明部分，以及设置在储存器的上表面上的反射器，该反射器位于与至少一个透明 一部分。 分析器可以包括支撑表面，延伸穿过支撑表面的孔，设置在支撑表面下方并且被定向成使得从光源发射的光的至少一部分穿过孔的光源，以及检测器，被配置为 测量在检测器处接收的光强度。

公开(公告)号：US20160153905A1

公开(公告)日：2016-06-02

申请号：US14955101

申请日：2015-12-01

Applicant: Siemens Schweiz AG

Inventor： Martin Allemann ,  Brigitt Schmid ,  Stefan Walker

IPC: G01N21/53

CPC classification number: G01N21/53 ,  G01N2201/0621 ,  G01N2201/0696 ,  G08B17/107 ,  G08B17/113

Abstract: A scattered-light smoke detector includes a detector unit that operates according to the scattered-light principle. The detector unit includes a light-emitting diode (LED) to irradiate particles to be detected and a spectrally sensitive photosensor to detect the light scattered by the particles. The LED and photosensor are aligned such that a principal optical axis of the LED and a principal optical axis of the photosensor define a scattered-light angle. The LED includes a first and a second LED chip for emitting first and second light beams with light in a first wavelength range and a different second wavelength range, and an LED chip carrier arranged orthogonally to the principal optical axis. The two LED chips are arranged side-by-side on the LED chip carrier. The LED is rotated such that a chip axis extending through the two LED chips is orthogonal to an angle plane defined by the two optical axes.

Abstract translation: 散射烟雾探测器包括根据散射光原理操作的检测器单元。 检测器单元包括用于照射要检测的颗粒的发光二极管（LED）和用于检测由颗粒散射的光的光谱敏感光电传感器。 LED和光电传感器对准，使得LED的主光轴和光电传感器的主光轴定义散射光角度。 LED包括第一和第二LED芯片，用于发射具有第一波长范围和不同第二波长范围的光的第一和第二光束以及与主光轴垂直布置的LED芯片载体。 两个LED芯片并排布置在LED芯片载体上。 LED被旋转使得延伸穿过两个LED芯片的芯片轴线正交于由两个光轴限定的角度平面。

公开(公告)号：US20160069807A1

公开(公告)日：2016-03-10

申请号：US14482614

申请日：2014-09-10

Applicant: IWASAKI ELECTRIC CO., LTD. ,  KOCHI UNIVERSITY

Inventor： Mitsuyuki HATANAKA ,  Takashi SATO ,  Nozomu KAJIWARA ,  Takaaki KOMIYA ,  Takayuki SATO

IPC: G01N21/64

CPC classification number: G01N21/6456 ,  A61B5/0071 ,  A61B5/0077 ,  G01N21/359 ,  G01N21/6408 ,  G01N21/6486 ,  G01N2021/646 ,  G01N2201/061 ,  G01N2201/0621 ,  G01N2201/0696

Abstract: An imaging system includes: a first lighting device for irradiating an imaging target object with visible light; a second lighting device for irradiating the imaging target object with near-infrared light; and an image sensor for photodetecting visible light caused by the visible light and coming from the imaging target object and fluorescence caused by the near-infrared light and coming from the imaging target object during a predetermined shutter open period every frame of a predetermined period. The image sensor outputs photodetection signals corresponding to photodetection amounts of the visible light and the fluorescence. The imaging system also includes a controller that generates a composite image of a visible image and a fluorescence image based on the photodetection signals, and has a lighting controller that turns on the second lighting device with optical power corresponding to the shutter open period in synchronism with the shutter open period.

Abstract translation: 一种成像系统包括：用于用可见光照射成像目标物体的第一照明装置; 用于用近红外光照射成像目标物体的第二照明装置; 以及图像传感器，用于在预定的快门打开期间，在预定周期的每帧期间，对可见光引起的来自成像目标物体的可见光和由近红外光产生的荧光和来自成像目标物体的光的受光。 图像传感器输出与可见光和荧光的光检测量对应的光电检测信号。 成像系统还包括基于光电检测信号产生可见图像和荧光图像的合成图像的控制器，并且具有照明控制器，其以与快门打开时段相对应的光功率同步地接通第二照明装置 快门打开时间。

公开(公告)号：US09274056B2

公开(公告)日：2016-03-01

申请号：US12315413

申请日：2008-12-03

Applicant: Robert Hudak ,  Ian Buchanan

Inventor： Robert Hudak ,  Ian Buchanan

IPC: G01N33/558 ,  G01N21/64 ,  G01N21/84 ,  G01N33/58

CPC classification number: G01N21/6428 ,  G01N21/645 ,  G01N21/8483 ,  G01N33/558 ,  G01N33/582 ,  G01N2201/062 ,  G01N2201/0693 ,  G01N2201/0696

Abstract: The present invention includes an assay method for detecting an analyte in a sample. The assay includes a solid surface such as a nitrocellulose membrane. It also includes providing a sample is applied to the solid surface and detecting the presence or absence of the analyte using a fluorescent label from a lanthanide label. The invention also includes a device for detecting the fluorescence in or on an assay test strip. The device includes a housing, a solid surface and an ultraviolet radiation emitting LED.

Abstract translation: 本发明包括用于检测样品中的分析物的测定方法。 该测定包括固体表面，例如硝酸纤维素膜。 它还包括提供将样品应用于固体表面并使用来自镧系元素标签的荧光标记来检测分析物的存在或不存在。 本发明还包括用于检测测定条带中或上的荧光的装置。 该装置包括壳体，固体表面和紫外线发射LED。

公开(公告)号：US20150300944A1

公开(公告)日：2015-10-22

申请号：US14441484

申请日：2012-12-28

Applicant: HALLIBURTON ENERGY SERVICES INC.

Inventor： Michael Pelletier ,  William Soltmann ,  David Perkins ,  Christopher M. Jones

IPC: G01N21/25 ,  H05B37/02 ,  G01N21/31 ,  G01V8/10 ,  H03K7/08 ,  G01N21/47

CPC classification number: G01N21/255 ,  E21B47/102 ,  E21B49/08 ,  G01J3/0205 ,  G01J3/027 ,  G01J3/10 ,  G01J3/108 ,  G01J3/427 ,  G01J3/433 ,  G01J5/522 ,  G01N21/31 ,  G01N21/47 ,  G01N2201/061 ,  G01N2201/06186 ,  G01N2201/0696 ,  G01N2201/12 ,  G01V8/10 ,  H03K7/08 ,  H05B37/0209

Abstract: A light source and a method for its use in an optical sensor are provided, the light source including a resistively heated element. The light source includes a power circuit configured to provide a pulse width modulated voltage to the resistively heated element, the pulse width modulated voltage including: a duty cycle with a first voltage; and a pulse period including a period with a second voltage, wherein: the duty cycle, the first voltage, and the pulse period are selected so that the resistively heated element is heated to a first temperature; and the first temperature is selected to emit black body radiation in a continuum spectral range. Also provided is an optical sensor for determining a chemical composition including a light source as above.

Abstract translation: 提供了一种用于光学传感器的光源及其方法，该光源包括电阻加热元件。 光源包括被配置为向电阻加热元件提供脉宽调制电压的电源电路，所述脉宽调制电压包括：具有第一电压的占空比; 以及包括具有第二电压的周期的脉冲周期，其中：选择占空比，第一电压和脉冲周期，使得电阻加热元件被加热到第一温度; 并且选择第一温度以在连续光谱范围内发射黑体辐射。 还提供了一种用于确定包括如上所述的光源的化学成分的光学传感器。