公开(公告)号：US20170033777A1

公开(公告)日：2017-02-02

申请号：US15001430

申请日：2016-01-20

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Ho KIM ,  Junseok KIM ,  Yunjae SUH ,  Eric Hyunsurk RYU

IPC: H03K5/08 ,  G01J1/42 ,  G01J1/44 ,  H03K5/24

CPC classification number: H03K5/082 ,  G01J1/4204 ,  G01J1/44 ,  G01J1/46 ,  G01J2001/444 ,  H03K5/24

Abstract: A method and an apparatus for controlling a threshold voltage are provided. The method includes receiving noise event signals from a sensing core, the sensing core sensing a portion of a moving object, and generating an event signal. The method further includes determining a type of the noise event signals, determining a number of the noise event signals based on the type of the noise event signals, determining whether the number of the noise event signals satisfies a condition, and controlling a threshold voltage value corresponding to the noise event signals in response to the determining that the number of the noise event signals does not satisfy the condition.

Abstract translation: 提供了一种用于控制阈值电压的方法和装置。 该方法包括从感测核心接收噪声事件信号，感测核心感测移动物体的一部分，以及生成事件信号。 该方法还包括确定噪声事件信号的类型，基于噪声事件信号的类型确定噪声事件信号的数量，确定噪声事件信号的数量是否满足条件，以及控制阈值电压值 响应于确定噪声事件信号的数量不满足条件，对应于噪声事件信号。

公开(公告)号：US20170011274A1

公开(公告)日：2017-01-12

申请号：US13714812

申请日：2012-12-14

Applicant: RAYTHEON COMPANY

Inventor： Andrew Kowalevicz

IPC: G06K9/20 ,  G01J1/44 ,  G06K9/34 ,  G02B27/10 ,  G02B5/12

CPC classification number: G06K9/2036 ,  G01J1/44 ,  G01J2001/444 ,  G02B5/12 ,  G02B26/0841 ,  G02B27/1066 ,  G02B27/108 ,  G06K9/34 ,  H01L27/14643

Abstract: In one example a method of deceiving an optical augmentation device includes receiving an interrogation beam at an optical system from the optical augmentation device, encoding the interrogation beam with a false signature mis-identifying the optical system, and retro-reflecting the encoded interrogation beam to the optical augmentation device, without retro-reflecting the original interrogation beam.

Abstract translation: 在一个示例中，欺骗光学增强设备的方法包括：从光学增强设备在光学系统处接收询问光束，用询问错误识别光学系统的错误识别编码询问光束，并将编码的询问光束反向 光学增强装置，而不反光原来的询问光束。

公开(公告)号：US20170010151A1

公开(公告)日：2017-01-12

申请号：US14796628

申请日：2015-07-10

Applicant: DATACOLOR HOLDING AG

Inventor： Zhiling Xu ,  Michael H. Brill

IPC: G01J1/44 ,  G01J3/46

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J2001/444

Abstract: In accordance with a broad aspect of the present invention, a system and method are provided for monitoring and compensating thermal drift of the electronic elements in the sensor of a color measurement device, such as a spectrophotometer. Such a system and method involves, obtaining with a color sensor a plurality of measurements of a black trap with and without illumination across a range of temperatures and using those values to generate a correlation function that allows for the compensation of thermal drift in sample measurements.

Abstract translation: 根据本发明的广泛方面，提供了一种用于监测和补偿诸如分光光度计的颜色测量装置的传感器中的电子元件的热漂移的系统和方法。 这样的系统和方法涉及在彩色传感器中获得具有和不具有在一定温度范围内的照明的黑色陷阱的多个测量，并且使用这些值来产生允许补偿样本测量中的热漂移的相关函数。

公开(公告)号：US20160299002A1

公开(公告)日：2016-10-13

申请号：US15036538

申请日：2014-11-07

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Roger STEADMAN BOOKER ,  Christoph HERRMANN

IPC: G01J1/44

CPC classification number: G01J1/44 ,  G01J2001/444 ,  G01T1/17

Abstract: The present invention relates to a detection device (6) for detecting photons emitted by a radiation source (2) and capable of adjusting ballistic deficit. The detection device (6) comprises a pre-amplifying unit (11) (such as, e.g., a charge-sensitive amplifier), a shaping unit (60) comprising a feedback discharge unit (13, I) (such as, e.g., a feedback resistor or a feedback current source), and a feedback discharge control unit (50) coupled to the feedback discharge unit (13, I). The feedback discharge control unit (50) is adapted to, e.g., adjust a resistance of a feedback resistor (and/or to adjust the current value of the feedback current source) if an electrical pulse generated by the shaping unit (60) does not exceed at least one energy comparison value (X1, X2, . . . , XN). The feedback discharge control unit (50) is adapted to not adjust the parameter of the feedback discharge unit (13, I) if the electrical pulse exceeds the at least one energy comparison value (X1, X2, . . . , XN). By tuning the feedback resistor operating point (or the feedback current source operating point), the ballistic deficit can be adjusted to a predefined expected value.

Abstract translation: 本发明涉及一种用于检测由辐射源（2）发射并能够调节弹道缺陷的光子的检测装置（6）。 检测装置（6）包括预放大单元（11）（例如，电荷敏感放大器），整形单元（60），包括反馈放电单元（13，I）（例如， 反馈电阻器或反馈电流源）以及耦合到反馈放电单元（13，I）的反馈放电控制单元（50）。 如果由成形单元（60）产生的电脉冲不是，反馈放电控制单元（50）适于例如调整反馈电阻器的电阻（和/或调整反馈电流源的电流值） 超过至少一个能量比较值（X1，X2，...，XN）。 如果电脉冲超过至少一个能量比较值（X1，X2，...，XN），则反馈放电控制单元（50）适于不调整反馈放电单元（13I）的参数。 通过调整反馈电阻工作点（或反馈电流源工作点），可以将弹道缺陷调整到预定的预期值。

公开(公告)号：US09459140B2

公开(公告)日：2016-10-04

申请号：US14195862

申请日：2014-03-04

Applicant: PixArt Imaging Inc.

Inventor： Han-Ping Cheng ,  Chia-Cheun Liang ,  Ming-Tsan Kao

IPC: G01J1/10 ,  H04N1/00 ,  G01J1/44 ,  G01J1/42

CPC classification number: G01J1/10 ,  G01J1/4228 ,  G01J2001/4242 ,  G01J2001/444 ,  H04N1/00

Abstract: A method of an optical detecting device for synchronizing an exposure timing sequence of an image detector with a light emitting timing sequence of a reference light source is disclosed. The method includes capturing a continued image set according to a predetermined period, analyzing intensity variation of the continued image set, and adjusting the exposure timing sequence of an image detector according to the intensity variation, so as to synchronize the exposure timing sequence of the image detector with the light emitting timing sequence of the reference light source.

Abstract translation: 公开了一种用于使图像检测器的曝光定时序列与参考光源的发光定时序列同步的光学检测装置的方法。 该方法包括根据预定时段捕获连续图像集，分析连续图像集合的强度变化，以及根据强度变化调整图像检测器的曝光定时序列，以使图像的曝光定时序列同步 检测器具有参考光源的发光定时序列。

公开(公告)号：US20160273959A1

公开(公告)日：2016-09-22

申请号：US15070400

申请日：2016-03-15

Applicant: Suzhou Innolight Technology Corporation

Inventor： Xiangzhong Wang

IPC: G01J1/02 ,  G01J1/44

CPC classification number: H04B10/6911 ,  G01J2001/444 ,  G01J2001/4466 ,  H01L31/02027

Abstract: An avalanche photodiode (APD) bias control method may include acquiring a photocurrent intensity voltage and generating a control signal by superposing the acquired photocurrent intensity voltage and a bias setting signal, wherein the control signal controls a voltage drop between an adjustable power supply output voltage and a voltage of the APD. The APB bias control method may further include adjusting the adjustable power supply output voltage and the bias setting signal simultaneously so that the voltage drop is within a target voltage drop range and the APD bias voltage approaches a bias voltage that corresponds to an APD optical input power. An avalanche photodiode (APD) bias controller and an avalanche photodiode (APD) photoelectric receiver are also provided.

Abstract translation: 雪崩光电二极管（APD）偏置控制方法可以包括获取光电流强度电压并通过叠加获取的光电流强度电压和偏置设置信号来产生控制信号，其中控制信号控制可调电源输出电压和 APD的电压。 APB偏置控制方法还可以包括同时调节可调电源输出电压和偏置设置信号，使得电压降在目标压降范围内，并且APD偏置电压接近对应于APD光输入功率的偏置电压 。 还提供了雪崩光电二极管（APD）偏置控制器和雪崩光电二极管（APD）光电接收器。

公开(公告)号：US20160265967A1

公开(公告)日：2016-09-15

申请号：US14406255

申请日：2014-10-17

Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Jian HE ,  Shen-Sian SYU ,  Yugang BAO

IPC: G01J1/44

CPC classification number: G01J1/44 ,  G01J2001/444 ,  G01M11/02

Abstract: An adjustment circuit for measuring an optical parameter is disclosed. The adjustment circuit includes an optical sensing module for detecting an optical signal and converting the detected optical signal into a voltage signal; an amplification module for amplifying the voltage signal; an A/D conversion module for converting the amplified voltage signal into a digital signal; a control module for analyzing the digital signal for generating an analyzed result; a signal generating module for outputting a frequency square wave signal according to the analyzed result; and an adjustment module for adjusting an amplification factor of the amplification module according to the frequency square wave signal. The circuit of the present disclosure is easy, and an automatic measurement can be implemented.

Abstract translation: 公开了一种用于测量光学参数的调整电路。 该调整电路包括光检测模块，用于检测光信号并将检测到的光信号转换为电压信号; 用于放大电压信号的放大模块; 用于将放大的电压信号转换为数字信号的A / D转换模块; 用于分析数字信号以产生分析结果的控制模块; 信号生成模块，用于根据分析结果输出频率方波信号; 以及调整模块，用于根据频率方波信号调整放大模块的放大系数。 本公开的电路容易，并且可以实现自动测量。

公开(公告)号：US09439260B2

公开(公告)日：2016-09-06

申请号：US14434777

申请日：2013-09-12

Applicant: KONINKLIJKE PHILIPS N.V.

Inventor： Ashish Vijay Pandharipande ,  David Ricardo Caicedo Fernandez ,  Michiel Adriannszoon Klompenhouwer

IPC: H05B37/02 ,  H05B33/08 ,  G01J1/44

CPC classification number: H05B33/0848 ,  G01J1/44 ,  G01J2001/444 ,  H05B37/0218 ,  H05B37/0227 ,  Y02B20/46

Abstract: A method of calibrating an output of a light sensor for use in controlling a lighting system comprising at least one lighting device. The method comprises placing the lighting system into each of a plurality of discrete modes, each mode being configured to output a different respective configuration of light, wherein in operation each mode will automatically vary an output illumination level of the respective configuration based on the output of the light sensor in response to a changing light level in an environment being illuminated. The method further comprises performing a plurality of calibrations by determining a respective calibration setting for calibrating the output of the light sensor in each of the modes, and setting each mode to vary the output illumination level based on the output of the light sensor as calibrated by the respective calibration setting.

Abstract translation: 一种校准用于控制包括至少一个照明装置的照明系统的光传感器的输出的方法。 该方法包括将照明系统放置成多个离散模式中的每一个，每个模式被配置为输出不同的相应配置的光，其中在操作中，每个模式将基于输出的各自的配置自动地改变各个配置的输出照明水平 所述光传感器响应于被照亮的环境中的变化的光水平。 该方法还包括通过确定用于在每个模式中校准光传感器的输出的相应校准设置来执行多个校准，并且设置每个模式以基于光传感器的输出来改变输出照明水平，如由 相应的校准设置。

公开(公告)号：US20160202118A1

公开(公告)日：2016-07-14

申请号：US15075369

申请日：2016-03-21

Applicant: Carl Zeiss SMT GmbH

Inventor： Albrecht EHRMANN ,  Markus GOEPPERT ,  Helmut HAIDNER

IPC: G01J1/44 ,  G01J3/18 ,  G01J1/04 ,  G01J1/42

CPC classification number: G01J1/44 ,  G01J1/0407 ,  G01J1/4228 ,  G01J3/18 ,  G01J2001/444 ,  G01M11/0271 ,  G03F7/70133 ,  G03F7/70591 ,  G03F7/706 ,  G03F7/7085

Abstract: An apparatus (10) determining an optical property of an imaging system (12) includes an illumination system (20) directing electromagnetic radiation (18) onto an object plane (22) of the imaging system, a utilization detector (42) determining the optical property, an output coupling device (46), and an intensity sensor (50). The detector captures the radiation after it has traveled along a utilized beam path (45) extending to the utilization detector. The output coupling device couples sensor radiation (48) out of the utilized beam path and into a sensor beam path (49) that differs from the utilized beam path. The intensity sensor records an angularly resolved intensity distribution present at least at one point in the object plane of the optical imaging system, which intensity distribution reproduces the intensity of the electromagnetic radiation in dependence on the angle of incidence with respect to the object plane.

Abstract translation: 确定成像系统（12）的光学特性的装置（10）包括将电磁辐射（18）引导到成像系统的物平面（22）上的照明系统（20），确定光学 属性，输出耦合装置（46）和强度传感器（50）。 检测器在沿着延伸到利用检测器的利用的光束路径（45）行进之后捕获辐射。 输出耦合装置将所使用的光束路径中的传感器辐射（48）耦合到与所使用的光束路径不同的传感器光束路径（49）中。 强度传感器记录至少在光学成像系统的物平面中的一个点存在的角度分辨的强度分布，该强度分布根据相对于物体平面的入射角再现电磁辐射的强度。

公开(公告)号：US09385667B2

公开(公告)日：2016-07-05

申请号：US13917955

申请日：2013-06-14

Applicant: Avago Technologies General IP (Singapore) Pte. Ltd.

Inventor： Thomas Lichtenegger ,  Martin Weigert ,  Robert Swoboda

IPC: H03F3/08 ,  G01J1/44 ,  G01J1/42

CPC classification number: H03F3/08 ,  G01J1/4228 ,  G01J2001/444

Abstract: A photodetector integrated circuit (IC) having an electromagnetic interference (EMI) sensor integrated therein is provided for sensing EMI at the photodetector. Integrating the EMI sensor into the photodetector IC ensures that the EMI sensor is in proximity to the photodetector so that any EMI that is sensed is actually EMI to which the photodetector is exposed. The sensed EMI may then be used for a number of reasons, such as to determine the root cause of damage to circuitry of the system, to determine the point in time at which an EMI event occurred, or to trigger a warning when a determination is made that an EMI limit has been reached.

Abstract translation: 提供集成有电磁干扰（EMI）传感器的光电检测器集成电路（IC），用于在光电检测器处感测EMI。 将EMI传感器集成到光电检测器IC中确保EMI传感器位于光电检测器附近，使得感测到的任何EMI实际上都是光电探测器暴露于的EMI。 然后可以使用感测到的EMI，例如确定系统电路的损坏的根本原因，以确定发生EMI事件的时间点，或者当确定是否发生时触发警告 使得EMI达到了极限。