Abstract:
A spectrograph including light beam reformatting element(s), beam expander(s), dispersive element(s) and light receiving element(s). The light beam reformatting element(s) reformat a received light beam into a reformatted light beam having a first dimension along a first axis that is larger than a dimension of the received light beam along the first axis and a second dimension along a second axis substantially orthogonal to the first axis that is smaller than a dimension of the received light beam along the second axis. The beam expander(s) anamorphically expand the reformatted light beam along the second axis into an expanded light beam. The dispersive element(s) disperse the expanded light beam along the second axis, resulting in a dispersed light beam. The light receiving element(s) receive the dispersed light beam. The light receiving element(s) may include one or more detectors to measure spectral intensity of the dispersed light beam.
Abstract:
A hyperspectral imaging system and method are described herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest). The hyperspectral imaging system includes at least one optic, a scannable slit mechanism, a spectrometer, a two-dimensional image sensor, and a controller. The scannable slit mechanism can be a micro-electromechanical system spatial light modulator (MEMS SLM), a diffractive Micro-Opto-Electro-Mechanical Systems (MOEMS) spatial light modulator (SLM), a digital light processing (DLP) system, a liquid crystal display, a rotating drum with at least one slit formed therein, or a rotating disk with at least one slit formed therein.
Abstract:
Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system is employed which includes a transmissive VPH diffraction grating that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating about an axial line that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating; a light detection portion that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating; and a correcting portion that corrects an incident position on the light detection portion in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating in synchronization with the rotating mechanism.
Abstract:
The compact microspectrometer for fluid media has, in a fixed spatial coordination in a housing, a light source, a fluid channel, a reflective diffraction grating, and a detector. The optical measuring path starting from the light source passes through the fluid channel and impinges on the diffraction grating. The spectral light components reflected by the diffraction grating impinge on the detector.
Abstract:
The present invention provides methods and apparatuses for accurate noninvasive determination of tissue properties. Some embodiments of the present invention comprise an optical sampler having an illumination subsystem, adapted to communicate light having a first polarization to a tissue surface; a collection subsystem, adapted to collect light having a second polarization communicated from the tissue after interaction with the tissue; wherein the first polarization is different from the second polarization. The difference in the polarizations can discourage collection of light specularly reflected from the tissue surface, and can encourage preferential collection of light that has interacted with a desired depth of penetration or path length distribution in the tissue. The different polarizations can, as examples, be linear polarizations with an angle between, or elliptical polarizations of different handedness.
Abstract:
A compact spectrometer apparatus for characterizing a microscope illumination source in real time, and without interfering with the observation and/or characterization of a sample under observation with the microscope. The spectrometer apparatus is comprised of a light probe comprising a mirror disposed in a housing, the mirror positioned to reflect light from the illumination source into an optical coupling; an optical waveguide receiving reflected light into the optical coupling; and a spectrometer comprising a light sensor receiving reflected light directed by the optical waveguide from the optical coupling of the light probe, the sensor adapted to sense light over a range of wavelengths and output a signal indicative of the intensity of the light at any wavelength over the range.
Abstract:
Featured is a spectral analysis method and a wide spectral range spectrometer including a source of electromagnetic radiation and an optical subsystem configured to disperse radiation into a plurality of wavelengths. A pixilated light modulator receives the radiation wavelengths and is configured to direct one or more selective wavelengths to a sample.
Abstract:
Disclosed is an interferometer comprising a light source, a reflective element, and a photodetector. The light source is configured to emit a light beam, and an angle is formed by inclusion between a direction to which the light beam travels and the reflective element, the photodetector is configured to be substantially perpendicular to the reflective element. The light beam is halved into a first light beam propagating by the included angle, and a second light beam reflected off the reflective element, the first light beam and the second light beam interfere each other to form an interferogram on the photodetector, which detects the interferogram. By benefit of above, the interferometer does not need to reposition its parts in order to make adjustment to interferogram, thereby simplifying optical element setup and minimizing physical volume of the interferomger. Also disclosed is a spectrometer including the same interferometer and a Fourier-transform-capable analyzer.
Abstract:
Raman signal amplification apparatus comprises an ellipsoidal reflector providing a first real focus f1, and second real or virtual focus f2, both foci being situated within a sample volume. When an input laser excitation beam having an initial numerical aperture (NA) is focused onto one of the foci, the beam is reflected by the reflector and refocused onto alternating foci, such that the NA of the reflected optical path progressively increases for higher efficiency collection of Raman emissions from the multiple foci. The ellipsoidal reflector may be a half section providing a single real focus f1, with a flat reflector producing a mirror image of the ellipsoidal reflector, such that f2 is a virtual focus occupying the same point as f1. Alternatively, the ellipsoidal reflector may have a first half section with a first real focus f1 and a second half section with a second real focus f2.
Abstract:
A Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.