公开(公告)号：US20100008079A1

公开(公告)日：2010-01-14

申请号：US12503304

申请日：2009-07-15

Applicant: JACK BRASS ,  Richard J. Doran ,  Donald L. Klipstein ,  Thomas M. Lemons ,  Bjarki Hallgrimson ,  Sarah Dobbin

Inventor： JACK BRASS ,  Richard J. Doran ,  Donald L. Klipstein ,  Thomas M. Lemons ,  Bjarki Hallgrimson ,  Sarah Dobbin

IPC: F21L4/00 ,  F21V9/00

CPC classification number: G01N21/6428 ,  G01N21/31 ,  G01N21/6402 ,  G01N21/6447 ,  G01N21/8803 ,  G01N2201/0221 ,  G01N2201/0612 ,  G01N2201/0621 ,  G01N2201/0627 ,  G01N2201/0638 ,  G01N2201/0693 ,  Y10S362/80

Abstract: An LED inspection lamp has plurality of LED sources for emitting electromagnetic radiation at different peak wavelengths for causing visible fluorescence in different leak detection dyes. A lens is associated with each LED. Radiation passing through lenses is superimposed in target area at target distance. Another LED inspection lamp has plurality of LEDs emitting electromagnetic radiation at a peak wavelength. A lens adaptor has lens housing for attachment to LED inspection lamp with a single LED for causing visible fluorescence, and a lens. Substantially all of the radiation from the LED passes through the lens and is focused in a target area at a target distance from the lenses. LED spot lights have a similar configuration. The LEDs may produce white light from distinct LEDs or from white LEDs. The light may be a flashlight or fixed spot light.

Abstract translation: LED检查灯具有多个LED源，用于发射不同峰值波长的电磁辐射，以在不同的泄漏检测染料中引起可见荧光。 镜头与每个LED相关联。 通过透镜的辐射以目标距离叠加在目标区域中。 另一个LED检查灯具有发射峰值波长的电磁辐射的多个LED。 镜头适配器具有透镜壳体，用于附接到具有用于引起可见荧光的单个LED的LED检查灯和透镜。 基本上来自LED的所有辐射通过透镜并聚焦在与透镜目标距离处的目标区域中。 LED射灯具有相似的配置。 LED可能产生来自不同LED或白色LED的白光。 灯可能是手电筒或固定点灯。

公开(公告)号：US20070105212A1

公开(公告)日：2007-05-10

申请号：US11644410

申请日：2006-12-22

Applicant: Mark Oldham ,  Vinod Mirchandani

Inventor： Mark Oldham ,  Vinod Mirchandani

IPC: C12M1/34

CPC classification number: G01N21/64 ,  F21K9/00 ,  F21K9/64 ,  F21V29/54 ,  F21V29/677 ,  F21V29/74 ,  F21Y2115/10 ,  G01J3/0286 ,  G01J3/10 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6439 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/0638 ,  G01N2201/1211 ,  G05D23/1919 ,  G05D23/20

Abstract: A method for stabilizing the temperature of an LED is provided. A method is provided that includes providing a system comprising an LED, a reaction region, and a sample in the reaction region; generating excitation beams with the LED; directing excitation beams to the sample; detecting an optical property of the sample to obtain detection data; measuring the operating temperature of the light emitting diode; and adjusting the detection data of an excitation beam characteristic shift related to the operating temperature, when the LED is operated at the operating temperature to generate the excitation beams.

Abstract translation: 提供了一种用于稳定LED的温度的方法。 提供了一种方法，其包括在反应区域中提供包括LED，反应区域和样品的系统; 用LED产生激励光束; 将激发光束引导到样品; 检测样品的光学特性以获得检测数据; 测量发光二极管的工作温度; 并且当LED在操作温度下操作以产生激发光束时，调整与工作温度相关的激发光束特性偏移的检测数据。

公开(公告)号：US5220403A

公开(公告)日：1993-06-15

申请号：US954282

申请日：1992-09-30

Applicant: John S. Batchelder ,  Philip C. D. Hobbs ,  Marc A. Taubenblatt

Inventor： John S. Batchelder ,  Philip C. D. Hobbs ,  Marc A. Taubenblatt

IPC: G01J3/42 ,  G01J3/44 ,  G01J9/02 ,  G01N21/35 ,  G01N21/95 ,  G02B3/00 ,  G02B21/00

CPC classification number: G01N21/9505 ,  G02B21/0016 ,  G02B3/00 ,  G01J2003/421 ,  G01J2009/0207 ,  G01J3/44 ,  G01N2021/1725 ,  G01N2021/1782 ,  G01N2021/8822 ,  G01N21/3563 ,  G01N21/359 ,  G01N2201/0638 ,  G01N2201/1087

Abstract: Apparatus and a method for performing high resolution optical imaging in the near infrared of internal features of semiconductor wafers uses an optical device made from a material having a high index of refraction and held in very close proximity to the wafer. The optical device may either be a prism or a plano-convex lens. The plano-convex lens may be held in contact with the wafer or separated from the wafer via an air bearing or an optical coupling fluid to allow the sample to be navigated beneath the lens. The lens may be used in a number of optical instruments such as a bright field microscope, a Schlieren microscope, a dark field microscope, a Linnik interferometer, a Raman spectroscope and an absorption spectroscope.

Abstract translation: 在半导体晶片的内部特征的近红外线中执行高分辨率光学成像的装置和方法使用由具有高折射率的材料制成的光学装置，并且保持非常靠近晶片。 光学器件可以是棱镜或平凸透镜。 平凸透镜可以保持与晶片接触或通过空气轴承或光耦合流体与晶片分离，以允许样品在透镜下面导航。 透镜可以用于许多光学仪器，例如明视野显微镜，Schlieren显微镜，暗视野显微镜，Linnik干涉仪，拉曼光谱仪和吸收光谱仪。

公开(公告)号：US5044755A

公开(公告)日：1991-09-03

申请号：US318245

申请日：1989-03-03

Applicant: Isaac Landa ,  Michael M. Anthony ,  George E. Toth

Inventor： Isaac Landa ,  Michael M. Anthony ,  George E. Toth

IPC: G01N21/85

CPC classification number: G01N21/8507 ,  G01N2201/024 ,  G01N2201/0638

Abstract: A modular probe is provided to enable introduction of light to a sample to be analyzed by an electro-optical device. The probe of the present invention may include an optical rod or other device for propagating light, an optical barrel which in part surrounds the optical rod, and a sleeve which is provided to attach the probe to a source of light such as a fiber optical bundle. The probe may be fitted with a bidirectional focusing adapter and a reflective tip. A transverse probe is also described.

Abstract translation: 提供了一种模块化探针，以便能够将光引入待通过电光装置分析的样品。 本发明的探针可以包括用于传播光的光学棒或其他装置，部分围绕光学棒的光学镜筒和设置成将探针连接到光源的套筒，例如光纤束 。 探头可以配有双向聚焦适配器和反射尖端。 还描述了横向探针。

公开(公告)号：US5039855A

公开(公告)日：1991-08-13

申请号：US488687

申请日：1990-03-05

Applicant: Gabor J. Kemeny ,  Carl G. Soryn ,  Howard Mark ,  Robert E. Rachlis ,  James Evans ,  Aamir Ashraf

Inventor： Gabor J. Kemeny ,  Carl G. Soryn ,  Howard Mark ,  Robert E. Rachlis ,  James Evans ,  Aamir Ashraf

IPC: G01J3/12 ,  G01J3/42 ,  G01N21/03 ,  G01N21/05

CPC classification number: G01N21/05 ,  G01J3/1256 ,  G01J3/42 ,  G01N2021/0346 ,  G01N21/0332 ,  G01N2201/0638 ,  G01N2201/08

Abstract: A dual beam acousto-optic tunable spectrometer utilizes an optics system to isolate the two radiation beams tuned by an acousto-optic filter, one of which is used to analyze a sample, the other of which is used as a reference. The tuning of the filter and the analysis of the signals is conducted by a microprocessor, which corrects for the many possible sources of noise. A new fluid sample cell utilizing glass balls to collimate radiation incident on the sample and focus radiation transmitted from the sample, is also disclosed.

Abstract translation: 双光束声光可调光谱仪利用光学系统隔离由声光滤波器调谐的两个辐射束，其中一个用于分析样品，另一个用作参考。 滤波器的调谐和信号分析由微处理器进行，微处理器可以纠正许多可能的噪声源。 还公开了一种利用玻璃球来准直入射到样品上的辐射并聚焦从样品发射的辐射的新的液体样品池。

公开(公告)号：US20240342804A1

公开(公告)日：2024-10-17

申请号：US18731243

申请日：2024-06-01

Applicant: Araz Yacoubian

Inventor： Araz Yacoubian

IPC: B22F12/90 ,  B22F10/20 ,  B22F10/30 ,  B22F12/00 ,  B29C64/393 ,  B33Y30/00 ,  B33Y50/00 ,  B33Y50/02 ,  G01N21/21 ,  G01N21/47 ,  G01N21/88 ,  G01N21/95

CPC classification number: B22F12/90 ,  B22F10/20 ,  B22F12/00 ,  B29C64/393 ,  B33Y30/00 ,  B33Y50/00 ,  B33Y50/02 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/9515 ,  B22F10/30 ,  G01N2021/4735 ,  G01N2021/479 ,  G01N2021/4792 ,  G01N2021/8848 ,  G01N2201/06113 ,  G01N2201/0634 ,  G01N2201/0638

Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

公开(公告)号：US12092583B2

公开(公告)日：2024-09-17

申请号：US18312264

申请日：2023-05-04

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Yinhang Tu ,  Xingan Liu ,  Yi Liu

IPC: G01N21/88 ,  H01M50/547

CPC classification number: G01N21/8806 ,  G01N21/8851 ,  H01M50/547 ,  G01N2021/8835 ,  G01N2201/0225 ,  G01N2201/0407 ,  G01N2201/06146 ,  G01N2201/0638

Abstract: This application provides a tab image acquisition device, system, and method. The tab image acquisition device includes an image acquisition apparatus, where the image acquisition apparatus includes: a first mobile module movable in a first direction; a second mobile module movable in a second direction, where the second mobile module is installed on the first mobile module and the second direction intersects the first direction; an image acquisition module installed on the second mobile module; and a prism module installed on the first mobile module, where the prism module has a reflective surface, and the reflective surface is configured to change an angle of incident light on a tab whose image is to be acquired, so that the incident light enters the image acquisition module.

公开(公告)号：US12043868B2

公开(公告)日：2024-07-23

申请号：US18085837

申请日：2022-12-21

Applicant: Pacific Biosciences of California, Inc.

Inventor： Cheng Frank Zhong ,  Paul Lundquist ,  Mathieu Foquet ,  Jonas Korlach ,  Hovig Bayandorian

IPC: G01N21/64 ,  C12Q1/68 ,  C12Q1/6825 ,  C12Q1/6874 ,  G01N21/77 ,  G01N33/543

CPC classification number: C12Q1/6874 ,  C12Q1/68 ,  C12Q1/6825 ,  G01N21/6428 ,  G01N21/648 ,  G01N21/7703 ,  G01N33/54373 ,  G01N2021/6463 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/08

Abstract: This invention provides devices for use in various analytical applications including single-molecule analytical reactions. Methods for detecting analytes optically by propagating optical energy by waveguides within a substrate are provided. Analytical devices are provided which have both shallow and deep waveguides in which illumination light is transported through the deep waveguides and coupled into the shallow waveguides. The shallow waveguides provide evanescent field illumination to analytes, such as single-molecule analytes, within nanometer scale wells. Integrated devices including integrated detectors such as CMOS detectors are included.

公开(公告)号：US12017278B2

公开(公告)日：2024-06-25

申请号：US18139864

申请日：2023-04-26

Applicant: Araz Yacoubian

Inventor： Araz Yacoubian

IPC: B22F12/90 ,  B22F10/20 ,  B22F12/00 ,  B29C64/393 ,  B33Y30/00 ,  B33Y50/00 ,  B33Y50/02 ,  G01N21/21 ,  G01N21/47 ,  G01N21/95 ,  B22F10/30 ,  G01N21/88

CPC classification number: B22F12/90 ,  B22F10/20 ,  B22F12/00 ,  B29C64/393 ,  B33Y30/00 ,  B33Y50/00 ,  B33Y50/02 ,  G01N21/21 ,  G01N21/4788 ,  G01N21/9515 ,  B22F10/30 ,  G01N2021/4735 ,  G01N2021/479 ,  G01N2021/4792 ,  G01N2021/8848 ,  G01N2201/06113 ,  G01N2201/0634 ,  G01N2201/0638

Abstract: Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

公开(公告)号：US20240201085A1

公开(公告)日：2024-06-20

申请号：US18554145

申请日：2022-03-15

Applicant: Ushio Denki Kabushiki Kaisha

Inventor： Toshikazu NAGASHIMA

IPC: G01N21/49 ,  G01N21/25 ,  G01N21/84

CPC classification number: G01N21/49 ,  G01N21/255 ,  G01N21/84 ,  G01N2021/845 ,  G01N2201/0636 ,  G01N2201/0638 ,  G01N2201/0697 ,  G01N2201/1042

Abstract: A conveyance device supports and conveys an object. The conveyance device has a support portion in which an opening narrower than the object is provided at a position where the object is supported. A lighting device irradiates a first surface of the object with measurement light having a wavelength changing over time through the opening of the support portion. A light receiving device detects object light that is diffusely transmitted light emitted from a second surface of the object.