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1.发明授权公开(公告)号：US08553210B2
公开(公告)日：2013-10-08
申请号：US13209688
申请日：2011-08-15
Applicant: Jeffrey Beckstead , Patrick Treado , Matthew Nelson
Inventor： Jeffrey Beckstead , Patrick Treado , Matthew Nelson
IPC: G01N21/00
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0272 , G01J3/28 , G01J3/44 , G01J3/443 , G01N21/35 , G01N21/6402 , G01N21/6456 , G01N21/65 , G01N21/658 , G01N21/718 , G01N2021/6423 , G01N2201/0221 , G01N2201/06113 , G01N2201/08 , G01N2201/101 , G01N2201/1087
Abstract: A system and method for locating and identifying unknown samples. A targeting mode may be utilized to scan regions of interest for potential unknown materials. This targeting mode may interrogate regions of interest using SWIR and/or fluorescence spectroscopic and imaging techniques. Unknown samples detected in regions of interest may be further interrogated using a combination of Raman and LIBS techniques to identify the unknown samples. Structured illumination may be used to interrogate an unknown sample. Data sets generated during interrogation may be compared to a reference database comprising a plurality of reference data sets, each associated with a known material. The system and method may be used to identify a variety of materials including: biological, chemical, explosive, hazardous, concealment, and non-hazardous materials.
Abstract translation: 用于定位和识别未知样品的系统和方法。 可以利用定位模式来扫描潜在未知材料的感兴趣区域。 这种瞄准模式可以使用SWIR和/或荧光光谱和成像技术来询问感兴趣的区域。 可以使用拉曼和LIBS技术的组合进一步询问在感兴趣区域中检测到的未知样品，以识别未知样品。 结构化照明可用于询问未知样品。 在询问期间生成的数据集可以与包括多个参考数据集的参考数据库进行比较，每个参考数据集与已知的资料相关联。 该系统和方法可用于识别各种材料，包括：生物，化学，爆炸，危险，隐蔽和非危险材料。
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公开(公告)号：US08431409B1
公开(公告)日：2013-04-30
申请号：US13564698
申请日：2012-08-01
Applicant: Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
Inventor： Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
IPC: G01N21/75
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
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公开(公告)号：US20100210029A1
公开(公告)日：2010-08-19
申请号：US12597742
申请日：2008-04-25
Applicant: Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan G. Santiago
Inventor： Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan G. Santiago
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
Abstract translation: 提供了利用自由表面流体学和SERS用于具有高灵敏度和特异性的分析物检测的方法，装置和系统。 分子可以是空气传播剂，包括但不限于爆炸物，麻醉剂，危险化学品或其他化学物质。 自由表面流体结构使用开放的微通道产生，并且表现出大的表面与体积比。 自由表面流体界面可以过滤干扰分子，同时浓缩空气中的分析物。 微通道流动使SERS活性探针颗粒在流动中受控聚集，从而提高检测器的灵敏度。
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公开(公告)号：US4766324A
公开(公告)日：1988-08-23
申请号：US83695
申请日：1987-08-07
Applicant: Soheil Saadat , Jiri Pecen , Armand P. Neukermans , George J. Kren
Inventor： Soheil Saadat , Jiri Pecen , Armand P. Neukermans , George J. Kren
CPC classification number: G01N21/94 , G01N15/1468 , G01N2021/8867 , G01N2201/1087
Abstract: A particle detection method for matching particles detected in two scans of a surface taken at different times in which particles having a light scattering intensity above a collection threshold are first detected and the measured position and scattering intensity therefor stored in a computer memory. Corresponding first and second measured positions from the respective first and second scans are determined by forming a triangle from selected first detected particles and finding those second detected particles which form a variant triangle with matching perimeter and area. From these matching first and second particles a transformation is found for mapping first measured positions to corresponding second positions and vice versa. Areas around corresponding positions of particles having a scattering intensity above a display threshold are examined for matching particles. If not found, the area is reexamined at a reduced threshold. Matching particles are considered to be the same, while unmatched particles are considered to be either added or removed. The method provides an accurate count of particles for process contamination analysis.
Abstract translation: 一种颗粒检测方法，用于匹配在不同时间拍摄的表面的两次扫描中检测到的颗粒，其中首先检测具有高于采集阈值的光散射强度的颗粒，并将其测量的位置和散射强度存储在计算机存储器中。 通过从所选择的第一检测到的粒子形成三角形并找到形成具有匹配的周长和面积的变形三角形的那些第二检测到的粒子来确定来自相应的第一和第二扫描的相应的第一和第二测量位置。 从这些匹配的第一和第二颗粒中，找到用于将第一测量位置映射到对应的第二位置的变换，反之亦然。 检查具有高于显示阈值的散射强度的颗粒的相应位置周围的区域以匹配颗粒。 如果没有找到，则会以降低的阈值重新检查该区域。 认为匹配的颗粒是相同的，而不匹配的颗粒被认为是添加或去除。 该方法提供了用于过程污染分析的颗粒的精确计数。
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公开(公告)号：US20180045570A1
公开(公告)日：2018-02-15
申请号：US15552752
申请日：2016-03-08
Applicant: RENISHAW PLC
Inventor： Timothy SMITH , Richard John BLACKWELL-WHITEHEAD
CPC classification number: G01J3/44 , G01J3/06 , G01J2003/064 , G01N21/65 , G01N2201/103 , G01N2201/1045 , G01N2201/1087 , G02B21/002
Abstract: A transmission Raman spectroscopy apparatus has a light source for generating a light profile on a sample, a photodetector having at least one photodetector element, collection optics arranged to collect Raman scattered light transmitted through the sample and direct the Raman light onto the at least one photodetector element and a support for supporting the sample. The support and light source are arranged such that the light profile can be moved relative to the sample in order that the at least one photodetector element receives Raman scattered light generated for different locations of the light profile on the sample.
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Patent Agency Ranking
公开(公告)号：US09488519B2
公开(公告)日：2016-11-08
申请号：US14730762
申请日：2015-06-04
Applicant: SAMCO INC.
Inventor： Kiyoshi Hasegawa , Hiroshi Kawamura , Peter Wood
CPC classification number: G01J1/0238 , G01J1/4257 , G01N21/55 , G01N2021/8427 , G01N2201/025 , G01N2201/1087
Abstract: The present invention provides a light beam measuring instrument that can securely receive light reflected by a sample. The light beam measuring instrument 1 includes an optical axis tilting mechanism 13 that includes a first tilting mechanism 131 and a second tilting mechanism 132. From the optical axis A1 of irradiation light beam emitted from a light beam source 112, the first tilting mechanism 131 tilts the optical axis A1 about the first tilting axis T1. The second tilting mechanism 132 tilts the optical axis A1 about the second tilting axis T2. The light beam measuring instrument 1 can receive the light reflected by the semiconductor chip C by means of operation of the optical axis tilting mechanism 13 even if the light reflected by the semiconductor chip C is tilted. Accordingly, this apparatus can securely perform measurement or inspection using the light beam.
Abstract translation: 本发明提供了一种可以安全地接收由样品反射的光的光束测量仪器。 光束测量仪1包括光轴倾斜机构13，其包括第一倾斜机构131和第二倾斜机构132.从光束源112发射的照射光束的光轴A1，第一倾斜机构131倾斜 围绕第一倾斜轴线T1的光轴A1。 第二倾斜机构132围绕第二倾斜轴T2倾斜光轴A1。 即使由半导体芯片C反射的光倾斜，光束测量仪器1也可以通过光轴倾斜机构13的操作来接收由半导体芯片C反射的光。 因此，该装置可以可靠地执行使用光束的测量或检查。
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7.发明授权公开(公告)号：US08680485B2
公开(公告)日：2014-03-25
申请号：US13840122
申请日：2013-03-15
Applicant: Olympus Corporation
Inventor： Tetsuya Tanabe
CPC classification number: G01N21/85 , G01N15/1434 , G01N21/6452 , G01N21/6458 , G01N2021/6419 , G01N2021/6421 , G01N2201/1087 , G02B21/0052 , G02B21/0076 , G02B21/008
Abstract: There is provided a method of avoiding deterioration of the accuracy in the number of detected light-emitting particles due to that two or more light-emitting particles are encompassed at a time in the light detection region in the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope. In the inventive optical analysis technique, in the detection of an individual signal indicating light of a light-emitting particle by selectively detecting a signal having an intensity beyond a threshold value as a signal indicating light of a light-emitting particle in light intensity data produced through measuring light intensity during moving the position of a light detection region in a sample solution, the threshold value is set so that a signal indicating light from a light-emitting particle encompassed in a region narrower than the light detection region will be detected selectively.
Abstract translation: 提供了一种避免由于在使用光学测量的扫描分子计数方法中在光检测区域中一次包围两个或更多个发光粒子而使检测到的发光粒子数量的精度降低的方法 用共焦显微镜或多光子显微镜。 在本发明的光学分析技术中，在通过选择性地检测具有超过阈值的强度的信号来检测指示发光粒子的光的单个信号作为产生光强度数据中的发光粒子的光的信号 通过在移动样品溶液中的光检测区域的位置时测量光强度，设定阈值，以便选择性地检测到包含在比光检测区域窄的区域中的发光粒子的光的信号。
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公开(公告)号：USRE34782E
公开(公告)日：1994-11-08
申请号：US969794
申请日：1992-10-12
Applicant: Walter B. Dandliker , Howard S. Barr , Henry S. Katzenstein , Keith R. Watson
Inventor： Walter B. Dandliker , Howard S. Barr , Henry S. Katzenstein , Keith R. Watson
CPC classification number: G01N21/6408 , G02B21/16 , G01N21/6456 , G01N21/6458 , G01N2201/1087
Abstract: A fluorometer for measuring a particular fluorescence emanating from a specimen and operating in accordance with the following method. Producing a burst of concentrated light energy and directing the concentrated light energy toward the specimen to produce a fluorescence from the specimen including the particular fluorescence. Preferably producing an image of the fluorescence. Detecting the fluorescence and producing a signal in accordance with the fluorescence. Controlling the passage of the image of the fluorescence for detecting within a particular time period so as to optimize the detection of the particular fluorescence. Timing the operation to sequence the detection of the fluorescence within the particular time period after the production of the burst of concentrated light energy. Scanning the fluorescence from the specimen for forming signals representative of the fluorescence from the specimen. Analyzing the signals to enhance the portion of the signal representing the particular fluorescence relative to the portion of the signal.
Abstract translation: 一种荧光计，用于测量从样品发出的特定荧光并根据以下方法进行操作。 产生集中的光能的突发，并将集中的光能引导到样品以从包括特定荧光的样品产生荧光。 优选地产生荧光图像。 根据荧光检测荧光并产生信号。 控制在特定时间段内用于检测的荧光图像的通过，以便优化特定荧光的检测。 计算在产生聚集的光能的突发之后的特定时间段内对荧光的检测进行排序的操作。 扫描来自样品的荧光，以形成代表来自样品荧光的信号。 分析信号以增强表示相对于信号部分的特定荧光的信号部分。
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9.发明授权
公开(公告)号：US4679946A
公开(公告)日：1987-07-14
申请号：US612077
申请日：1984-05-21
Applicant: Allan Rosencwaig , Jon Opsal
Inventor： Allan Rosencwaig , Jon Opsal
IPC: G01N25/00 , G01B11/06 , G01N21/17 , G01N21/21 , G01N21/55 , G01N25/18 , G01N25/72 , G01N29/00 , G01N21/41
CPC classification number: G01N21/1702 , G01B11/0658 , G01N21/55 , G01N25/72 , G01N21/21 , G01N2201/1087
Abstract: The subject invention discloses a method and apparatus for evaluating both the thickness and compositional variables in a layered or thin film sample. Two independent detection systems are provided for measuring thermal waves generated in a sample by a periodic, localized heating. One detection system is of the type that generates output signals that are primarily a function of the surface temperature of the sample. The other detection system generates signals that are primarily a function of the integral of the temperature beneath the sample surface. The two independent thermal wave measurements permit analysis of both thickness and compositional variables. An apparatus is disclosed wherein both detection systems can be implemented efficiently within one apparatus.
Abstract translation: 本发明公开了一种用于评估层状或薄膜样品中的厚度和组成变量的方法和装置。 提供了两个独立的检测系统，用于通过周期性的局部加热来测量样品中产生的热波。 一种检测系统是产生主要是样品表面温度的函数的输出信号的类型。 另一个检测系统产生主要是样品表面下方温度积分函数的信号。 两个独立的热波测量允许分析厚度和组成变量。 公开了一种在一个装置内可以有效地实现两个检测系统的装置。
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公开(公告)号：US4631581A
公开(公告)日：1986-12-23
申请号：US703842
申请日：1985-02-21
Applicant: Kjell S. Carlsson
Inventor： Kjell S. Carlsson
CPC classification number: G02B21/002 , G01N21/5911 , G02B21/0096 , G01N21/474 , G01N21/6456 , G01N2201/1087
Abstract: A method for microphotometering individual volume elements of a microscope specimen 10, comprising generating a luminous dot or cursor and progressively illuminating a plurality of part elements in the focal plane 11 of the microscope through the specimen. The mutual position between the specimen and the focal plane is then changed and a plurality of part elements in the focal plane are illuminated. Reflected and/or fluorescent light and transmitted light respectively created by the illumination is collected, detected and stored for generating a three-dimensional image of that part of the specimen composed of the volume elements. Illumination of multiples of part elements is implemented by deflecting the cursor and/or by moving the specimen. The change in the relative mutual position between the specimen and the focal plane of the microscope is effected either by displacing the specimen or the objective. Apparatus for carrying out the method include a specimen table 301, a microscope objective and light source 31-32-33. The table or the objective are arranged for stepwise movement along the main axis of the microscope synchronously with punctilinear light scanning of the specimen. The table is arranged for stepwise movement at right angles to the main axis and/or the light source is arranged for deflection over the focal plane 21 through the specimen.
Abstract translation: 一种显微镜样品10的各个体积元件的显微照相测量方法，包括产生发光点或光标，并通过样本逐渐照射显微镜焦平面11中的多个部分元素。 然后改变样品和焦平面之间的相互位置，并且焦平面中的多个部分元件被照亮。 分别由照明产生的反射和/或荧光和透射光被收集，检测和存储，以产生由体积元素组成的该部分的三维图像。 通过偏转光标和/或移动样本来实现部件元件的倍数的照明。 样品与显微镜焦平面之间的相对相对位置的变化通过移动样品或物镜来实现。 用于执行该方法的装置包括样本台301，显微镜物镜和光源31-32-33。 表格或物镜被布置为与样本的点状光扫描同步地沿着显微镜的主轴逐步移动。 该台被布置成与主轴成直角地逐步运动，和/或将光源布置成通过样本在焦平面21上偏转。
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