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公开(公告)号:US10410827B2
公开(公告)日:2019-09-10
申请号:US15586194
申请日:2017-05-03
Applicant: FEI Company
Inventor: Ali Mohammadi-Gheidari , Alexander Henstra , Peter Christiaan Tiemeijer , Kun Liu , Pleun Dona , Gregory A. Schwind , Gerbert Jeroen van de Water
IPC: H01J37/29 , H01J37/065 , H01J37/067 , H01J37/145 , G02B21/06 , H01J37/244
Abstract: A charged particle microscope and a method of operating a charged particle microscope are disclosed. The microscope employs a source for producing charged particles, and a source lens below the source to form a charged particle beam which is directed onto a specimen by a condenser system. A detector collects radiation emanating from the specimen in response to irradiation of the specimen by the beam. The source lens is a compound lens, focusing the beam within a vacuum enclosure using both a magnetic lens having permanent magnets outside the enclosure to produce a magnetic field at the beam, and a variable electrostatic lens within the enclosure.
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公开(公告)号:US20180323036A1
公开(公告)日:2018-11-08
申请号:US15586194
申请日:2017-05-03
Applicant: FEI Company
Inventor: Ali Mohammadi-Gheidari , Alexander Henstra , Peter Christiaan Tiemeijer , Kun Liu , Pleun Dona , Gregory A. Schwind , Gerbert Jeroen van de Water , Maarten Bischoff
IPC: H01J37/29 , H01J37/244 , G02B21/06
CPC classification number: H01J37/29 , G02B21/06 , H01J37/065 , H01J37/067 , H01J37/145 , H01J37/244 , H01J2237/06316 , H01J2237/06341 , H01J2237/0656 , H01J2237/08 , H01J2237/1415 , H01J2237/28
Abstract: A charged particle microscope and a method of operating a charged particle microscope are disclosed. The microscope employs a source for producing charged particles, and a source lens below the source to form a charged particle beam which is directed onto a specimen by a condenser system. A detector collects radiation emanating from the specimen in response to irradiation of the specimen by the beam. The source lens is a compound lens, focusing the beam within a vacuum enclosure using both a magnetic lens having permanent magnets outside the enclosure to produce a magnetic field at the beam, and a variable electrostatic lens within the enclosure.
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