SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM

    公开(公告)号:US20220406711A1

    公开(公告)日:2022-12-22

    申请号:US17894662

    申请日:2022-08-24

    Applicant: FLOSFIA INC.

    Abstract: Provided is a semiconductor device, including: a first electrode layer including a first wiring member and a second electrode layer including a second wiring member, the first electrode layer and the second electrode layer being disposed to face each other; a semiconductor element disposed in a gap between the first and second electrode layers, and electrically connected to the first and second electrode layers; and a via disposed in the gap between the first and second electrode layers, electrically connected to the first and second electrode layers, and configured to detect a state of the semiconductor element by being fractured at a predetermined temperature and losing electric connection.

    SEMICONDUCTOR DEVICE
    6.
    发明申请

    公开(公告)号:US20220130952A1

    公开(公告)日:2022-04-28

    申请号:US17508259

    申请日:2021-10-22

    Applicant: FLOSFIA INC.

    Abstract: An object of the disclosure is to provide a semiconductor device having enhanced adhesion of the electrode while improving the reverse direction breakdown voltage, which is especially useful for power devices. A semiconductor device including a semiconductor layer and an electrode layer provided on the semiconductor layer and including at least a first electrode layer and a second electrode layer provided on the first electrode layer, wherein an outer edge portion of the second electrode layer is located outside an outer edge portion of the first electrode layer, wherein the semiconductor layer includes an electric field relaxation region with a different electrical resistivity from that of the semiconductor layer, and wherein the electric field relaxation region overlaps at least a part of a portion of the second electrode layer located outside the outer edge portion of the first electrode layer in plan view.

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