CORRELATION INTERFEROMETRIC METHODS, DEVICES AND SYSTEMS FOR LOW COST AND RUGGED SPECTROSCOPY
    1.
    发明申请
    CORRELATION INTERFEROMETRIC METHODS, DEVICES AND SYSTEMS FOR LOW COST AND RUGGED SPECTROSCOPY 有权
    低成本和镭射光谱的相关干涉方法,装置和系统

    公开(公告)号:US20120026483A1

    公开(公告)日:2012-02-02

    申请号:US13145699

    申请日:2010-01-21

    CPC classification number: G01J3/4531 G01J3/457 G01N21/45 G01N21/552 G01N21/65

    Abstract: A correlation interferometric spectroscopy devices are described that detect the spectral characteristics of a sample wherein device consists of an electromagnetic radiation source for exciting a sample with photons; and a detector adapted to detect an arrival time of a photon at the detector and further adapted to detect a delay between the arrival time of different photons. The device may further consist of an autocorrelator adapted to analyze the between the arrival of photons at the detector. The device may also be used together with other spectral detection and characterizing systems, such as Raman spectroscopy and attenuated total reflectance spectroscopy. Also provided herein are methods, systems, and kits incorporating the correlation interferometric spectroscopy device.

    Abstract translation: 描述了相关干涉光谱装置,其检测样品的光谱特性,其中装置由用于激发具有光子的样品的电磁辐射源组成; 以及检测器,其适于检测光子在检测器处的​​到达时间,并且还适于检测不同光子的到达时间之间的延迟。 该装置还可以包括适于分析在检测器处的​​光子到达之间的自相关器。 该装置还可以与其他光谱检测和表征系统一起使用,例如拉曼光谱和衰减全反射光谱。 本文还提供了结合相关干涉测量光谱装置的方法,系统和试剂盒。

    Peri-critical reflection spectroscopy devices, systems, and methods
    2.
    发明授权
    Peri-critical reflection spectroscopy devices, systems, and methods 有权
    周边反射光谱仪器,系统和方法

    公开(公告)号:US09041923B2

    公开(公告)日:2015-05-26

    申请号:US13263386

    申请日:2010-04-07

    Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus.

    Abstract translation: 描述了定向到样品的临界角的光谱装置,其检测样品的光谱特性,其中该装置由电磁辐射源组成,该电磁辐射源适于用在入射角处的位置处引入样品的电磁辐射来激发样品 或接近样品的临界角; 与电磁辐射源和样品通信的透射晶体,透射晶体具有适于在内部反射电磁辐射的高折射率; 反射器,其适于将电磁辐射引入接近接近发射晶体和样品之间的临界角的入射角; 以及用于检测来自样品的电磁辐射的检测器。 此外,本文提供了包含周边反射光谱仪的方法,系统和试剂盒。

    RAMAN SPECTROSCOPY USING MULTIPLE DISCRETE LIGHT SOURCES
    3.
    发明申请
    RAMAN SPECTROSCOPY USING MULTIPLE DISCRETE LIGHT SOURCES 审中-公开
    拉曼光谱使用多光束光源

    公开(公告)号:US20120019819A1

    公开(公告)日:2012-01-26

    申请号:US13145711

    申请日:2010-01-20

    Abstract: Raman spectroscopy apparatuses are described that detect the spectral characteristics of a sample wherein the apparatus consists of a multiplicity of modulated discrete light sources adapted to excite a sample with electromagnetic radiation, a filter adapted to isolate a predetermined wavelength emitted by the sample wherein the wavelength is further modulated at different frequencies, and a detector for detecting the isolated wavelength. The apparatus may further consist of an interferometer, such as a Michelson interferometer, adapted to modulate the excitation energy. Also provided herein are methods, systems, and kits incorporating the Raman spectroscopy apparatus.

    Abstract translation: 描述了拉曼光谱装置,其检测样品的光谱特性,其中该装置由适于用电磁辐射激发样品的多个调制离散光源组成,适用于隔离由样品发射的预定波长的滤波器,其中波长为 在不同频率进一步调制,以及用于检测孤立波长的检测器。 该装置还可以包括适于调制激发能的干涉仪,例如迈克尔逊干涉仪。 本文还提供了结合拉曼光谱仪的方法,系统和试剂盒。

    Methods, devices and kits for peri-critical reflectance spectroscopy
    4.
    发明授权
    Methods, devices and kits for peri-critical reflectance spectroscopy 有权
    用于周边反射光谱的方法,装置和试剂盒

    公开(公告)号:US08730468B2

    公开(公告)日:2014-05-20

    申请号:US12865698

    申请日:2009-01-30

    CPC classification number: G01N21/552 G01N21/43 G01N2201/0221

    Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detect the spectral characteristics of a sample. The apparatus includes an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to a measurement site of the sample at a plurality of angles of incidence near a critical angle of the sample and a transmitting crystal in communication with the electromagnetic radiation source and the sample. The transmitting crystal may have a high refractive index adapted to reflect the electromagnetic radiation internally. The apparatus includes a reflector adapted to introduce the electromagnetic radiation to a measurement site of the sample at a plurality of angles of incidence near the critical angle between the transmitting crystal and sample. The apparatus includes a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflectance spectroscopy apparatus.

    Abstract translation: 描述了以样品的临界角取向的光谱装置,其检测样品的光谱特性。 该装置包括电磁辐射源,其适于使用在样品的临界角附近以多个入射角引入的电磁辐射和与电磁辐射源连通的透射晶体激发样品的样品, 样品。 透射晶体可以具有适于在内部反射电磁辐射的高折射率。 该装置包括反射器,其适于将电磁辐射以接近透射晶体和样品之间的临界角度的多个入射角引入样品的测量位置。 该装置包括用于检测来自样品的电磁辐射的检测器。 此外,本文提供了包含周边反射光谱仪的方法,系统和试剂盒。

    PERI-CRITICAL REFLECTION SPECTROSCOPY DEVICES, SYSTEMS, AND METHODS
    5.
    发明申请
    PERI-CRITICAL REFLECTION SPECTROSCOPY DEVICES, SYSTEMS, AND METHODS 有权
    PERI-CRITICAL REFLECTION SPECTROSCOPY DEVICES,SYSTEMS和METHODS

    公开(公告)号:US20120088486A1

    公开(公告)日:2012-04-12

    申请号:US13263386

    申请日:2010-04-07

    Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus.

    Abstract translation: 描述了定向到样品的临界角的光谱装置,其检测样品的光谱特性,其中该装置由电磁辐射源组成,该电磁辐射源适于用在入射角处的位置处引入样品的电磁辐射来激发样品 或接近样品的临界角; 与电磁辐射源和样品通信的透射晶体,透射晶体具有适于在内部反射电磁辐射的高折射率; 反射器,其适于将电磁辐射引入接近接近发射晶体和样品之间的临界角的入射角; 以及用于检测来自样品的电磁辐射的检测器。 此外,本文提供了包含周边反射光谱仪的方法,系统和试剂盒。

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