Abstract:
A memory device includes a boot-up control unit configured to control a start of boot-up operation by starting the boot-up operation when an initialization signal is activated, and ignore the initialization signal after a complete signal is activated, a nonvolatile memory unit configured to store repair data, and output the stored repair data during the boot-up operation, a plurality of registers configured to store the repair data outputted from the nonvolatile memory unit, a plurality of memory banks configured to replace a normal cell with a redundant cell, using the repair data stored in the corresponding registers among the plurality of resistors, and a verification unit configured to generate the complete signal to notify that the boot-up operation is completed.
Abstract:
A semiconductor memory device includes a cell array including a plurality of word lines; a plurality of address storing circuits, each of the plurality of address storing circuits suitable for storing a sampling address as a latch address, a valid bit indicating whether the latch address is valid, and a valid-lock bit indicating whether the latch address is accessed more than a certain number of times, each of the plurality of address storing circuits further suitable for outputting the latch address as a target address according to the valid bit and valid-lock bit; and a row control circuit suitable for refreshing one or more word lines based on the target address in response to a refresh command.
Abstract:
A setting information storage circuit includes first decoders configured to generate first input enable signals, respectively, in response to selection codes and a first set signal, first register sets configured to correspond to the first decoders, respectively, and to receive setting data when first input enable signals generated from the first decoders corresponding to the first register sets, respectively, are enabled, and store the received setting data, a second decoders configured to generate a second input enable signals, respectively, in response to the selection codes and a second set signal, and a second register sets configured to correspond to the second decoders, respectively, and to receive the setting data when second input enable signals generated from the second decoders corresponding to the second register sets, respectively, are enabled, and store the received setting data.
Abstract:
A memory device includes a boot-up control unit configured to control a start of boot-up operation by starting the boot-up operation when an initialization signal is activated, and ignore the initialization signal after a complete signal is activated, a nonvolatile memory unit configured to store repair data, and output the stored repair data during the boot-up operation, a plurality of registers configured to store the repair data outputted from the nonvolatile memory unit, a plurality of memory banks configured to replace a normal cell with a redundant cell, using the repair data stored in the corresponding registers among the plurality of resistors, and a verification unit configured to generate the complete signal to notify that the boot-up operation is completed.