Abstract:
Ein Verfahren zum Herstellen einer Schichtstruktur, die ein selbstorganisiertes Material umfasst, umfasst: Aufbringen einer nichtvernetzenden Fotolackschicht auf ein Substrat; strukturierendes Exponieren der Fotolackschicht gegenüber einer ersten Strahlung; gegebenenfalls Aufheizen der exponierten Fotolackschicht; Entwickeln der exponierten Fotolackschicht durch ein erstes Entwicklungsverfahren mit einem wässrigen alkalischen Entwickler, um eine strukturierte Ausgangs-Fotolackschicht zu bilden; fotochemisches, thermisches und/oder chemisches Behandeln der strukturierten Ausgangs-Fotolackschicht, um so eine behandelte strukturierte Fotolackschicht zu bilden, die nichtvernetzten behandelten Fotolack, der auf einer ersten Substratoberfläche aufgebracht ist, umfasst; Gießen einer Lösung eines orientierungslenkenden Materials in einem ersten Lösungsmittel auf die behandelte strukturierte Fotolackschicht und Entfernen des ersten Lösungsmittels, um eine orientierungslenkende Schicht zu bilden; Aufheizen der orientierungslenkenden Schicht, um einen Teil des orientierungslenkenden Materials wirkungsvoll an eine zweite Substratoberfläche zu binden; Entfernen von wenigstens einem Teil des behandelten Fotolacks und gegebenenfalls von nichtgebundenem orientierungslenkenden Material durch ein zweites Entwicklungsverfahren, um so eine Vorstruktur für die Selbstorganisation zu bilden; gegebenenfalls Aufheizen der Vorstruktur; Gießen einer Lösung eines selbstorganisationsfähigen Materials, das in einem zweiten Lösungsmittel gelöst ist, auf die Vorstruktur und Entfernen des zweiten Lösungsmittels; und Selbstorganisierenlassen des gegossenen Materials mit optionalem Aufheizen und/oder Tempern, um so die Schichtstruktur zu bilden, die das selbstorganisierte Material umfasst.
Abstract:
A method of forming a layered structure comprising a self-assembled material comprises: disposing a non-crosslinking photoresist layer on a substrate; pattern-wise exposing the photoresist layer to first radiation; optionally heating the exposed photoresist layer; developing the exposed photoresist layer in a first development process with an aqueous alkaline developer, forming an initial patterned photoresist layer; treating the initial patterned photoresist layer photochemically, thermally and/or chemically, thereby forming a treated patterned photoresist layer comprising non-crosslinked treated photoresist disposed on a first substrate surface; casting a solution of an orientation control material in a first solvent on the treated patterned photoresist layer, and removing the first solvent, forming an orientation control layer; heating the orientation control layer to effectively bind a portion of the orientation control material to a second substrate surface; removing at least a portion of the treated photoresist and, optionally, any non-bound orientation control material in a second development process, thereby forming a pre-pattern for self-assembly; optionally heating the pre-pattern; casting a solution of a material capable of self-assembly dissolved in a second solvent on the pre-pattern and removing the second solvent; and allowing the casted material to self-assemble with optional heating and/or annealing, thereby forming the layered structure comprising the self-assembled material.
Abstract:
A method (and resultant structure) of forming a plurality of masks, includes creating a reference template, using imprint lithography to print at least one reference template alignment mark on all of a plurality of mask blanks for a given chip set, and printing sub-patterns on each of the plurality of mask blanks, and aligning the sub-patterns to the at least one reference template alignment mark.
Abstract:
A method of forming a layered structure comprising a self-assembled material comprises: disposing a non-crosslinking photoresist layer on a substrate; pattern-wise exposing the photoresist layer to first radiation; optionally heating the exposed photoresist layer; developing the exposed photoresist layer in a first development process with an aqueous alkaline developer, forming an initial patterned photoresist layer; treating the initial patterned photoresist layer photochemically, thermally and/or chemically, thereby forming a treated patterned photoresist layer comprising non-crosslinked treated photoresist disposed on a first substrate surface; casting a solution of an orientation control material in a first solvent on the treated patterned photoresist layer, and removing the first solvent, forming an orientation control layer; heating the orientation control layer to effectively bind a portion of the orientation control material to a second substrate surface; removing at least a portion of the treated photoresist and, optionally, any non-bound orientation control material in a second development process, thereby forming a pre-pattern for self-assembly; optionally heating the pre-pattern; casting a solution of a material capable of self-assembly dissolved in a second solvent on the pre-pattern and removing the second solvent; and allowing the casted material to self-assemble with optional heating and/or annealing, thereby forming the layered structure comprising the self-assembled material.
Abstract:
A layered structure comprising a self-assembled material is formed by a method that includes forming a photochemically, thermally and/or chemically treated patterned photoresist layer disposed on a first surface of a substrate. The treated patterned photoresist layer comprises a non-crosslinked treated photoresist. An orientation control material is cast on the treated patterned photoresist layer, forming a layer containing orientation control material bound to a second surface of the substrate. The treated photoresist and, optionally, any non-bound orientation control material are removed by a development process, resulting in a pre-pattern for self-assembly. A material capable of self-assembly is cast on the pre-pattern. The casted material is allowed to self-assemble with optional heating and/or annealing to produce the layered structure.