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公开(公告)号:DE3066410D1
公开(公告)日:1984-03-08
申请号:DE3066410
申请日:1980-09-15
Applicant: IBM
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公开(公告)号:DE69022841T2
公开(公告)日:1996-05-30
申请号:DE69022841
申请日:1990-12-07
Applicant: IBM
IPC: G11B11/10 , G11B11/105 , G11B11/12 , G11B11/18
Abstract: A dielectric layer (14, 18) for use in a magneto-optic storage medium contains a compound glass of SiO2 - MO2, SiO2 - M2O3 or SiO2 - M2O5 and combinations thereof where M is selected from Zr, Ti, Al, Nb, Y, Sn, In, Ta and Sb.
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公开(公告)号:AT128783T
公开(公告)日:1995-10-15
申请号:AT90123487
申请日:1990-12-07
Applicant: IBM
IPC: G11B11/10 , G11B11/105 , G11B11/12 , G11B11/18
Abstract: A dielectric layer (14, 18) for use in a magneto-optic storage medium contains a compound glass of SiO2 - MO2, SiO2 - M2O3 or SiO2 - M2O5 and combinations thereof where M is selected from Zr, Ti, Al, Nb, Y, Sn, In, Ta and Sb.
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公开(公告)号:AU539639B2
公开(公告)日:1984-10-11
申请号:AU6298180
申请日:1980-10-06
Applicant: IBM
Inventor: AVIRAM ARI , HATZAKIS MICHAEL , KAUFMAN FRANK B , KRAMER STEVEN R , HOFER DONALD C , JONES FLETCHER
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公开(公告)号:DE69022841D1
公开(公告)日:1995-11-09
申请号:DE69022841
申请日:1990-12-07
Applicant: IBM
IPC: G11B11/10 , G11B11/105 , G11B11/12 , G11B11/18
Abstract: A dielectric layer (14, 18) for use in a magneto-optic storage medium contains a compound glass of SiO2 - MO2, SiO2 - M2O3 or SiO2 - M2O5 and combinations thereof where M is selected from Zr, Ti, Al, Nb, Y, Sn, In, Ta and Sb.
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6.
公开(公告)号:CA1163671A
公开(公告)日:1984-03-13
申请号:CA358901
申请日:1980-08-25
Applicant: IBM
Inventor: AVIRAM ARI , HATZAKIS MICHAEL , JONES FLETCHER , KAUFMAN FRANK B , KRAMER STEVEN R , HOFER DONALD C
IPC: G03D7/00
Abstract: A new class of E-beam resists is described. The resists are donor polymer-doped halocarbon acceptor transfer complexes. They are prepared from known polymeric backbones such as polyvinylchloride, polyglutamic acid, polyvinylbenzylchloxide, polyepichlorohydrin, poly(ahalophosphazenes), polyacrylic chloride, polystyrene and the like; and donor molecules such as tetrathiafulvalenes, tetraselenafulvalenes, dithiadiselenafulvalene, ferrocenes, phenothiazines, pyrazoline and an amine having the general formula R-NH2 where R can be selected from alkyl and aryl groups. A lithographic method is also described.
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公开(公告)号:CA2032866C
公开(公告)日:1994-09-06
申请号:CA2032866
申请日:1990-12-20
Applicant: IBM
Inventor: JAHNES CHRISTOPHER V , JONES FLETCHER , LOGAN JOSEPH S , RUSSAK MICHAEL A
Abstract: A dielectric layer for use in a magneto-optic storage medium contains a compound glass of SiO2 -MO2, SiO2 - M2 O3, or SiO2 - M2 O5 and combinations thereof where M is selected from Zr, Ti, Al, Nb, Y, Sn, In, Ta and Sb.
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公开(公告)号:DE3776047D1
公开(公告)日:1992-02-27
申请号:DE3776047
申请日:1987-07-28
Applicant: IBM
Inventor: JONES FLETCHER , LOGAN JOSEPH SKINNER
IPC: H01L21/302 , C23C14/34 , H01J37/32 , H01L21/3065 , H01L21/31 , C23C14/14 , C23F1/08
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公开(公告)号:CA2032866A1
公开(公告)日:1991-08-01
申请号:CA2032866
申请日:1990-12-20
Applicant: IBM
Inventor: JAHNES CHRISTOPHER V , JONES FLETCHER , LOGAN JOSEPH S , RUSSAK MICHAEL A
Abstract: A dielectric layer (14, 18) for use in a magneto-optic storage medium contains a compound glass of SiO2 - MO2, SiO2 - M2O3 or SiO2 - M2O5 and combinations thereof where M is selected from Zr, Ti, Al, Nb, Y, Sn, In, Ta and Sb.
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公开(公告)号:DE3379604D1
公开(公告)日:1989-05-18
申请号:DE3379604
申请日:1983-09-20
Applicant: IBM
Inventor: JONES FLETCHER
IPC: H01L21/027 , G03F7/20 , H01J37/317
Abstract: Proximity effect is reduced or eliminated by breaking each shape of a lithographic exposure pattern into two parts, a perimeter part having a width on the order of the lithographic exposure pattern minimum linewidth and the remaining central part or parts (if any) which are completely surrounded by the perimeter part. Figure 2 shows the edge parts hatched and the centre part blank. The lithographic exposure pattern is then modified by moving or setting back the edges of each central part away from the perimeter part which surrounds it (similar to reducing the size of the central part) to form a nominally unexposed band separating each central part from the perimeter part which surrounds it. This is shown in Fig. 3.The width of the nominally unexposed band in the modified exposure pattern is preferably chosen as large as possible so long as the condition is met that upon developing a radiation sensitive layer directly exposed to the modified exposure pattern, the nominally unexposed band develops (i.e., dissolves, resists dissolution, or is otherwise modified) substantially as if it were also exposed. The nominally unexposed band is exposed, in fact, by electrons scattered from the directly exposed part(s) of the shape (the perimeter part plus the central part, if any). The width of the nominally unexposed band is preferably about twice the edge bias applied to outside edges of each shape.
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