APPARATUS AND METHOD FOR CONFINED AREA PLANARIZATION

    公开(公告)号:MY144403A

    公开(公告)日:2011-09-15

    申请号:MYPI20083826

    申请日:2007-03-27

    Applicant: LAM RES CORP

    Abstract: A PROXIMITY HEAD AND ASSOCIATED METHOD OF USE IS PROVIDED FOR PERFORMING CONFINED AREA PLANARIZATION OF A SEMICONDUCTOR WAFER (223). THE PROXIMITY HEAD INCLUDES A CHAMBER (215) DEFINED TO MAINTAIN AN ELECTROLYTE SOLUTION (211). A CATHODE (213) IS DISPOSED WITHIN THE CHAMBER IN EXPOSURE TO THE ELECTROLYTE SOLUTION. A CATION EXCHANGE MEMBRANE (221) IS DISPOSED OVER A LOWER OPENING OF THE CHAMBER. A TOP SURFACE OF THE CATION EXCHANGE MEMBRANE IS IN DIRECT EXPOSURE TO THE ELECTROLYTE SOLUTION TO BE MAINTAINED WITHIN THE CHAMBER. A FLUID SUPPLY CHANNEL (227) IS DEFINED TO EXPEL FLUID AT A LOCATION ADJACENT TO A LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE. A VACUUM CHANNEL (225) IS DEFINED TO PROVIDE SUCTION AT A LOCATION ADJACENT TO THE LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE, SUCH THAT THE FLUID TO BE EXPELLED FROM THE FLUID SUPPLY CHANNEL IS MADE TO FLOW OVER THE LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE.

    ELECTROPLATING HEAD AND METHOD FOR OPERATING THE SAME

    公开(公告)号:MY159475A

    公开(公告)日:2017-01-13

    申请号:MYPI20052852

    申请日:2005-06-22

    Applicant: LAM RES CORP

    Abstract: AN ELECTROPLATING HEAD (100) INCLUDING A CHAMBER (105) HAVING A FLUID ENTRANCE (111) AND A FLUID EXIT (112) IS PROVIDED. THE CHAMBER IS CONFIGURED TO CONTAIN A FLOW OF ELECTROPLATING SOLUTION FROM THE FLUID ENTRANCE TO THE FLUID EXIT. THE ELECTROPLATING HEAD ALSO INCLUDES AN ANODE (115A,115B) DISPOSED WITHIN THE CHAMBER (105A,105B). THE ANODE IS CONFIGURED TO BE ELECTRICALLY CONNECTED TO A POWER SUPPLY (117). THE ELECTROPLATING HEAD FURTHER INCLUDES A POROUS RESISTIVE MATERIAL (119) DISPOSED AT THE FLUID EXIT SUCH THAT THE FLOW OF ELECTROPLATING SOLUTION IS REQUIRED TO TRAVERSE THROUGH THE POROUS RESISTIVE MATERIAL.

    APPARATUS AND METHOD FOR CONFINED AREA PLANARIZATION

    公开(公告)号:MY147290A

    公开(公告)日:2012-11-30

    申请号:MYPI20111318

    申请日:2007-03-27

    Applicant: LAM RES CORP

    Abstract: A PROXIMITY HEAD AND ASSOCIATED METHOD OF USE IS PROVIDED FOR PERFORMING CONFINED AREA PLANARIZATION OF A SEMICONDUCTOR WAFER (223). THE PROXIMITY HEAD INCLUDES A CHAMBER (215) DEFINED TO MAINTAIN AN ELECTROLYTE SOLUTION (211). A CATHODE (213) IS DISPOSED WITHIN THE CHAMBER IN EXPOSURE TO THE ELECTROLYTE SOLUTION. A CATION EXCHANGE MEMBRANE (221) IS DISPOSED OVER A LOWER OPENING OF THE CHAMBER. A TOP SURFACE OF THE CATION EXCHANGE MEMBRANE IS IN DIRECT EXPOSURE TO THE ELECTROLYTE SOLUTION TO BE MAINTAINED WITHIN THE CHAMBER. A FLUID SUPPLY CHANNEL (227) IS DEFINED TO EXPEL FLUID AT A LOCATION ADJACENT TO A LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE. A VACUUM CHANNEL (225) IS DEFINED TO PROVIDE SUCTION AT A LOCATION ADJACENT TO THE LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE, SUCH THAT THE FLUID TO BE EXPELLED FROM THE FLUID SUPPLY CHANNEL IS MADE TO FLOW OVER THE LOWER SURFACE OF THE CATION EXCHANGE MEMBRANE.

    Electroplating head and method for operating the same

    公开(公告)号:SG118432A1

    公开(公告)日:2006-01-27

    申请号:SG200504758

    申请日:2005-06-28

    Applicant: LAM RES CORP

    Abstract: An electroplating head including a chamber having a fluid entrance and a fluid exit is provided. The chamber is configured to contain a flow of electroplating solution from the fluid entrance to the fluid exit. The electroplating head also includes an anode disposed within the chamber. The anode is configured to be electrically connected to a power supply. The electroplating head further includes a porous resistive material disposed at the fluid exit such that the flow of electroplating solution is required to traverse through the porous resistive material.

    Method and apparatus for plating semiconductor wafers

    公开(公告)号:SG118429A1

    公开(公告)日:2006-01-27

    申请号:SG200504752

    申请日:2005-06-28

    Applicant: LAM RES CORP

    Abstract: First and second electrodes (107A,107B) are disposed at first and second locations, respectively, proximate to a periphery of a wafer support, wherein the first and second location are substantially opposed to each other relative to the wafer support. Each of the first and second electrodes can be moved to electrically connect with and disconnect from a wafer (101) held by the wafer support. An anode (109) is disposed over and proximate to the wafer such that a meniscus of electroplating solution is maintained between the anode and the wafer. As the anode moves over the wafer from the first location to the second location, an electric current is applied through the meniscus (111) between the anode and the wafer. Also, as the anode is moved over the wafer, the first and second electrodes are controlled to connect with the wafer while ensuring that the anode does not pass over an electrode that is connected.

    APPARATUS FOR THE REMOVAL OF A METAL OXIDE FROM A SUBSTRATE AND METHODS THEREFOR

    公开(公告)号:MY147419A

    公开(公告)日:2012-12-14

    申请号:MYPI20080850

    申请日:2006-09-22

    Applicant: LAM RES CORP

    Abstract: 17 APPARATUS FOR THE REMOVAL OF A METAL OXIDE FROM A SUBSTRATE AND METHODS THEREFOR ABSTRACT OF THE DISCLOSURE AN APPARATUS GENERATING A PLASMA FOR REMOVING METAL OXIDE FROM A SUBSTRATE IS 5 DISCLOSED. THE EMBODIMENT INCLUDES A POWERED ELECTRODE ASSEMBLY, INCLUDING A POWERED ELECTRODE, A FIRST DIELECTRIC LAYER, AND A FIRST WIRE MESH DISPOSED BETWEEN THE POWERED ELECTRODE AND THE FIRST DIELECTRIC LAYER. THE EMBODIMENT ALSO INCLUDES A GROUNDED ELECTRODE ASSEMBLY DISPOSED OPPOSITE THE POWERED ELECTRODE ASSEMBLY SO AS TO FORM A CAVITY WHEREIN THE PLASMA IS GENERATED, THE FIRST WIRE MESH BEING SHIELDED FROM THE PLASMA BY THE FIRST DIELECTRIC LAYER WHEN 10 THE PLASMA IS PRESENT IN THE CAVITY, THE CAVITY HAVING AN OUTLET AT ONE END FOR PROVIDING THE PLASMA TO REMOVE THE METAL OXIDE.

    ELECTROPLATING HEAD AND METHOD FOR OPERATING THE SAME

    公开(公告)号:SG185337A1

    公开(公告)日:2012-11-29

    申请号:SG2012079166

    申请日:2005-06-28

    Applicant: LAM RES CORP

    Abstract: 235An electroplating head including a chamber having a fluid entrance and afluid exit is provided. The chamber is configured to contain a flow of electroplating solution from the fluid entrance to the fluid exit. The electroplating head also includes an anode disposed within the chamber. The anode is configured10 to be electrically connected to a power supply. The electroplating head further includes a porous resistive material disposed at the fluid exit such that the flow of electroplating solution is required to traverse through the porous resistive material. [Figure 1]

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