Abstract:
본 발명은 열차가 통과되는 터널 벽체구조에 있어서, 터널(10)이 형성된 터널벽(20); 상기 터널(10)과 연통되고, 일정한 체적이 형성된 내부공간(31); 상기 내부공간(31)을 차폐시키는 차폐부재(35)를 포함하고, 상기 차폐부재(35)의 질량에서 발생하는 강성 및 상기 내부공간(31)의 체적에 담긴 공기의 탄성에 관련된 강성이 상호 작용되어 상기 열차에 의해 발생된 압력파를 저감시키는 저감유닛(30)을 포함하고, 차폐부재의 질량, 강성 및 내부공간의 체적에 의한 상호작용에 의해 상기 터널 내부에서 발생되는 초저주파수의 압력파 또는 미기압파를 효과적으로 저감시킴으로서, 승객 귀에서의 압박감 및 터널 출입구 주변에서의 충격성 환경 압력파를 저감시키는 효과가 있다.
Abstract:
PURPOSE: A semiconductor device including a vertical gate transistor without a junction and a manufacturing method thereof are provided to improve productivity by implanting one impurity to a source, a drain, and a body without the complexity of an impurity implantation process. CONSTITUTION: An active pillar (120) vertically protrudes from a substrate (110). The active pillar includes a first impurity region (120a), a second impurity region (120b), and a third impurity region (120c). The second impurity region is interposed between the first impurity region and the second impurity region. The first to third impurity regions include impurities with the same polarities. A gate electrode (160) is formed on the sidewall of the second impurity region. A bit line crosses the gate electrode and comes into contact with the first impurity region.
Abstract:
The present invention relates to an electron-hole bilayer tunnel field effect transistor having a symmetric PMOS and NMOS double gate structure and a fabrication method for the same. The electron-hole bilayer tunnel field effect transistor increases an operation current and a gradient under a threshold voltage by using a double gate p-i-n structure and tunneling between bands and reduces supply power by decreasing the threshold voltage which has a symmetric double gate structure which can be realized by a gate of a symmetric structure.
Abstract:
본 발명은 대칭적인 PMOS 및 NMOS 이중 게이트 구조를 가지는 전자-정공 이중층 터널 전계효과 트랜지스터 및 상기 트랜지스터의 제조방법에 관한 것으로, 이중 게이트 pin구조 및 밴드간 터널링을 이용한 것으로서 문턱전압 이하에서의 기울기의 개선과 동작 전류의 증가를 가져올 수 있고, 대칭구조의 게이트를 제안함으로써 실제 구현가능한 대칭적인 이중 게이트 구조를 가지는 임계 전압(threshold voltage)이 작아져 공급 전력을 줄일 수 있다는 장점이 있는 전자-정공 이중층 터널 전계효과 트랜지스터 및 상기 트랜지스터의 제조방법에 관한 것이다.
Abstract:
The present invention relates to an electron-hole bilayer tunnel field effect transistor using a symmetrical double gate structure and a manufacturing method of the transistor and, more specifically, to an electron-hole bilayer tunnel field effect transistor using a symmetrical double gate structure and a manufacturing method of the transistor, capable of bringing the improvement of a slope and an increase in an operation current under a threshold voltage by using a double gate p-i-n structure and inter-band tunneling; and being formed in practice by suggesting the symmetrical gate structure.
Abstract:
Provided are a method for fabricating vertical-type silicon nanowires using a metal assisted chemical etching method, a nanostructure fabricated by the method, and a device including the same. The method for fabricating vertical-type silicon nanowires using a metal assisted chemical etching method according to the present invention fabricates nanowires which are densely arranged and long in order to utilize the nanowires efficiently. When silicon nanowires having a large aspect ratio are fabricated, leaning of the nanowires may occur and as a result, adjacent nanowires may agglomerate together. In order to prevent the adjacent nanowires from agglomerating during a metal assisted chemical etching process, the method for fabricating vertical-type silicon nanowires according to the present invention fabricates a mechanically stable structure to prevent the nanowires from leaning.