THIN-FILM FORMING RAW MATERIAL USED IN ATOMIC LAYER DEPOSITION METHOD AND METHOD OF PRODUCING THIN-FILM

    公开(公告)号:US20230151220A1

    公开(公告)日:2023-05-18

    申请号:US17915270

    申请日:2021-03-18

    CPC classification number: C09D1/00 C07F5/00 C23C16/40 C23C16/407 C23C16/45525

    Abstract: Provided is a thin-film forming raw material, which is used in an atomic layer deposition method, including a compound represented, by the following formula (1) :





    where R1 and R2 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, L represents a group represented by the following formula (L-1) or (L-2), and M represents an indium atom or a gallium atom;





    where R11 and R12 each independently represent a hydrogen atom, a fluorine atom, an alkyl group having 1 to 5 carbon atoms, or an alkoxy group having 1 to 5 carbon atoms, and * represents a bonding position with M in the formula (1);





    where R21 to R23 each independently represent a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, and * represents a bonding position with M in the formula (1), provided that R21 and R22 represent different groups.

    RUTHENIUM COMPOUND, THIN-FILM FORMING RAW MATERIAL, AND METHOD OF PRODUCING THIN FILM

    公开(公告)号:US20220372056A1

    公开(公告)日:2022-11-24

    申请号:US17620934

    申请日:2020-06-10

    Abstract: The present invention provides a ruthenium compound represented by the following general formula (1) or (2), a thin-film forming raw material containing the ruthenium compound, and a method of producing a thin-film including using the thin-film forming raw material: where R1 to R12 each independently represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorine atom-containing group, and “n” represents an integer from 0 to 2, provided that at least one of R1 to R12 represents the fluorine atom-containing group; where R13 to R17 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, and a total number of the carbon atoms of R11 to R17 is 3 or more.

    METHOD FOR PRODUCING METALLIC RUTHENIUM THIN FILM BY ATOMIC LAYER DEPOSITION

    公开(公告)号:US20220002867A1

    公开(公告)日:2022-01-06

    申请号:US17291446

    申请日:2019-10-28

    Abstract: A method of the present invention for producing a metallic ruthenium thin film on a substrate by atomic layer deposition includes: (A) a step of introducing a feedstock gas containing a specific ruthenium compound into a treatment atmosphere, and allowing the ruthenium compound to deposit on the substrate; and a step of introducing a reactive gas containing a specific compound into the treatment atmosphere, and allowing the reactive gas to react with the specific ruthenium compound deposited on the substrate.

    COBALT COMPOUND, THIN FILM-FORMING RAW MATERIAL, AND METHOD FOR PRODUCING THIN FILM
    14.
    发明申请
    COBALT COMPOUND, THIN FILM-FORMING RAW MATERIAL, AND METHOD FOR PRODUCING THIN FILM 审中-公开
    钴化合物,薄膜成形原料和生产薄膜的方法

    公开(公告)号:US20170050998A1

    公开(公告)日:2017-02-23

    申请号:US15306807

    申请日:2015-03-31

    CPC classification number: C07F15/065 C07F15/06 C23C16/18 C23C16/44

    Abstract: The cobalt compound of this invention is represented by general formula (I) below. In general formula (I), R1 to R3 independently represent a straight chain or branched alkyl group having 1 to 5 carbon atoms. In addition, the thin film-forming raw material of this invention contains the cobalt compound represented by general formula (I). According to this invention, it is possible to provide a cobalt compound which can be transported in the form of a liquid due to having a low melting point, which can be decomposed at a low temperature and which can be easily vaporized due to having a high vapor pressure; and a thin film-forming raw material that uses this cobalt compound.

    Abstract translation: 根据本发明的钴化合物由通式(I)表示。 在通式(I)中,R 1至R 3独立地表示具有1至5个碳原子的直链或支链烷基。 根据本发明的用于形成薄膜的原料含有由通式(I)表示的钴化合物。 本发明可以提供:具有低熔点并因此可以以液态运输并且可以在低温下分解并且还具有高蒸气压并因此容易蒸发的钴化合物; 以及使用钴化合物制备的用于形成薄膜的原料。

    RUTHENIUM COMPOUND, MATERIAL FOR THIN FILM FORMATION, AND PROCESS FOR THIN FILM FORMATION
    20.
    发明申请
    RUTHENIUM COMPOUND, MATERIAL FOR THIN FILM FORMATION, AND PROCESS FOR THIN FILM FORMATION 审中-公开
    稀土化合物,薄膜形成材料,薄膜形成方法

    公开(公告)号:US20160272664A1

    公开(公告)日:2016-09-22

    申请号:US15032230

    申请日:2014-11-07

    Abstract: Disclosed is a ruthenium compound useful as a precursor in chemical vapor growth, particularly ALD. The compound has good reactivity with a reactive gas, a high vapor pressure, and a low melting point. The compound is represented by general formula (I), wherein R1, R2, and R3 each independently represent a straight or branched chain alkyl group having 1 to 5 carbon atoms, provided that the total number of the carbon atoms of R1 and R2 is 3 to 10. In formula (I), R1 and R2 are each preferably ethyl or isopropyl.

    Abstract translation: 公开了可用作化学气相生长中的前体的钌化合物,特别是ALD。 该化合物与反应性气体具有良好的反应性,高蒸气压和低熔点。 该化合物由通式(I)表示,其中R 1,R 2和R 3各自独立地表示具有1至5个碳原子的直链或支链烷基,条件是R 1和R 2的总碳原子数为3 式(I)中,R 1和R 2各自优选为乙基或异丙基。

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