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公开(公告)号:US20230304154A1
公开(公告)日:2023-09-28
申请号:US18014371
申请日:2021-06-25
Applicant: ADEKA CORPORATION
Inventor: Atsushi SAKURAI , Masako HATASE , Nana OKADA , Ryota FUKUSHIMA
IPC: C23C16/455 , C23C16/18
CPC classification number: C23C16/45553 , C23C16/18
Abstract: The present invention provides an alkoxide compound represented by the following general formula (1), a thin-film forming raw material containing the compound, and a method of producing a thin-film:
where R1 and R2 each independently represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorine atom-containing alkyl group having 1 to 5 carbon atoms, R3 and R4 each independently represent an alkyl group having 1 to 5 carbon atoms, or a fluorine atom-containing alkyl group having 1 to 5 carbon atoms, R5 represents a hydrogen atom, a fluorine atom-containing group, or an alkyl group having 1 to 5 carbon atoms, R6 represents a fluorine atom-containing group, M represents a metal atom or a semimetal atom, and “n” represents the valence of the atom represented by M, provided that when M represents a copper atom, R3 and R4 each independently represent an alkyl group having 1 or 2 carbon atoms, and R5 represents a hydrogen atom.-
2.
公开(公告)号:US20180282358A1
公开(公告)日:2018-10-04
申请号:US15996693
申请日:2018-06-04
Applicant: ADEKA CORPORATION
Inventor: Atsushi SAKURAI , Masako HATASE , Tomoharu YOSHINO , Masaki ENZU
IPC: C07F15/06 , C07F7/10 , C07C251/08 , C07C251/76 , C23C16/18 , C07F15/04 , C07F7/08
Abstract: The alkoxide compound of the present invention is characteristically represented by the following general formula (I):
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3.
公开(公告)号:US20240352044A1
公开(公告)日:2024-10-24
申请号:US18757905
申请日:2024-06-28
Applicant: ADEKA Corporation
Inventor: Nana OKADA , Masako HATASE , Akihiro NISHIDA , Atsushi SAKURAI
IPC: C07F5/00 , C23C16/40 , C23C16/455
CPC classification number: C07F5/003 , C23C16/405 , C23C16/45525
Abstract: The present invention provides a metal alkoxide compound represented by the following general formula (1), a thin-film-forming raw material containing the same, and a thin film production method of forming a metal-containing thin film using the raw material:
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4.
公开(公告)号:US20240318304A1
公开(公告)日:2024-09-26
申请号:US18575951
申请日:2022-06-27
Applicant: ADEKA CORPORATION
Inventor: Chiaki MITSUI , Masako HATASE
IPC: C23C16/18
CPC classification number: C23C16/18
Abstract: A compound is represented by the following general formula (1), a thin-film forming raw material including the compound, a thin-film, and a method of producing a thin-film:
wherein R1 to R4 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, R5 and R6 each independently represent an alkyl group having 1 to 5 carbon atoms, A represents an alkanediyl group having 1 to 5 carbon atoms, L represents a group represented by the general formula (L-1) or (L-2) described herein, and M represents a hafnium atom, a zirconium atom, or a titanium atom, provided that in a case of a compound in which R5 and R6 each represent a methyl group, A represents an alkanediyl group having 2 carbon atoms, and M represents a titanium atom, L represents a group represented by the general formula (L-2).-
公开(公告)号:US20240018654A1
公开(公告)日:2024-01-18
申请号:US18036975
申请日:2021-11-16
Applicant: ADEKA CORPORATION
Inventor: Akihiro NISHIDA , Masako HATASE , Tomoharu YOSHINO , Yoshiki OOE , Chiaki MITSUI
IPC: C23C16/455 , C23C16/40
CPC classification number: C23C16/45553 , C23C16/405
Abstract: Provided is a method of producing a thin-film containing a zirconium atom on a surface of a substrate by an atomic layer deposition method, including: a step 1 of causing a raw material gas obtained by vaporizing a thin-film forming raw material containing a zirconium compound represented by the following general formula (1) to adsorb to the surface of the substrate to form a precursor thin-film; a step 2 of evacuating the raw material gas remaining unreacted; and a step 3 of causing the precursor thin-film to react with a reactive gas at a temperature of 240° C. or more and 450° C. or less to form the thin-film containing a zirconium atom on the surface of the substrate:
wherein R1 and R2 each independently represent a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, and R3 and R4 each independently represent an alkyl group having 1 to 3 carbon atoms, provided that a zirconium compound in which both of R1 and R2 represent hydrogen atoms is excluded.-
公开(公告)号:US20250019820A1
公开(公告)日:2025-01-16
申请号:US18708639
申请日:2022-11-07
Applicant: ADEKA CORPORATION
Inventor: Ryota FUKUSHIMA , Masaki ENZU , Chiaki MITSUI , Nana OKADA , Masako HATASE
IPC: C23C16/18 , C23C16/455
Abstract: Provided is a thin-film forming raw material, which is used in an atomic layer deposition method, including a ruthenium compound represented by the following general formula (1): wherein R1 represents a hydrogen atom or a methyl group, and R2 and R3 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms.
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7.
公开(公告)号:US20240425975A1
公开(公告)日:2024-12-26
申请号:US18695108
申请日:2022-09-20
Applicant: ADEKA CORPORATION
Inventor: Masako HATASE , Keisuke TAKEDA , Chiaki MITSUI
IPC: C23C16/18 , C07F11/00 , C23C16/44 , C23C16/448 , C23C16/455
Abstract: A thin-film forming raw material contains a molybdenum compound represented by the following general formula (1), a method of forming a thin-film through use of the thin-film forming raw material, and a molybdenum compound having a specific structure: where R1 represents an alkyl group having 1 to 5 carbon atoms or a fluorine atom-containing alkyl group having 1 to 5 carbon atoms, L1 represents a group represented by the following general formula (L-1) or (L-2), and “n” represents an integer of from 1 to 4, provided that when “n” represents 4, R1 represents a fluorine atom-containing alkyl group having 1 to 5 carbon atoms; where R2 to R12 each independently represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorine atom-containing alkyl group having 1 to 5 carbon atoms, and * represents a bonding site.
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公开(公告)号:US20240301553A1
公开(公告)日:2024-09-12
申请号:US18571903
申请日:2022-06-17
Applicant: ADEKA CORPORATION
Inventor: Masako HATASE , Chiaki MITSUI , Atsushi YAMASHITA
IPC: C23C16/455 , C23C16/18
CPC classification number: C23C16/45553 , C23C16/18
Abstract: Provided is a thin-film forming raw material, including an alkoxide compound represented by the following general formula (1):
where R1 to R4 each independently represent an alkyl group having 1 to 5 carbon atoms, M represents a rare earth metal atom, and “n” represents a valence of the rare earth metal atom.-
9.
公开(公告)号:US20230349039A1
公开(公告)日:2023-11-02
申请号:US18026488
申请日:2021-09-08
Applicant: ADEKA CORPORATION
Inventor: Masako HATASE , Chiaki MITSUI
IPC: C23C16/18 , C23C16/455 , C23C16/52
CPC classification number: C23C16/18 , C23C16/45527 , C23C16/45553 , C23C16/52
Abstract: Provided is a thin-film forming raw material, which is used in an atomic layer deposition method, including an yttrium compound represented by the following general formula (1):
where R1 represents a secondary alkyl group having 3 to 8 carbon atoms, R2 represents a tertiary alkyl group having 4 to 8 carbon atoms, and R3 represents a hydrogen atom, or a primary, secondary, or tertiary alkyl group having 1 to 5 carbon atoms.-
公开(公告)号:US20180134739A1
公开(公告)日:2018-05-17
申请号:US15861719
申请日:2018-01-04
Applicant: ADEKA CORPORATION
Inventor: Atsushi SAKURAI , Masako HATASE , Naoki YAMADA , Tsubasa SHIRATORI , Akio SAITO , Tomoharu YOSHINO
IPC: C07F15/06 , C23C16/40 , C23C16/18 , C07C251/04 , C07F15/04 , C07F1/08 , C07C251/08 , C07F7/28
CPC classification number: C07F15/065 , C07C251/04 , C07C251/08 , C07F1/08 , C07F7/28 , C07F15/045 , C23C16/18 , C23C16/406 , C23C16/408
Abstract: Disclosed is a metal alkoxide compound having physical properties suitable for a material for forming thin films by CVD, and particularly, a metal alkoxide compound having physical properties suitable for a material for forming metallic-copper thin films. A metal alkoxide compound is represented by general formula (I). A thin-film-forming material including the metal alkoxide compound is described as well. (In the formula, R1 represents a methyl group or an ethyl group, R2 represents a hydrogen atom or a methyl group, R3 represents a C1-3 linear or branched alkyl group, M represents a metal atom or a silicon atom, and n represents the valence of the metal atom or silicon atom.
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