DYNAMIC READ-OUT METHOD FOR MEMORY CELL, ESPECIALLY MULTI-LEVEL NON-VOLATILE MEMORY CELL, AND CIRCUIT

    公开(公告)号:JP2002260395A

    公开(公告)日:2002-09-13

    申请号:JP2002006591

    申请日:2002-01-15

    Abstract: PROBLEM TO BE SOLVED: To provide a method and a circuit which is operated appropriately only when a cell current exists though it is minute and which reads out a multi- level memory cell. SOLUTION: A method for reading out a memory cell is based on time integration of current supplied to a memory cell by a capacitive element. The capacitive element is charged first, after that, linear-discharged within a time previously set. During this period, the memory cell is in a biased state by a fixed voltage. In a first operation mode, a first capacitor (22) and a second capacitor (23) are charged respectively to a first charge value and a second charge value first. The second capacitor is discharged with a fixed current within a time previously decided through the memory cell. The first charge value is divided by the first capacitor and the second capacitor, after that, divided electric charges are measured.

    VOLTAGE ADJUSTING CIRCUIT
    12.
    发明专利

    公开(公告)号:JP2001042955A

    公开(公告)日:2001-02-16

    申请号:JP2000199353

    申请日:2000-06-30

    Abstract: PROBLEM TO BE SOLVED: To obtain a stable voltage adjusting circuit simple in configuration. SOLUTION: This circuit is equipped with voltage dividers R1 and R2 which are connected between 1st and 2nd output terminals VDD of a source voltage generator and GND, have input terminals IN and output terminals OUT, and are connected between an output node connected to the output terminals OUT and 2nd terminals GND and an operational amplifier OP which has an inverted input terminal connected to the input terminals, an uninverted input terminal connected to an intermediate node of the voltage dividers, and an output terminal for driving a 1st field effect transistor MPU between the output node and 1st terminals; and the output terminal of the operational amplifier is connected to the output node through a compensating network COMP, and a 2nd field effect transistor MPD which is connected between the output node and the 2nd terminals and has a control terminal is provided and has its gate terminal connected to a constant-voltage generating circuit.

    METHOD FOR READING-OUT MULTI-LEVEL NON-VOLATILE MEMORY AND MULTI-LEVEL NON-VOLATILE MEMORY

    公开(公告)号:JP2000251480A

    公开(公告)日:2000-09-14

    申请号:JP2000049429

    申请日:2000-02-25

    Abstract: PROBLEM TO BE SOLVED: To provide a read-out method and a memory by which a multi-level cell can be read out quickly and reliably. SOLUTION: Reading circuits 30, 31, 32 comparing the current flowing in a cell containing plural reference currents are not same mutually, but the compared current is made different and amplified. Especially, the reading circuit 32 relating to the minimum reference current IR3 amplifies a cell current of other reading circuits 30, 31 or more until reaching respective reference current 33c. Thereby, current dynamics is increased, read-out voltage can be kept at a low level. Thus, an intrinsic characteristic of the minimum reference current IR3 is near a characteristic of a memory cell distribution IM3 or in the characteristic, possibility of discrimination among different logic levels is reduced.

    CIRCUIT DEVICE
    15.
    发明专利

    公开(公告)号:JP2000113689A

    公开(公告)日:2000-04-21

    申请号:JP28002499

    申请日:1999-09-30

    Abstract: PROBLEM TO BE SOLVED: To erase a load charge voltage with a column format memory matrix by comprising a PMOS type first transistor having a conductive terminal in which one is connected to a main word line and the other is connected to a local word line, a NMOS type second transistor having a conductive terminal in which one is connected to a local word line and the other is connected to the reference voltage. SOLUTION: A storage device 1 is connected in the upstream of each local row LWL of a memory matrix within each sector of a non-volatile memory matrix. The storage device 1 includes the PMOS type transistor M1 connected to the conductive terminal between the main word line MWL and local word line LWL and the NMOS type transistor M3 connected to the conductive terminal between the local word line LWL and reference voltage GND. The gate terminals of all transistor M3 of the storage device 1 are all connected together to receive a voltage signal. Thereby, row decoding of the hierarchical structure may be realized.

    ROW DECODING CIRCUIT FOR ELECTRONIC MEMORY DEVICE AND METHOD OF CONTROLLING ROW DECODING STEP

    公开(公告)号:JPH11260083A

    公开(公告)日:1999-09-24

    申请号:JP37435898

    申请日:1998-12-28

    Abstract: PROBLEM TO BE SOLVED: To enable accurate operation in different conditions by providing a cascade-connected inverter of a hierarchical structure, a circuit for dynamically increasing step by step a read voltage level, a first means for increasing a read voltage level to a particular voltage and a second means for increasing a read voltage level to the other particular voltage. SOLUTION: A first means increases a read voltage level to a value equal to the supply voltage + threshold voltage and a second means increases a read voltage level to a value equal to the supply voltage +2 × threshold voltage. A memory row is selected by simultaneously setting the pre-decoding signals LX, LY, LZ and P to high logical values to form a first decoding final inverter 15 provided with the transistors M9 and M10. The voltage supplied to the designated rows of address is boosted to Vcc+2Vtp. In the rows not designated, the voltage Vcc+Vtp is transferred to the center node Xc of the transistors M9 and M10.

    STORING AND READING METHOD OF DATA IN NON-VOLATILE MEMORY DEVICE

    公开(公告)号:JP2002124093A

    公开(公告)日:2002-04-26

    申请号:JP2001316940

    申请日:2001-10-15

    Abstract: PROBLEM TO BE SOLVED: To provide a storing method for enabling to increase storage capacitor of a non-volatile memory without pressing excessively requirement of read-out accuracy, complexness, and evaluation for danger. SOLUTION: A data control method is applied to a multiple level non-volatile memory device having a memory array 10 formed by plural memory cells 11. Each of the memory cell 11 stores, for example, plural bits being 3 other than integer power of 2. One data byte is stored in numbers of non-integer in the memory cell 11 in this method. In this control method, data words formed by plural byte are stored in the same clock cycle by programming the number previously decided of the adjacent memory cell 11. Read-out is programmed by reading out a stored data word in the same clock cycle.

    READ CIRCUIT FOR NONVOLATILE MEMORY

    公开(公告)号:JP2001084782A

    公开(公告)日:2001-03-30

    申请号:JP2000253119

    申请日:2000-07-21

    Abstract: PROBLEM TO BE SOLVED: To eliminate the drawback that reduction of read time is limited at a low supply voltage. SOLUTION: A read circuit 1' comprises an array branch 6 having an input array node 22 connected, via an array bit line 8, to an array cell 10; a reference branch 12 having an input reference node 32 connected, via a reference bit line 14, to a reference cell 16; a current-to-voltage converter 18 connected to an output array node 56 of the array branch and to an output reference node of the reference branch to supply on both nodes 56, 58 the respective electric potentials VM, VR correlated to the currents flowing in both cells 10, 16; and a comparator 19 connected at input to both nodes 56, 58 and supplying as output a signal OUT indicative of the contents stored in the array memory cell 10; and an array decoupling stage 80 arranged between both array nodes 22, 56 to decouple both array nodes 22, 56 from one another.

    READ-OUT CIRCUIT FOR NON-VOLATILE MEMORY

    公开(公告)号:JP2001014879A

    公开(公告)日:2001-01-19

    申请号:JP2000171988

    申请日:2000-06-05

    Inventor: MICHELONI RINO

    Abstract: PROBLEM TO BE SOLVED: To bias a drain terminal simply, economically, and accurately independently of power source voltage and operation temperature, in a bias section for biasing a drain terminal of a non-volatile memory cell during a phase of read-out. SOLUTION: A read-out circuit 50 is provided with a bias section 12 and an adjusting circuit 52. The bias section 12 is connected to a memory cell 6 to be read out, and gives bias to a drain terminal of the memory cell 6 at an operation potential previously set. The adjusting circuit 52 is connected to a power source line 2 set to power source voltage VCC, and supplies a stable bias current IP to the bias section 12 even if temperature and power source voltage VCC are fluctuated.

    DEVICE AND METHOD FOR READING NON-VOLATILE MEMORY CELL

    公开(公告)号:JP2000057789A

    公开(公告)日:2000-02-25

    申请号:JP15223299

    申请日:1999-05-31

    Abstract: PROBLEM TO BE SOLVED: To reduce the complexity in the design and control of a reference cell by comparing charge states with each other, and by generating a two-bit signal for coding the charge states by the output. SOLUTION: In the case of both erased memory cells, even when cells F1 and F2 adsorb different current, mirroring is made in first and second current mirror circuits 19, 20, 33, and 34, and voltages 01 and 02 are set to a high level for corresponding to a logic state '11'. In the written cells F1 and F2, the cells do not adsorb current, and current being mirrored in first and second current mirror circuits 19, 20, 22, and 23 is insufficient to reduce the voltage in I/O nodes 41a and 41b. The output voltages 01 and 02 correspond to a logic state '00'. In the case of the cells F1 and F2 being similarly erased and written, respectively, and in the case of the cells F1 and F2 being written and erased, respectively, the each logic state is set to '10' or '01'.

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