Abstract:
To provide a wiring board excellent in connection reliability with a semiconductor chip. A first buildup layer 31 where resin insulating layers 21 and 22 and a conductor layer 24 are laminated is formed at a substrate main surface 11 side of an organic wiring board 10. The conductor layer 24 for an outermost layer in the first buildup layer 31 includes a plurality of connecting terminal portions 41 for flip-chip mounting a semiconductor chip. The plurality of connecting terminal portions 41 is exposed through an opening portion 43 of a solder resist layer 25. Each connecting terminal portion 41 includes a connection region 51 for a semiconductor chip and a wiring region 52 disposed to extend from the connection region 51 along the planar direction. The solder resist layer 25 includes, within the opening portion 43, a side-surface covering portion 55 that covers the side surface of the connecting terminal portion 41 and a projecting wall portion 56 that is integrally formed with the side-surface covering portion 55 and disposed to project so as to intersect with the connection region 51.
Abstract:
There is provided a wiring substrate (1). The wiring substrate includes: a heat sink (10); an insulating layer (20) on the heat sink; a reflective layer (30) on the insulating layer; a wiring pattern (40) embedded in the reflective layer and including a first surface (40A), a second surface opposite to the first surface and a side surface, the second surface and the side surface contacting the reflective layer; and a metal layer (50) on the first surface of the wiring pattern, wherein an exposed surface (50A) of the metal layer is flush with an exposed surface of the reflective layer.
Abstract:
A contact piece of a gold finger comprises: a first main body segment; a second main body segment; and a transition segment connected to the first main body segment and the second main body segment, respectively, in a vertical direction, in which an upper edge and a lower edge of the transition segment are inclined with respect to a lateral direction respectively. A gold finger and a connector comprising the same are also provided.
Abstract:
Disclosed are electrical connectors and methods of assembling an electrical connector having 'standard' (i.e., with electrical contacts having in-line tails), jogged (i.e., with electrical contacts having jogged tails but not connected orthogonally to another connector through a substrate), and/or 'orthogonal' (i.e., with electrical contacts having jogged tails that are used in an orthogonal application) leadframe assemblies in the same connector. This provides the flexibility of using some of the available contacts in an orthogonal application and, at the same time, having remaining contacts available for routing on the midplane PCB. Though this could be done using only orthogonal leadframe assemblies, the combination of standard leadframe assemblies with orthogonal leadframe assemblies creates additional spacing between the PCB vias, so that signal traces can be more easily routed on the midplane PCB.
Abstract:
A plurality of wiring patterns (12a-12f) are formed so as to extend in parallel with each other. A plurality of test terminals are formed in a substantially rectangular shape such that respective widths thereof increase toward respective one sides from respective ends of the plurality of wiring patterns. The plurality of test terminals in each group are arranged so as to be aligned along a length direction of the wiring patterns. The wiring patterns are formed so as to be longer in the order, and the test terminals are further away from a mounting region in the order. An interval (width of a plating resist) between the test terminals in each group and the wiring patterns in the other group adjacent thereto is set to decrease in the order. The invention also relates to a manufacturing method for said wiring patterns and test terminals.
Abstract:
A plasma display apparatus includes a panel (1) having two or three rows of contact pads (213,213') for contacting the electrodes of the panel. This allows to increase the width of the pads whilst maintaining the distances between the electrodes. Thereby, align tolerance can be secured.
Abstract:
Circuit board (10) is of substantially rectangular shape, provided in the upper half of the juxtaposed face (13) with a substantially circular test terminal (20). In the lower half are provided a plurality of substantially rectangular terminals (21-27), arrayed in two rows, i.e., an upper and lower row, the upper row containing an I/O terminal (21) for data input/output, a power supply terminal (22) for supplying power, and a chip select terminal (23) for input of a chip select signal CS. The lower row of juxtaposed face (13) contains a ground terminal (24), a read/write terminal (25) for inputting read/write control signals W/R, a clock terminal (26) for inputting a clock signal CLK, and a ground terminal (27).
Abstract:
Circuit board (10) is of substantially rectangular shape, provided in the upper half of the juxtaposed face (13) with a substantially circular test terminal (20). In the lower half are provided a plurality of substantially rectangular terminals (21-27), arrayed in two rows, i.e., an upper and lower row, the upper row containing an I/O terminal (21) for data input/output, a power supply terminal (22) for supplying power, and a chip select terminal (23) for input of a chip select signal CS. The lower row of juxtaposed face (13) contains a ground terminal (24), a read/write terminal (25) for inputting read/write control signals W/R, a clock terminal (26) for inputting a clock signal CLK, and a ground terminal (27).