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    21.
    发明专利
    未知

    公开(公告)号：DE69010634D1

    公开(公告)日：1994-08-18

    申请号：DE69010634

    申请日：1990-08-31

    Applicant: IBM

    Inventor： MARTIN YVES ,  WICKRAMASINGHE HEMANTHA KUMAR

    IPC: G01B21/30 ,  G01B11/30 ,  G01B15/00 ,  G01N21/00 ,  G01N21/31 ,  G01N23/00 ,  G01N37/00 ,  G01Q30/02 ,  G01Q60/24 ,  H01J37/26

    Abstract: An Atomic Photo-Absorption Force Microscope 1 includes an Atomic Force Microscope 10 and a radiation source 20 having an output radiation 22 wavelength selected to be preferentially absorbed by atoms or molecules associated with a sample surface 24a under investigation. Absorption of the radiation raises at least one outer shell electron to a higher energy level, resulting in an increase in radius of the atom or molecule. A tip 12 coupled through a lever 14 to the Atomic Force Microscope 10 is scanned over the surface and operates in conjunction with a laser heterodyne interferometer 18 to directly measure the resulting atomic or molecular increase of size, thereby detecting both the presence and location of the atoms or molecules under investigation. Operation in an a.c. mode by chopping the incident radiation 22 and measuring the corresponding a.c. induced tip movement beneficially increases the sensitivity of the technique, particularly if the a.c. frequency is chosen at a resonance of the tip-lever combination.

    Grid-line-free contact for a photovoltaic cell
    22.
    发明专利
    Grid-line-free contact for a photovoltaic cell 未知

    公开(公告)号：GB2488421B

    公开(公告)日：2013-11-20

    申请号：GB201202928

    申请日：2010-10-26

    Applicant: IBM

    Inventor： MOUMEN NAIM ,  MARTIN YVES ,  KESSEL THEODORE GERARD VAN ,  SANDSTROM ROBERT ,  GUHA SUPRATIK

    IPC: H01L31/0224 ,  H01L31/0687

    Abstract: Electrical contact to the front side of a photovoltaic cell is provided by an array of conductive through-substrate vias, and optionally, an array of conductive blocks located on the front side of the photovoltaic cell. A dielectric liner provides electrical isolation of each conductive through-substrate via from the semiconductor material of the photovoltaic cell. A dielectric layer on the backside of the photovoltaic cell is patterned to cover a contiguous region including all of the conductive through-substrate vias, while exposing a portion of the backside of the photovoltaic cell. A conductive material layer is deposited on the back surface of the photovoltaic cell, and is patterned to form a first conductive wiring structure that electrically connects the conductive through-substrate vias and a second conductive wiring structure that provides electrical connection to the backside of the photovoltaic cell.

    Homogenizing light-pipe for solar concentrators
    23.
    发明专利
    Homogenizing light-pipe for solar concentrators 未知

    公开(公告)号：GB2490389B

    公开(公告)日：2013-06-19

    申请号：GB201204933

    申请日：2012-03-21

    Applicant: IBM

    Inventor： MARTIN YVES ,  KESSEL THEODORE GERARD VAN ,  HAIGHT RICHARD ALAN

    IPC: H01L31/052

    Abstract: A light pipe that can be employed for a Concentrator Photo-Voltaic (CPV) system is provided. The light pipe homogenizes light by diffusion and/or refraction, and can be embodied in a structure that has a low aspect ratio. The diffusion and/or refraction can be effected by concave or convex surfaces of a transparent medium that forms a body of the light pipe, by light diffracting particles, and/or by a diffracting surface. Optionally, multiple transparent media can be employed with a refracting and/or diffracting interface therebetween. The reduced aspect ratio of the light pipe can improve reliability of mechanical alignment in the CPV system as well as reducing the cost of manufacturing and/or aligning the light pipe within the CPV system.

    Grid-line-free contact for a photovoltaic cell
    24.
    发明专利
    Grid-line-free contact for a photovoltaic cell 未知

    公开(公告)号：GB2488421A

    公开(公告)日：2012-08-29

    申请号：GB201202928

    申请日：2010-10-26

    Applicant: IBM

    Inventor： MOUMEN NAIM ,  MARTIN YVES ,  KESSEL THEODORE GERARD VAN ,  SANDSTROM ROBERT ,  GUHA SUPRATIK

    IPC: H01L31/0224 ,  H01L31/0687

    Abstract: Electrical contact to the front side of a photovoltaic cell is provided by an array of conductive through-substrate vias, and optionally, an array of conductive blocks located on the front side of the photovoltaic cell. A dielectric liner provides electrical isolation of each conductive through-substrate via from the semiconductor material of the photovoltaic cell. A dielectric layer on the backside of the photovoltaic cell is patterned to cover a contiguous region including all of the conductive through-substrate vias, while exposing a portion of the backside of the photovoltaic cell. A conductive material layer is deposited on the back surface of the photovoltaic cell, and is patterned to form a first conductive wiring structure that electrically connects the conductive through-substrate vias and a second conductive wiring structure that provides electrical connection to the backside of the photovoltaic cell.

    Method and apparatus for in situ solar flat panel diagnostics
    25.
    发明专利
    Method and apparatus for in situ solar flat panel diagnostics 未知

    公开(公告)号：GB2487881A

    公开(公告)日：2012-08-08

    申请号：GB201209027

    申请日：2010-10-18

    Applicant: IBM

    Inventor： GUHA SUPRATIK ,  MARTIN YVES ,  SANDSTROM ROBERT ,  KESSEL THEODORE GERARD VAN

    IPC: G01J1/42

    Abstract: Techniques for analyzing performance of solar panels and/or cells are provided. In one aspect, a method for analyzing an infrared thermal image taken using an infrared camera is provided. The method includes the following steps. The infrared thermal image is converted to temperature data. Individual elements are isolated in the infrared thermal image. The temperature data for each isolated element is tabulated. A performance status of each isolated element is determined based on the tabulated temperature data. The individual elements can include solar panels and/or solar cells. In another aspect, an infrared diagnostic system is provided. The infrared diagnostic system includes an infrared camera which can be remotely positioned relative to one or more elements to be imaged; and a computer configured to receive thermal images from the infrared camera, via a communication link, and analyze the thermal images.

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