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公开(公告)号:DE69630663D1
公开(公告)日:2003-12-18
申请号:DE69630663
申请日:1996-01-24
Applicant: ST MICROELECTRONICS SRL
Inventor: VILLA CORRADO , BEZ ROBERTO , CANTARELLI DANIELE , DALLABORA MARCO
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公开(公告)号:DE69626792D1
公开(公告)日:2003-04-24
申请号:DE69626792
申请日:1996-05-09
Applicant: ST MICROELECTRONICS SRL
Inventor: DALLABORA MARCO , VILLA CORRADO , DEFENDI MARCO
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公开(公告)号:DE69325443D1
公开(公告)日:1999-07-29
申请号:DE69325443
申请日:1993-03-18
Applicant: ST MICROELECTRONICS SRL
Inventor: CAMPARDO GIOVANNI , CRISENZA GIUSEPPE , DALLABORA MARCO
IPC: G11C17/00 , G11C16/04 , G11C16/06 , G11C16/30 , H01L21/8247 , H01L27/115
Abstract: To reduce the read and write errors caused by depleted memory array cells being turned on even when not selected, the nonselected memory cells are so biased as to present a floating terminal and a terminal at a positive voltage with respect to the substrate region. In this way, the threshold voltage of the above cells (the minimum voltage between the gate and source terminals for the cell to be turned on) increases due to the "body effect", whereby the threshold voltage depends, among other things, on the voltage drop between the cell terminal operating as the source and the substrate, and increases alongside an increase in the voltage drop.
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公开(公告)号:DE69632999D1
公开(公告)日:2004-09-02
申请号:DE69632999
申请日:1996-01-24
Applicant: ST MICROELECTRONICS SRL
Inventor: VILLA CORRADO , DALLABORA MARCO , CANE MARCELLO
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公开(公告)号:DE69626376T2
公开(公告)日:2003-12-04
申请号:DE69626376
申请日:1996-04-30
Applicant: ST MICROELECTRONICS SRL
Inventor: DALLABORA MARCO , VILLA CORRADO , BARTOLI SIMONE , DEFENDI MARCO
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公开(公告)号:DE69621770T2
公开(公告)日:2003-03-06
申请号:DE69621770
申请日:1996-03-22
Applicant: ST MICROELECTRONICS SRL
Inventor: VILLA CORRADO , DALLABORA MARCO , TASSAN CASER FABIO
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公开(公告)号:DE69428516D1
公开(公告)日:2001-11-08
申请号:DE69428516
申请日:1994-03-28
Applicant: ST MICROELECTRONICS SRL
Inventor: DALLABORA MARCO , SALI MAURO LUIGI , TASSAN CASER FABIO , VILLA CORRADO
IPC: H01L21/8247 , G11C16/04 , G11C16/16 , H01L27/115 , H01L29/788 , H01L29/792 , G11C16/06
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公开(公告)号:DE69426487D1
公开(公告)日:2001-02-01
申请号:DE69426487
申请日:1994-03-28
Applicant: ST MICROELECTRONICS SRL
Inventor: CAMPARDO GIOVANNI , DALLABORA MARCO
Abstract: To reduce the supply voltage (VCC) of a nonvolatile memory (48), a read reference signal (H) is generated having a reference threshold value ranging between the maximum permissible threshold value for erased cells and the minimum permissible threshold value for written cells. To avoid reducing the maximum supply voltage, the characteristic (H) of the read reference signal is composed of two portions: a first portion (H1), ranging between the threshold value and a predetermined value (Vs), presents a slope lower than that of the characteristic (A, G) of the memory cells (50); and a second portion (H2), as of the predetermined value of the supply voltage, presents the same slope as the memory cells. The shifted-threshold, two-slope characteristic is achieved by means of virgin cells (11-13) so biased as to see bias voltages lower than the supply voltage.
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公开(公告)号:DE69514791D1
公开(公告)日:2000-03-02
申请号:DE69514791
申请日:1995-07-24
Applicant: ST MICROELECTRONICS SRL
Inventor: DALLABORA MARCO , VILLA CORRADO , BETTINI LUIGI
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公开(公告)号:DE69325443T2
公开(公告)日:2000-01-27
申请号:DE69325443
申请日:1993-03-18
Applicant: ST MICROELECTRONICS SRL
Inventor: CAMPARDO GIOVANNI , CRISENZA GIUSEPPE , DALLABORA MARCO
IPC: G11C17/00 , G11C16/04 , G11C16/06 , G11C16/30 , H01L21/8247 , H01L27/115
Abstract: To reduce the read and write errors caused by depleted memory array cells being turned on even when not selected, the nonselected memory cells are so biased as to present a floating terminal and a terminal at a positive voltage with respect to the substrate region. In this way, the threshold voltage of the above cells (the minimum voltage between the gate and source terminals for the cell to be turned on) increases due to the "body effect", whereby the threshold voltage depends, among other things, on the voltage drop between the cell terminal operating as the source and the substrate, and increases alongside an increase in the voltage drop.
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