Abstract:
An integrated device (40) forming a microfluid system includes a substrate (41) of semiconductor material and a lid element (56) forming a channel (55) filled with a liquid. A heating element (51) is carried by the substrate and faces the channel so as to heat the liquid and generate a gas bubble, when activated. The substrate (41) houses a cavity (42) arranged on the opposite side of the heating element (51; 66) with respect to the channel (55) in order to reduce thermal dispersion of the heating element (51) towards the substrate (41). The heating element includes a resistive region (45) coated, on the side facing the channel (55), by a protective region (49, 50) and, on the side facing the cavity (42), by an insulating layer (44).
Abstract:
The process comprises the steps of: forming a through hole (12) from the back of a semiconductor material body (1); forming a hole insulating layer (15) of electrically isolating material laterally covering the walls of the through hole; forming a through contact region (16) of conductive material laterally covering the hole insulating layer inside the hole and having at least one portion (21) extending on top of the lower surface (10) of the body (1); forming a protective layer (22) covering the through contact region; and forming a connection structure (25) extending on top of the upper surface (5) of the body (1) between and in electrical contact with the through contact region (16) and the electronic component (3).
Abstract:
A pressure sensor (15) with double measuring scale, comprising: a flexible body (16, 34) designed to undergo deflection as a function of a said pressure (P); piezoresistive transducers (28, 29; 94) for detecting the deflection; a first focusing region (30) designed to concentrate, during a first operating condition, a first value (P INT1 ) of said pressure (P) in a first portion (19) of the flexible body (16, 34) so as to generate a deflection of the first portion (19) of the flexible body (16, 34); and a second focusing region (33) designed to concentrate, during a second operating condition, a second value (P INT2 ) of said pressure (P) in a second portion (17) of the flexible body (16, 34) so as to generate a deflection of the second portion (17) of the flexible body (16, 34). The piezoresistive transducers correlate the deflection of the first portion (19) of the flexible body (16, 34) to the first pressure value (P INT1 ) and the deflection of the second portion (17) of the flexible body (16, 34) to the second pressure value (P INT2 ).
Abstract:
A micro-electro-mechanical device (20) formed by a body (4) of semiconductor material having a thickness and defining a mobile part (23, 24, 31) and a fixed part (3, 25, 30). The mobile part is formed by a mobile platform (23), supporting arms (31) extending from the mobile platform to the fixed part (3, 25, 30), and by mobile electrodes (24) fixed to the mobile platform. The fixed part has fixed electrodes (25) facing the mobile electrodes (24), a first biasing region (3) fixed to the fixed electrodes, a second biasing region (30) fixed to the supporting arms (31), and an insulation region (6) of insulating material extending through the entire thickness of the body (4). The insulation region (6) insulates electrically at least one between the first and the second biasing regions (3, 30) from the rest of the fixed part.
Abstract:
The electrical connection structure (15) comprises connection elements (25) which electrically connect a movable part (3) to a fixed part (4) of a microelectromechanical device, for example a microactuator (23). The movable part (3) and fixed part (4) are separated by trenches (6) and are mechanically connected by spring elements (12) which determine the torsional rigidity of the microelectromechanical device, together with the connection elements (25). Each connection element (25) is formed by more sub-arms (26) connected in parallel and having a common movable anchorage region (26a), anchored to the movable part (3), and a common fixed anchorage region (26b), anchored to the fixed part (5), thereby the mechanical resistance of the connection elements (25) is negligible. The sub-arms (26) have a width (W) equal to a submultiple of the width necessary in case of a single connection element for the latter to have a preset electrical resistance, determined in the design; namely, the width of the sub-arms (26) is equal to the width of the single connection element divided by the number of sub-arms.