Abstract:
The present invention relates to an electronic component inspection and classification device for classifying electronic components by characteristic after inspecting the electronic components. The purpose of the present invention is to provide the electronic component inspection and classification device capable of improving efficiency by quickly and accurately classifying the electronic components that inspection is complete according to the characteristic. The electronic component classification device according to an embodiment quickly and accurately performs a task of classifying the electronic components.
Abstract:
A method for processing a chip package is disclosed. The method for processing a chip package comprises the steps of: (a) forming a release material layer on the bottom surface of a substrate part having a plurality of chips to be installed on a substrate; (b) processing a lens part on the top surface of the substrate part ; and (c) fully cutting the substrate using a laser beam. [Reference numerals] (AA) Start; (BB) End; (S100) Step of forming a release material layer on the bottom surface of a substrate part; (S200) Step of processing a lens part on the top surface of the substrate part; (S300) Step of processing the substrate part
Abstract:
A method for processing a chip package is disclosed. The method for processing a chip package includes (a) a step for processing the sealing part of the chip package by using the ultra sonic vibration of an ultra sonic vibration unit, and (b) a step for processing the substrate part of the chip package by using the laser of a laser process unit. [Reference numerals] (AA) START;(BB) END;(S10) Process a sealing part using ultra sonic vibration;(S20) Process a substrate unit using a laser
Abstract:
PURPOSE: A device for classifying electronic devices is provided to stably implement a classification process of the electronic devices. CONSTITUTION: A device for classifying electronic devices includes a first stage (10) and a second stage (20). The first stage and the second stage load the electronic devices and are arranged to be faced with each other in both sides of a pickup device (50). The first stage and the second stage are perpendicularly arranged to the ground and moves in a plane direction. The pickup device includes a swing arm (51) and a driving unit (53). The swing arm picks up or places the electronic devices. The swing arm is extended in a radial direction around a rotation axis and a driving unit having the rotation axis. The driving unit is equipped in an end unit of the swing arm. The driving unit picks up the electronic devices from the first stage or places the electronic devices to the second stage according to the rotation of the swing arm.
Abstract:
PURPOSE: An electronic part inspection apparatus is provided to prevent the leakage of light emitting from an electronic part to the outside. CONSTITUTION: An electronic part inspection apparatus includes a carriage unit and a measurement unit. The carriage unit includes a mount member (21) and a driver. An electronic part is mounted on the mount member. The driver rotates or elevates the mount member. The measurement unit includes an integrating sphere (41) having an aperture with one side opened. The integrating sphere installs a socket member (43) having an insertion unit in which the electronic part is inserted formed. The socket member prepares a probe pin (44) contacting an electrode of the electronic part when the electronic part is inserted into the insertion unit.
Abstract:
본원은, 전기화학적 정전위법(electrochemical potentiostatic method)을 이용하여 질화갈륨계 화합물 반도체에 함유된 p-형 도판트를 활성화시킴으로써 p-형 질화갈륨계 화합물 반도체 층의 정공 농도를 증가시키고 전기적 특성을 개선할 수 있는 방법을 제공하고 이러한 방법을 이용하여 제조되는 질화갈륨계 화합물 반도체 디바이스 및 발광 디바이스를 제공하고자 한다.
Abstract:
본 발명의 목적은 수광과정에서 광손실이 발생하지 않는 적분구 유닛, 및 이를 구비한 엘이디 칩 테스트장치와 엘이디 칩 분류장치를 제공하는 것이다. 이를 위해 본 발명은, 광원의 광특성을 측정하기 위한 적분구 유닛에 있어서, 내측에 중공부가 형성되어 있으며, 이 중공부로 광을 전달하는 수광공을 가진 적분구본체; 상기 본체에 일체로 형성되며, 상기 수광공을 향하여 광을 전달하는 삽입공을 가진 프로브카드를 포함하는 것을 특징으로 하는 적분구 유닛을 제공한다. 적분구, 프로브카드, 수광공, 삽입공, 엘이디 칩