Abstract:
PURPOSE: An electronic device, memory device, and manufacturing method thereof are provided to prevent the formation of a physical non-planar structure of an upper material layer due to an uneven part of a lower laminate. CONSTITUTION: A functional layer(2) is formed on a substrate(1). The bottom of both ends of the functional layer contacts two electrodes(3) buried in a groove(1a) of the substrate. A first material layer is formed by filling a first electronic material in the groove. A second material layer of a fixed pattern is formed by a second electronic material on one side of the substrate.
Abstract:
A formation method of ZnO nanowire network pattern is provided to form ZnO nanowire network pattern and device of a desired shape and size at a low temperature with a stable yield by using a lithographic process and a sol-gel method. A formation method of ZnO nanowire network pattern comprises steps of: forming a photoresist pattern exposing a part of a substrate on the substrate; molding the ZnO nanowire network on a photoresist pattern and an exposed part of the substrate by a sol-gel method; and removing the photoresist pattern and forming the ZnO nanowire network pattern on the substrate. The step for forming the photoresist pattern comprises steps of: coating a photoresist on the substrate; exposing the photoresist; and developing the exposed photoresist.
Abstract:
PURPOSE: A carbon nano tube thin film transistor is provided to increase an aperture ratio of a pixel by allowing all conductive materials and a semiconductor material to include CNT and having a flexible structure while being transparent. CONSTITUTION: A CNT thin film transistor comprises a channel layer, a source / drain electrode, a gate layer, a gate isolation layer, and a transparency flexible substrate. The channel layer by the semiconductor CNT forms an electrical path associated with the transparent organic material and the organic material. The source / drain electrodes(21, 22) is connected with both side of the channel electrically by the conductivity CNT. The source / drain electrode by the conductivity CNT forms an electrical path associated with the organic material and the transparency organic material. A gate layer by the conductivity CNT corresponds to the channel layer, and a gate layer by the conductivity CNT is connected with both sides of the channel electrically.
Abstract:
A method for manufacturing an electronic device using a nanowire is provided to reduce a manufacturing cost and a manufacturing time for the electronic device by reducing a process using an E-beam. An electrode is formed on a substrate(S11). Plural nanowires are applied on the substrate on which the electrode is formed(S12). An image with respect to the substrate on which the nanowire and the electrode are formed is captured(S13). A virtual connection line connecting the nanowire to the electrode is drawn on the image by using an electrode pattern simulated through a computer program(S14). A photoresist for an E-beam is applied onto the substrate(S15). The photoresist formed on a position corresponding to the virtual connection line and the electrode pattern is removed by an E-beam lithography process(S16). A metal layer is deposited on the substrate(S17). The photoresist remaining on the substrate is removed by a lift-off process(S18).
Abstract:
A method for fabricating a nano wire array device is provided to embody a large-scale nano wire array device even when a nano wire is not parallel with an electrode line by selectively etching a nano wore on a substrate and by patterning an electrode line in a manner that the electrode becomes vertical to the electrode line to improve a probability that the electrode is connected to the nano wire. A nano wire solution including a nano wire(50) is deposited on a substrate. A first etch region of a stripe type is formed on the substrate to pattern the nano wire. A drain electrode line(100) and a source electrode line(200) are formed at both sides of the patterned nano wire, parallel with each other. One end of a plurality of drain electrodes(110) is connected to the drain electrode line wherein the drain electrode comes in contact with at least one nano wire. One end of a plurality of source electrodes(210) is connected to the source electrode line wherein the source electrode comes in contact with the nano wire in contact with the drain electrode. A second etch region is formed between the pair of drain electrodes and source electrodes so that the pair of drain electrodes and source electrodes don't contact each other electrically. An insulation layer(800) is formed on the substrate. A gate electrode(300) is formed on the insulation layer, disposed between the source and drain electrodes in contact with the nano wire.
Abstract:
An anode structure for a lithium secondary battery comprises a base, a metal current collector projected from the base and having mutually separated multiple projections, and an anode active material layer formed to be conformal along the upper surface of the base and the projections. Accordingly, the lifetime of the lithium secondary battery including the anode structure for a lithium secondary battery can be improved.
Abstract:
PURPOSE: A tilt sensor and a manufacturing method thereof are provided to reduce toxic material generation and manufacturing costs because an additional semiconductor process is not existed. CONSTITUTION: A tilt sensor comprises substrates(110) facing each other, nano wires(120), a current applying terminal(130), and a voltage measuring terminal(140). The nano wires are respectively formed in each substrate, thereby contacting to each other and comprising a piezoelectric characteristic. The current applying terminal applies a current between the substrates. The voltage measuring terminal is arranged in a different position on the substrate and measures a voltage between the substrates.
Abstract:
Provided is a vertical electrode structure using a trench and a method of manufacturing the vertical electrode structure. The method of forming a vertical electrode structure using a trench includes steps of: forming the trench on a predetermined region of a semiconductor substrate; and forming electrode layers in predetermined regions of inner and outer portions of the trench. In this manner, the electrode deposition in the vertical direction is established by using the trench, so that it is possible to form a deposited electrode having a size of several hundred nm or less by a short processing time and a low processing cost.
Abstract:
본 발명은 나노 물질을 브리지 회로의 저항으로 적용한 센서 시스템을 공개한다. 본 발명은 환경 변화에 대한 반응성이 뛰어난 나노 물질을 반응 물질로 이용함으로써, 보다 미세한 환경 변화에 대해서도 신뢰할 수 있는 측정 결과를 얻을 수 있다. 또한, 본 발명은 나노 물질을 센서에 많이 이용되는 브리지회로의 저항으로 이용하고, 대상 물질의 측정에 이용되는 나노 물질 영역을 제외한 나머지 영역은 유전체로 매립하여 외부 환경에 노출되지 않도록 보호함으로써, 시간이 지남에 따라서 발생하는 센서의 성능 열화를 최소화하였다. 또한, 본 발명은 나노 물질 위에 형성된 게이트에 전압을 인가하여 나노 물질에 전계를 형성함으로써, 나노 물질의 저항을 변화시킬 수 있다. 따라서, 휘트스톤 브리지 회로의 저항을 구성하는 나노 물질의 저항을 사용자의 의도대로 설정할 수 있으며, 이에 따라서 성능 열화에 대한 저항값을 보정함으로써, 성능 열화 및 외부 잡음에 의한 측정값의 변화를 배제하고, 실제로 외부 환경 변화에 의해서 변화된 저항값만을 측정하고, 저항값에 대응되는 대상 물질의 존재 여부 및 농도를 측정할 수 있으므로, 보다 신뢰성 있는 측정이 가능하다. 또한, 본 발명은 휘트스톤 브리지 회로의 내부 평형 조건을 자동으로 조절할 수 있는 회로 장치와 하나의 반도체칩에 일체로 구현되어, 사용자가 일일이 조건을 설정할 필요없이 자동으로 오차를 보정할 수 있다.