Abstract:
A semiconductor device and a manufacturing method thereof are provided to suppress a leakage current by using a side pattern, even when a portion of a source region is overlapped with a drain region. A semiconductor device includes an active region, a gate electrode(180), and a source/drain region(190). The active region is defined by a device isolation region. The gate electrode includes a p-type first polysilicon pattern and an n-type second polysilicon pattern. The p-type first polysilicon pattern is formed on the active region. The n-type second polysilicon pattern is formed on a lower sidewall of the first polysilicon pattern. The source/drain regions are formed at both sides of the gate electrode. A first spacer(165) is arranged to be contacted with an upper sidewall of the first polysilicon pattern and an upper surface of the second polysilicon pattern.
Abstract:
A back illuminated image sensor is provided to reduce the reflectance of light that penetrates into a substrate and reaches an interface between the substrate and an interlayer dielectric by forming an anti-reflective layer between the substrate and the interlayer dielectric. A photodiode(52) is formed on a substrate(50'). A dielectric layer(56) is formed on a first surface of the substrate. A wire layer(58) is formed in the dielectric layer. An anti-reflective layer is disposed between the substrate and the dielectric layer. Plural color filters(60) are formed on a second surface of the substrate opposite to the first surface. A micro lens(62) is formed on the color filter. First material layers and second material layers, which have different refractive indexes, are laminated in turn to form the anti-reflective layer. The first material is a silicon oxide layer. The second material is a silicon nitride layer. A refractive index of the first material layer is less than that of the second material index.
Abstract:
굴절율이 서로 다른 무기물질이 교대로 반복 적층된 칼라필터, 칼라필터 어레이 및 그의 제조방법 및 이미지 센서를 개시한다. 칼라필터는 기판; 및 소정 색을 위한 특정 파장의 광을 필터링하기 위한, 상기 기판상에 교대로 반복 적층되는, 서로 다른 굴절율을 갖는 제1무기막과 제2무기막을 포함한다. 상기 제1무기막과 제2무기막의 굴절율 차가 적어도 0.8이상이며, 2 내지 5회 반복 적층되며, 바람직하게는 3회 반복 적층된다. 상기 제1무기막과 제2무기막은 400 내지 700 nm 의 가시광선 영역에서 1.3 내지 6.0의 굴절율을 갖는으며, SiO2, SiON, SiN 및 Si 로부터 선택된다.
Abstract:
A CMOS(complementary metal oxide semiconductor) image sensor having an ARC(anti-reflective coating) with different thickness according to each pixel is provided to increase light receiving efficiency of a photoelectric generation part by having an ARC specialized according to each color. A first photoelectric generation part(210a) detects light of a first color to generate an electric signal. A first ARC(250a) having a first thickness is formed on the surface of the first photoelectric generation part. A second photoelectric generation part(210b) detects light of a second color to generate an electric signal. A second ARC(250b) is formed on the surface of the second photoelectric generation part, having a second thickness greater than the first thickness. A third photoelectric generation part(210c) detects light of a third color to generate an electrical signal. A third ARC(250c) is formed on the surface of the third photoelectric generation part, having a third thickness greater than the second thickness.
Abstract:
An image sensor and its manufacturing method are provided to decrease an aspect ratio of the image sensor by integrating a color filter with a micro lens which removes a color filter layer and an overcoating layer. A light receiving element(115) is formed in a semiconductor substrate(100), an interlayer dielectrics(125,135,145) are formed on the substrate. Color filter lenses(180R,180G,180B) are formed on the interlayer dielectrics. The color filter lenses include a red filter lens, a green filter lens, and a blue filter lens. The color filter lens is formed in a stacked structure of different inorganic layers. The inorganic layer includes an oxide layer and a nitride layer.
Abstract:
A color filter, a color filter array, a method for manufacturing the color filter, and an image sensor are provided to prevent different color beams from being mixed with one another by laminating plural inorganic films with different refractive indexes. A color filter(20) includes a substrate(10) and first and second inorganic films(21,25), which are repeatedly and alternatively laminated on the substrate. The first and the second inorganic films contain inorganic materials having a refractive index between 1.3 and 6.0 in a visible ray region between 400 and 700 nm. The first inorganic film is made of a material with a big refractive index, while the second inorganic film is made of a material with a small refractive index. A difference between the refractive indexes of the first and the second inorganic films is at least 0.8.
Abstract:
An image sensor having an improved frill factor is provided to improve a fill factor while reducing a unit pixel area and enabling high integration by making a unit pixel include at least two photoelectric conversion devices wherein a reading-out devices for outputting a signal from the photoelectric conversion devices is shared. A photoelectric conversion active region, an interconnection reading-out active region(C_RoA) and a separation reading-out active region(I_RoA) are defined by a dielectric isolation region(DIR) formed in a substrate. The photoelectric conversion active region includes a plurality of photoelectric conversion active region units(PA_u1,PA_u2) disposed as a matrix type and junction isolation regions(JIR) positioned between photoelectric conversion active region units adjacent to a row direction and a column direction wherein the adjacent photoelectric conversion active region units are electrically separated by the junction isolation regions. The interconnection reading-out active region is positioned in one region surrounded by the corner parts of the photoelectric conversion active region units, extended from at least one of the surrounding corner parts and electrically separated from the rest of the corner part by the dielectric isolation region. The separation reading-out active region is positioned in another region surrounded by the corner part of the photoelectric conversion active region units, electrically separated from the surrounding corner parts by the dielectric isolation region. The reading-out active regions include channel regions. The dielectric isolation region is positioned at both sides of the channel regions.