Abstract:
이미지센서및 이의형성방법을제공한다. 이이미지센서는포텐셜베리어영역을포함하여화소간의크로스토크를방지할수 있다. 이의제조방법은소자분리막을형성하기전에트렌치를채우는절연막상에마스크패턴을형성하고이를이온주입마스크로이용하여이온주입공정을진행하여트렌치하부에포텐셜베리어영역을형성한다. 이로써소자분리막의손상을최소화할수 있다.
Abstract:
PURPOSE: An image sensor is provided to implement a simple wire structure by forming wire structure parts on a first surface that is the front side of a first substrate and a second surface that is the rear side of the first substrate. CONSTITUTION: A first interlayer dielectric structure part is formed on a first surface (101a) that is the front side of a first substrate (100a). A first wire structure part is included in the first interlayer dielectric structure part. A via contact plug is electrically connected to the first wire structure part via the first substrate. A color filter (154) and a microlens (156) are laminated on the first area of the second surface of the first substrate. A second interlayer dielectric structure part is formed on the second area of the second surface of the first substrate. A second wire structure part is electrically connected to the via contact plug.
Abstract:
PURPOSE: An image sensor and a formation method thereof are provided to minimize damage of a device separation film by forming a potential barrier region on the lower part of a trench using a mask pattern as an ion injection mask. CONSTITUTION: A buffer film(102) and a first insulating film(104) are successively formed on a semiconductor epitaxial layer(100). A trench is formed by patterning a predetermined part of the semiconductor epitaxial layer and the first insulating film. A buried insulating film(108) which fills the trench is formed on the first insulating film. A second insulating film(110) is formed on the buried insulating film. A first mask pattern(112) is formed on the second insulating film.
Abstract:
A back-illuminated image sensor may include a substrate in which photodiodes are disposed; an insulating layer on a first surface of the substrate; an interconnection layer in the insulating layer; an anti-reflection layer between the substrate and the insulating layer; a plurality of color filters on a second surface of the substrate opposite to the first surface; and a microlens on the color filters. Because the anti-reflection layer may be between the substrate and an interlayer dielectric layer, the reflection rate of light that passes through the substrate and arrives at an interface between the substrate and the interlayer insulating layer may be reduced.
Abstract:
A semiconductor device, a CMOS image sensor, a method for manufacturing the semiconductor device and a method for manufacturing the CMOS image sensor are provided to reduce remarkably the generation of dark current and noises due to interfacial defects of a trench by forming a channel stop doped region along an inner wall of the trench. A trench for defining a photodiode active region is formed in a substrate(100'). A channel stop doped region(106) is formed along an inner surface of the trench by performing an ion implantation on the resultant structure. A trench isolation region is formed by performing a gap-fill process on the trench using an insulating layer. A photodiode(140,150) is formed within the photodiode active region of the substrate.