Abstract:
가요성 기판 상에 구현되는 박막 반도체 소자 및 이를 이용한 전자장치 및 그 제조방법이 개시된다. 개시된 반도체 소자는 가요성 기판 상에 형성되는 박막 반도체 칩과, 박막 반도체 칩을 감싸는 보호캡 및 상기 기판 및 상기 보호캡 상에 형성된 절연층을 구비한다. 개시된 전자장치는, 가요성 기판과 가요성 기판 상에 형성되는 반도체 칩을 포함하는 전자장치에 있어서, 상기 반도체 칩을 감싸는 보호캡을 구비한다. 반도체 칩을 감싸는 보호캡에 의해 기판의 벤딩시 발생하는 응력에 대한 내구성이 향상된다.
Abstract:
다성분계 박막 및 그 형성 방법에 관해 개시되어 있다. 개시된 본 발명은 반응 챔버에 기판을 로딩한 다음, 상기 기판 상에 형성하고자 하는 박막을 구성하는 단위 물질층을 형성하되, 상기 단위 물질층은 적어도 상기 박막을 구성하는 물질 성분을 포함하는 두 종류의 전구체들로 구성된 모자이크 원자층(MAL)으로 형성하는 제1 단계와, 상기 반응 챔버 내부를 퍼지하는 제2 단계 및 상기 모자이크 원자층을 화학 변화시키는 제3 단계를 통해 형성하는 것을 특징으로 하는 박막 형성 방법 및 이 방법을 통해 형성된 박막을 제공한다.
Abstract:
Provided is a method for fabricating a metal oxide thin film in which a metal oxide generated by a chemical reaction between a first reactant and a second reactant is deposited on the surface of a substrate as a thin film. The method involves introducing a first reactant containing a metal-organic compound into a reaction chamber including a substrate; and introducing a second reactant containing alcohol. Direct oxidation of a substrate or a deposition surface is suppressed by a reactant gas during the deposition process, as it uses alcohol vapor including no radical oxygen as a reactant gas for the deposition of a thin film. Also, since the thin film is deposited by the thermal decomposition, which is caused by the chemical reaction between the alcohol vapor and a precursor, the deposition rate is fast. Particularly, the deposition rate is also fast when a metal-organic complex with beta-diketone ligands is used as a precursor. Further, a thin film with low leakage current can be obtained as the metal oxide thin film fabrication method using a chemical vapor deposition or atomic layer deposition method grows a thin film with fine microstructure.
Abstract:
PURPOSE: A vertical CNT(Carbon NanoTube) FET(Field Effect Transistor) and a manufacturing method thereof are provided to maximize field effect of a gate and to improve on/off current by surrounding completely a carbon nano-tube channel having a depletion layer using the gate. CONSTITUTION: A first electrode(13) is formed on a substrate(10). A CNT is vertically formed on the first electrode. A second electrode(12) is formed on the CNT. A first burial layer(31) is formed on the first electrode, A second burial layer(32) is formed under the second electrode. The first and second burial layers are spaced apart from each other. A channel portion(11) of the CNT is exposed to the outside through a space between the first and second burial layers. The channel portion includes a depletion layer. The channel portion is surrounded with a gate(20) between the first and second burial layers via a gate insulating layer(21).
Abstract:
PURPOSE: A carbon nano tube FET(field effect transistor) is provided to maximize an electric field effect of a gate by using a cylindrical carbon nano tube as a channel and by making a channel region completely surrounded by the gate. CONSTITUTION: A substrate(10) is prepared. A carbon nano tube(CNT) is disposed in parallel with the plane of the substrate. A channel(11) is formed by one of a bundle of the carbon nano tubes. A source and a drain are electrically connected to both ends of the channel. A gate(20) is formed in such a way that the channel is surrounded by the gate. A gate insulation layer(21) is interposed between the gate and the channel.
Abstract:
A capacitor for use in a semiconductor device, a method of fabricating the capacitor, and an electronic device adopting the capacitor are provided. The capacitor includes upper and lower electrodes, each formed of a platinum group metal; a thin dielectric layer disposed between the upper and lower electrodes; and a buffer layer disposed between the lower electrode and the thin dielectric layer, the buffer layer including a metal oxide of Group 3, 4, or 13.
Abstract:
PURPOSE: A method for forming an oxide film having high dielectric constant, a capacitor comprising dielectric film formed by the method and a method for manufacturing the same are provided to reduce the number of ALD apparatuses by using chemical reaction between precursors of aluminum and hafnium. CONSTITUTION: A semiconductor substrate(40) is loaded into an ALD apparatus. A reactant is deposited on an upper surface of the semiconductor substrate. The reactant includes the first reacting element and the second reacting element. The first high dielectric oxide layer(50a) including the first and the second reacting elements is formed on the upper surface of the semiconductor substrate by oxidizing the first and the second reacting elements.
Abstract:
PURPOSE: A method for fabricating an electronic device is provided to improve tolerance with respect to the stress occurring in bending a flexible substrate by forming a protection cap for capping a thin film semiconductor device installed in the flexible substrate. CONSTITUTION: A thin film semiconductor chip is fabricated on the flexible substrate(51). The protection cap(63) is formed to cover a semiconductor chip. An insulation layer is stacked on the substrate to cover the protection cap. A contact hole is formed from the insulation layer and the protection cap to the upper surface of the semiconductor chip. An electrode electrically contacts the semiconductor chip through the contact hole. A driven unit driven by the semiconductor chip is formed on the electrode.
Abstract:
PURPOSE: A showerhead for chemical vapor reactor in which a source is uniformly emitted from an outlet of the showerhead is provided. CONSTITUTION: The showerhead(100) for chemical vapor reactor is characterized in that first, second and third circular plates(110,120,150) are sequentially laid up and formed in such a way that the side surface of the first, second and third circular plates is sealed, at least two of 'n' source injection holes(114) arranged on a concentric circle separated from the central axis in a certain distance with the 'n' source injection holes being spaced apart from each other in an equal gap, and a reaction gas injection hole(112) penetrating the first circular plate are formed on the first circular plate, a reaction gas passing hole(122) corresponding to the reaction gas injection hole, and 'n' sectors uniformly split centering around the source injection holes are formed on the second circular plate, first groove(126) formed with respectively spaced apart from the central axis and outer circumference in a certain distance at a line extended to the source injection holes from the central axis, a plurality of second grooves(128) formed with extended from the first groove to a position that is spaced apart from a boundary line of the sectors in a certain distance, and a plurality of source dispersion holes(130) at the lower part of the second grooves are formed in the sectors, and a source passing hole(152) formed correspondingly to the source dispersion holes so that a source passing the source dispersion holes passes through the third circular plate, third groove(154) separated from the source passing hole in a certain distance and opened to the reaction gas injection hole so that the third groove becomes a diffusion path of the reaction gas, and a plurality of reaction gas injection holes at the lower part of the third groove are formed on the third circular plate.