公开(公告)号：US09553120B2

公开(公告)日：2017-01-24

申请号：US14529783

申请日：2014-10-31

Applicant: SiliconFile Technologies Inc.

Inventor： Jae Young Park ,  Young Ha Lee ,  Jun Ho Won ,  Do Young Lee

IPC: H01L27/146

CPC classification number: H01L27/14636 ,  H01L27/14634 ,  H01L27/1464 ,  H01L27/1469

Abstract: A technology capable of simplifying a process and securing a misalignment margin when bonding two wafers to manufacture an image sensor using backside illumination photodiodes. When manufacturing an image sensor through a 3D CIS (CMOS image sensor) manufacturing process, two wafers, that is, a first wafer and a second wafer are electrically connected using the vias of one wafer and the bonding pads of the other wafer. Also, when manufacturing an image sensor through a 3D CIS manufacturing process, two wafers are electrically connected using the vias of both the two wafers.

Abstract translation: 这种技术能够简化工艺并且在使用背面照明光电二极管接合两个晶片以制造图像传感器时确保不对准裕度。 当通过3D CIS（CMOS图像传感器）制造工艺制造图像传感器时，使用一个晶片的通孔和另一个晶片的焊盘来电连接两个晶片，即第一晶片和第二晶片。 此外，当通过3D CIS制造工艺制造图像传感器时，两个晶片使用两个晶片的通孔电连接。

公开(公告)号：US09552776B2

公开(公告)日：2017-01-24

申请号：US14369214

申请日：2012-12-26

Applicant: SiliconFile Technologies Inc.

Inventor： Do-Young Lee ,  Jae-Won Uhm

IPC: G09G3/30 ,  G09G3/32 ,  G09G3/20

CPC classification number: G09G3/3283 ,  G09G3/2003 ,  G09G3/30 ,  G09G3/3208 ,  G09G3/3225 ,  G09G3/3233 ,  G09G2320/0233 ,  G09G2320/029 ,  G09G2320/041 ,  G09G2320/0626 ,  G09G2320/0666 ,  G09G2360/145

Abstract: Disclosed is a luminance compensation apparatus of an organic light emitting diode panel including a reference pixel element unit that is installed at an outer peripheral portion of a display area on an organic light emitting diode panel and operate corresponding to a pixel element aligned in the display area, and a driving chip that is provided in an area including the reference pixel element unit of the outer peripheral portion of the display area, compares a luminance value of light incident from the reference pixel element unit with a reference luminance value to calculate a luminance deviation value based on a comparison result, controls driving of pixel elements aligned in the display area according to the luminance deviation value, and allows light, luminance deviation of which has been compensated, to be irradiated.

Abstract translation: 公开了一种有机发光二极管面板的亮度补偿装置，其包括参考像素元件单元，该参考像素元件单元安装在有机发光二极管面板上的显示区域的外周部分上，并且对应于在显示区域中对准的像素元件 以及设置在包括显示区域的外周部分的参考像素单元单元的区域中的驱动芯片，将从参考像素单元单元入射的光的亮度值与参考亮度值进行比较，以计算亮度偏差 基于比较结果的值控制根据亮度偏差值在显示区域中排列的像素元素的驱动，并且允许照射其亮度偏差已被补偿的亮度。

公开(公告)号：US20160315112A1

公开(公告)日：2016-10-27

申请号：US15135219

申请日：2016-04-21

Applicant: SILICONFILE TECHNOLOGIES INC.

Inventor： Jae Young PARK ,  Won Ho LEE

IPC: H01L27/146 ,  H04N5/361

CPC classification number: H01L27/14623 ,  H01L27/14607 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14636 ,  H01L27/14645 ,  H01L27/14649 ,  H04N5/361 ,  H04N5/3745 ,  H04N9/045

Abstract: A 4-color pixel image sensor having a visible color noise reduction function in a near infrared ray (NIR) pixel may include an active pixel region having a plurality of photodiodes, a plurality of first metal layers, a plurality of color filters, a first NIR pixel and a micro-lens, which are stacked, wherein the plurality of photodiodes are arranged in series and the plurality of color filters are formed to be adjacent to each other in series; an NIR optical black pixel region having a plurality of photodiodes and a second NIR pixel, which are stacked, wherein the plurality of photodiodes are arranged in series; and a visible optical black pixel region having a plurality of photodiodes, a second metal layer, a plurality of color filters and a micro-lens, which are stacked, wherein the plurality of photodiodes are arranged in series, and the plurality of color filters are formed to be adjacent to each other in series, wherein the active pixel region, the NIR optical black pixel region and the visible optical black pixel region are arranged on a same substrate in series.

Abstract translation: 在近红外线（NIR）像素中具有可见颜色降噪功能的4色像素图像传感器可以包括具有多个光电二极管的有源像素区域，多个第一金属层，多个滤色器，第一 NIR像素和微透镜，其中所述多个光电二极管串联布置并且所述多个滤色器彼此串联形成; 具有堆叠的多个光电二极管和第二NIR像素的NIR光学黑色像素区域，其中所述多个光电二极管串联布置; 以及层叠有多个光电二极管的可见光学黑色像素区域，第二金属层，多个滤色器和微透镜，其中，所述多个光电二极管串联布置，并且所述多个滤色器为 形成为彼此相邻的串联，其中有源像素区域，NIR光学黑色像素区域和可见光学黑色像素区域被串联布置在同一衬底上。

公开(公告)号：US09478464B2

公开(公告)日：2016-10-25

申请号：US14888674

申请日：2014-04-30

Applicant: SILICONFILE TECHNOLOGIES INC.

Inventor： Heui Gyun Ahn ,  Sang Wook Ahn ,  Yong Woon Lee ,  Huy Chan Jung ,  Do Young Lee

IPC: H01L21/768 ,  H01L21/306 ,  H01L21/683

CPC classification number: H01L21/76898 ,  H01L21/30604 ,  H01L21/6835 ,  H01L21/7684 ,  H01L2221/68327 ,  H01L2221/68359

Abstract: A method for manufacturing a through-hole silicon via (TSV) employs the conventional trench insulation process to readily manufacture a through-hole silicon via (TSV) with achievement of an effective electrical insulation between the through-hole silicon via (TSV) and the silicon.

Abstract translation: 用于制造通孔硅通孔（TSV）的方法采用传统的沟槽绝缘工艺来容易地制造通孔硅通孔（TSV），从而实现通孔硅通孔（TSV）和通孔硅通孔（TSV）之间的有效电绝缘 硅。

公开(公告)号：US09377895B2

公开(公告)日：2016-06-28

申请号：US14415822

申请日：2013-07-04

Applicant: SiliconFile Technologies Inc.

Inventor： Jung Hong Ahn

IPC: G06F3/041 ,  G06F3/045 ,  G06F3/042 ,  G06F1/32

CPC classification number: G06F3/0416 ,  G06F1/3262 ,  Y02D50/20

Abstract: The present disclosure relates to a method for divided scanning of a touch panel, in which a touch panel scanning process is divided into a pre-scan process and a main scan process. According to the embodiment of the present invention, a touch panel scan process, which had been performed in existing touch panels, may be divided into a pre-scan process and a main scan process, and the performed in various manners. Thus, while power consumption is reduced, the speed of response to an external touch can be improved.

Abstract translation: 本公开涉及一种用于触摸面板的分割扫描的方法，其中触摸面板扫描处理被划分为预扫描处理和主扫描处理。 根据本发明的实施例，已经在现有触摸面板中执行的触摸面板扫描处理可以被划分为预扫描处理和主扫描处理，并且以各种方式执行。 因此，尽管功耗降低，但可以提高对外部触摸的响应速度。

公开(公告)号：US09337232B2

公开(公告)日：2016-05-10

申请号：US14359264

申请日：2012-11-08

Applicant: SiliconFile Technologies Inc.

Inventor： Do Young Lee

IPC: H01L27/146

CPC classification number: H01L27/14647 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14634 ,  H01L27/1464 ,  H01L27/14641

Abstract: The present invention relates to a substrate stacked image sensor having a dual detection function, in which when first to fourth photodiodes are formed in a first substrate, a fifth photodiode is formed in a second substrate, and the substrates are stacked and combined with each other, the first to fourth photodiodes and the fifth photodiode are combined with each other to obtain a complete photodiode as an element of one pixel, and signals individually detected in each photodiode are selectively read or added to be read according to necessity. To this end, the first to fourth photodiodes are formed in the first substrate, the fifth photodiode is formed in the second substrate, the first to fourth photodiodes and the fifth photodiode make electrical contact with each other, and pixel array sizes of the first substrate and the second substrate are allowed to be different from each other, so that sensor resolution of the first substrate and sensor resolution of the second substrate are different from each other.

Abstract translation: 本发明涉及具有双重检测功能的基板层叠图像传感器，其中当在第一基板中形成第一至第四光电二极管时，在第二基板中形成第五光电二极管，并且将基板彼此堆叠并组合 ，第一至第四光电二极管和第五光电二极管彼此组合以获得作为一个像素的元件的完整光电二极管，并且根据需要选择性地读取或添加在每个光电二极管中单独检测的信号以进行读取。 为此，第一至第四光电二极管形成在第一衬底中，第五光电二极管形成在第二衬底中，第一至第四光电二极管和第五光电二极管彼此电接触，第一衬底的像素阵列尺寸 并且第二基板被允许彼此不同，使得第一基板的传感器分辨率和第二基板的传感器分辨率彼此不同。

公开(公告)号：US20150311239A1

公开(公告)日：2015-10-29

申请号：US14649710

申请日：2013-11-15

Applicant: SILICONFILE TECHNOLOGIES INC.

Inventor： Jun Ho WON ,  Won Ho LEE ,  Do Young LEE

IPC: H01L27/146

CPC classification number: H01L27/1463 ,  H01L27/14621 ,  H01L27/14625 ,  H01L27/14627 ,  H01L27/14645 ,  H01L27/14649 ,  H01L27/14685 ,  H01L27/14689 ,  H04N9/045

Abstract: The present invention relates to a CMOS image sensor including an infrared pixel with enhanced spectral characteristics in which a stepped portion is formed between color filters of RGB pixels and a filter of an infrared pixel, and a manufacturing method thereof. A stepped portion is formed between color filters and an infrared filter according to respective pixels and the thicknesses of the filters are arbitrarily adjusted regardless of the characteristics of material in the formation of the color filters and the infrared filter, so that crosstalk characteristics are improved.

Abstract translation: 本发明涉及一种CMOS图像传感器及其制造方法，该CMOS图像传感器包括具有增强的光谱特性的红外像素及其制造方法，其中在RGB像素的滤色器和红外像素的滤色器之间形成台阶部分。 根据各个像素，在滤色器和红外滤光器之间形成阶梯部分，并且无论滤色器和红外滤光器的形成中的材料的特性如何，都可任意调节滤光片的厚度，从而提高串扰特性。

公开(公告)号：US20150236065A1

公开(公告)日：2015-08-20

申请号：US14430727

申请日：2013-09-24

Applicant: SILICONFILE TECHNOLOGIES INC.

Inventor： Jae Won Eom

IPC: H01L27/146 ,  H01L27/148

CPC classification number: H01L27/14643 ,  H01L27/14609 ,  H01L27/14612 ,  H01L27/14634 ,  H01L27/14636 ,  H01L27/148 ,  H04N5/3745 ,  H04N5/37457

Abstract: The present invention introduces a separation type unit pixel of an image sensor having a three-dimensional (3D) structure, which is capable of maximizing transmission efficient of a charge generated through a photodiode to a floating diffusion area. The separation type unit pixel may include a first wafer on which a photodiode and a transmission transistor are formed and a second wafer on which a reset transistor and a source follower transistor are formed. In particular, the photodiode has a positive region to which an N_ground voltage is applied, the N_ground voltage having a lower voltage level than a ground voltage used in the second wafer.

Abstract translation: 本发明引入具有三维（3D）结构的图像传感器的分离型单元像素，其能够使通过光电二极管产生的电荷的透射效率最大化到浮动扩散区域。 分离型单位像素可以包括其上形成有光电二极管和透射晶体管的第一晶片和形成复位晶体管和源极跟随器晶体管的第二晶片。 特别地，光电二极管具有施加N_接地电压的正区域，N接地电压具有比在第二晶片中使用的接地电压更低的电压电平。

公开(公告)号：US20150199065A1

公开(公告)日：2015-07-16

申请号：US14415822

申请日：2013-07-04

Applicant: SiliconFile Technologies Inc.

Inventor： Jung Hong Ahn

IPC: G06F3/041 ,  G06F1/32

CPC classification number: G06F3/0416 ,  G06F1/3262 ,  Y02D50/20

Abstract: The present disclosure relates to a method for divided scanning of a touch panel, in which a touch panel scanning process is divided into a pre-scan process and a main scan process. According to the embodiment of the present invention, a touch panel scan process, which had been performed in existing touch panels, may be divided into a pre-scan process and a main scan process, and the performed in various manners. Thus, while power consumption is reduced, the speed of response to an external touch can be improved.

Abstract translation: 本公开涉及一种用于触摸面板的分割扫描的方法，其中触摸面板扫描处理被划分为预扫描处理和主扫描处理。 根据本发明的实施例，已经在现有触摸面板中执行的触摸面板扫描处理可以被划分为预扫描处理和主扫描处理，并且以各种方式执行。 因此，尽管功耗降低，但可以提高对外部触摸的响应速度。

公开(公告)号：US20150062390A1

公开(公告)日：2015-03-05

申请号：US14474550

申请日：2014-09-02

Applicant: SiliconFile Technologies Inc.

Inventor： Ho Soo KIM ,  Jong Phil Kim

IPC: H04N5/232 ,  G02B3/00 ,  H04N9/077

CPC classification number: G02B3/0037 ,  G02B3/0043 ,  G02B7/34 ,  G02B7/346 ,  H01L27/14621 ,  H01L27/14627 ,  H04N5/36961 ,  H04N9/04557

Abstract: Disclosed is a phase difference detection pixel using a microlens, which detects a phase difference without the loss of an input signal by modifying the shape of a microlens, which collects light incident into a photodiode, such that the light passes through only in a specific direction. In the phase difference detection pixel using a microlens, a signal reduction problem, which is a disadvantage of the existing phase difference detection pixel, is solved and a phase difference detection function is achieved in all areas of an image sensor. The phase difference detection pixel using a microlens is variously applied for distance measurement between objects or three-dimensional image capturing.

Abstract translation: 公开了一种使用微透镜的相位差检测像素，其通过修改收集入射到光电二极管中的光的微透镜的形状来检测相位差而不损失输入信号，使得光仅沿特定方向 。 在使用微透镜的相位差检测像素中，解决了现有相位差检测像素的缺点的信号降低问题，并且在图像传感器的所有区域中实现了相位差检测功能。 使用微透镜的相位差检测像素被多种应用于物体之间的距离测量或三维图像拍摄。