-
公开(公告)号:DE102007024074A1
公开(公告)日:2008-11-27
申请号:DE102007024074
申请日:2007-05-22
Applicant: LEICA MICROSYSTEMS
Inventor: BIRK HOLGER , SEYFRIED VOLKER
IPC: G02B21/00
Abstract: A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.
-
公开(公告)号:DE102007011305A1
公开(公告)日:2008-09-11
申请号:DE102007011305
申请日:2007-03-06
Applicant: LEICA MICROSYSTEMS
Inventor: BIRK HOLGER , DYBA MARCUS , GUGEL HILMAR , SEYFRIED VOLKER
-
公开(公告)号:DE102004058565A1
公开(公告)日:2006-04-20
申请号:DE102004058565
申请日:2004-12-03
Applicant: LEICA MICROSYSTEMS
Inventor: BIRK HOLGER , STORZ RAFAEL , FEHRER DIRK-OLIVER , KRESS CLAUS
IPC: G02B21/00
Abstract: Scanning microscope, especially a confocal scanning microscope with scanning device (1), detector device (2), an electronic device (3) for operating the microscope, and a cooling device (4) for at least one of the components, which uses a liquid coolant, especially water, and includes a galvanometer.
-
公开(公告)号:DE10340020B4
公开(公告)日:2005-08-11
申请号:DE10340020
申请日:2003-08-28
Applicant: LEICA MICROSYSTEMS
Inventor: BIRK HOLGER , SEYFRIED VOLKER , STORZ RAFAEL
-
公开(公告)号:DE10137154A1
公开(公告)日:2003-02-20
申请号:DE10137154
申请日:2001-07-30
Applicant: LEICA MICROSYSTEMS
Inventor: BIRK HOLGER , ENGELHARDT JOHANN
-
公开(公告)号:DE10125469A1
公开(公告)日:2002-12-12
申请号:DE10125469
申请日:2001-05-25
Applicant: LEICA MICROSYSTEMS
Inventor: ULRICH HEINRICH , BIRK HOLGER , HAY WILLIAM C , NISSLE HOLGER
Abstract: Device for determination of the light intensity of a light beam (7) has a beam splitter (1) and a detector (11). The beam splitter divides off a measurement beam (23) from the incident beam and the ratio of the intensity of the light in the incident beam to that of the measurement beam is measured using the detector to ensure that the ratio remains constant. Beam splitter and detector form a single unit. Independent claims are also made for: (1) A microscope; (2) A microscopy method in which the intensity of the incident illumination beam is monitored.
-
公开(公告)号:DE19956439A1
公开(公告)日:2001-05-31
申请号:DE19956439
申请日:1999-11-24
Applicant: LEICA MICROSYSTEMS
Inventor: STORZ RAFAEL , ENGELHARDT JOHANN , BIRK HOLGER , BRADL JOACHIM
Abstract: A beam of light is deflected by an arrangement (4) of mirrors rotated alternately by a rotating driving mechanism (1). It is possible to adjust almost any offset angle at all to a zero pint position. The rotating driving mechanism has two operating devices (2,3) working jointly but separate from each other to turn the arrangement of mirrors around an axis (5) of rotation.
-
-
-
-
-
-