Abstract:
기판처리장치의가스공급계를검사한다. 일실시형태에서는, 기판처리장치의처리용기내로공급되는가스의유량이제 1 유량제어기에서설정유량에따라제어된다. 또한, 제 1 유량제어기로부터의가스는제 2 유량제어기로도공급된다. 제 1 유량제어기의출력유량이정상상태가되어있을때, 제 2 유량제어기의제 1 압력계의제 1 측정압력값및 제 2 압력계의제 2 측정압력값이취득된다. 제 1 측정압력값과기준압력값과의사이의차분절대값, 및, 제 2 측정압력값과기준압력값과의사이의차분절대값이구해지고, 이들차분절대값의평균값이구해진다. 차분절대값및 평균값은각각, 제1 ~ 제 3 임계치와비교된다.
Abstract:
PURPOSE: A plasma processing apparatus and a gas supply method therefor are provided to stably change process gas by controlling transient of a gas flow rate without mixing process gas converted into alternating when each process gas is converted. CONSTITUTION: A gas supply system(200) connects a respective gas supply path to a plurality of process gas sources. The gas supply system supplies desired process gas to a process chamber through the gas supply path. Flow controllers(230A-230D) are installed in each gas supply path. The flow controller controls a flow rate of gas flowing in the gas supply path by controlling openness of a flow controlling valve according to a preset flow rate. An opening/closing valve(216) is installed at a down portion of each flow controller. [Reference numerals] (133, 135) Matcher; (140) Exhaust device; (150) Control part; (152) Operational part; (154) Memory part
Abstract:
PURPOSE: A bolt loosening prevention device, an attaching method thereof, an attaching jig, a fluid controlling device, and a substrate processing device are provided to authentically preventing a blot loosening because the rotation of each interlocking member are prevented by a joining member in the state that the relative rotation of the interlocking member with respect to each bolt is impossible. CONSTITUTION: A bolt loosening prevention device comprises interlocking members(2,3) and a joining member(4). The interlocking members are interlocked to each head unit of a plurality of bolts(5) to be respectively relative-rotated. The outer circumferences(2b,3b) of the interlocking members are formed into a non-circular. The joining member is joined to the each interlocking members. The joining member comprises joining units(8a,8b) preventing the movement of the interlocking members. The joining unit is joined to at least a part of the non-circular outer circumference of the interlocking member.
Abstract:
A semiconductor treating device (1) includes treating chambers (2) connected to a common transportation chamber (8) and treating a substrate (W) to be treated. A gas supply system (40) for supplying a predetermined gas to each of the treating chambers (2) is attached to each chamber. The gas supply system (40) has a primary side connection unit (23) connected to the source of the predetermined gas and has a flow rate control unit (13). The primary side connection unit (23) is placed on the lower side of the corresponding treating chamber (2). The flow rate control unit (13) is placed on a gas line for supplying the gas from the primary side connection unit (23) to the corresponding treating chamber (2). The flow rate control unit (13) is provided such that at least a part of it is superposed on the upper side of the primary side connection unit (23).