CHECKING CIRCUIT FOR SYNCHRONISED CLOCKS

    公开(公告)号:AU5343379A

    公开(公告)日:1980-06-19

    申请号:AU5343379

    申请日:1979-12-04

    Applicant: IBM

    Abstract: In a data processing or transmission system which includes at least two synchronized clocks, for example-T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock. Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.

    CHECKING CIRCUIT FOR SYNCHRONISED CLOCKS

    公开(公告)号:AU528615B2

    公开(公告)日:1983-05-05

    申请号:AU5343379

    申请日:1979-12-04

    Applicant: IBM

    Abstract: In a data processing or transmission system which includes at least two synchronized clocks, for example-T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock. Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.

    TEST CIRCUIT FOR SYNCHRONOUSLY OPERATING CLOCK GENERATORS

    公开(公告)号:DE2963788D1

    公开(公告)日:1982-11-11

    申请号:DE2963788

    申请日:1979-10-23

    Applicant: IBM

    Abstract: In a data processing or transmission system which includes at least two synchronized clocks, for example-T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock. Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.

    7.
    发明专利
    未知

    公开(公告)号:IT1165393B

    公开(公告)日:1987-04-22

    申请号:IT2774079

    申请日:1979-11-30

    Applicant: IBM

    Abstract: In a data processing or transmission system which includes at least two synchronized clocks, for example-T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock. Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.

    8.
    发明专利
    未知

    公开(公告)号:IT7927740D0

    公开(公告)日:1979-11-30

    申请号:IT2774079

    申请日:1979-11-30

    Applicant: IBM

    Abstract: In a data processing or transmission system which includes at least two synchronized clocks, for example-T-rings A and B which generate timing pulses Tai and Tbi for microinstruction execution, synchronism is checked by logic circuitry which receives pulses from the clocks. At least one of the pulses is delayed by one or more pulse period durations ti. The logic circuit output signal is used as an input to an indicator latch which is periodically set by an independent check oscillator or clock. In a preferred embodiment, the delays are introduced by master-slave flip-flops, which receive predetermined combinations of the T-signals and set by the independent check clock. Several delay latches and associated AND gates may be used for different logical combinations of delayed and undelayed T-signals. This scheme can easily be expanded to accommodate more than two synchronously operating clocks. These circuits check not only the instantaneous synchronism of the clocks, but also the correct sequencing of clock pulses. The check is also feasible if the T-ring counters are operated with a variable number of clock pulses per microinstruction execution.

Patent Agency Ranking