2.
    发明专利
    未知

    公开(公告)号:DE60323574D1

    公开(公告)日:2008-10-30

    申请号:DE60323574

    申请日:2003-05-07

    Applicant: IBM

    Abstract: A storage device and a method for scanning a storage medium. A storage medium for storing data in the form of marks is scanned by an array of probes for mark detecting purposes in a scanning mode. The storage medium has fields with each field to be scanned by an associated one of the probes. At least one of the fields has marks representing operational data for operating the scanning mode. Scanning parameters are computed from the operational data and the scanning mode is adjusted according to the computed parameters.

    3.
    发明专利
    未知

    公开(公告)号:AT521989T

    公开(公告)日:2011-09-15

    申请号:AT09731078

    申请日:2009-01-20

    Applicant: IBM

    Abstract: A substrate via structure for stacked vias includes: a plurality of stacked vias, wherein each via is disposed on a landing; and at least one constrainer disc surrounding at least one via, for constraining in-plane deformation of the substrate via structure. The constrainer disc is embedded such that the constrainer disc is disposed between two layers of resin. The constrainer discs may be made of copper. The constrainer disc may be circular or square-shaped. Preferably there is a dielectric gap between the constrainer disc and the via.

    4.
    发明专利
    未知

    公开(公告)号:AT408880T

    公开(公告)日:2008-10-15

    申请号:AT03010254

    申请日:2003-05-07

    Applicant: IBM

    Abstract: A storage device and a method for scanning a storage medium. A storage medium for storing data in the form of marks is scanned by an array of probes for mark detecting purposes in a scanning mode. The storage medium has fields with each field to be scanned by an associated one of the probes. At least one of the fields has marks representing operational data for operating the scanning mode. Scanning parameters are computed from the operational data and the scanning mode is adjusted according to the computed parameters.

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