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公开(公告)号:WO02075810A2
公开(公告)日:2002-09-26
申请号:PCT/DE0200822
申请日:2002-03-07
Applicant: INFINEON TECHNOLOGIES AG , LEHR MATTHIAS UWE , MOECKEL JENS , TOEBBEN DIRK
Inventor: LEHR MATTHIAS UWE , MOECKEL JENS , TOEBBEN DIRK
IPC: H01L21/82 , H01L23/525 , H01L23/528
CPC classification number: H01L23/5256 , H01L23/525 , H01L23/528 , H01L2924/0002 , H01L2924/00
Abstract: A first electric connecting element (15) and a second electric connecting element (20) are placed next to one another on a substrate (5) along a first direction (Y). The first electric connecting element (15) is located at a first distance (35) from the second electric connecting element (20). A first conductor track (40) and a second conductor track (45) are placed on the substrate (5), and the first conductor track (40) is connected to the first electric connecting element (15), and the second conductor track (45) is connected to the second electric connecting element (20). A third electric connecting element (25) and a fourth electric connecting element (30) are placed on the substrate (5), and the first conductor track (40) and the second conductor track (45) are placed between the third electric connecting element (25) and the fourth electric connecting element (30) and, at this location, are located at a second distance (50) from one another that is less than the first distance (35).
Abstract translation: 上的基板(5)的第一电连接元件(15)和沿一第一方向(Y)的第二电连接元件(20)并排布置。 第一电连接件(15)具有第一距离(35)到第二电连接元件(20)。 第一导体轨道(40)和第二导体线路(45)被布置在所述基板(5)和第一导体轨道(40)被连接到所述第一电连接元件(15)和第二导体(45)上被连接到第二电连接元件 (20)。 它是在基板(5)和第一导体轨道(40)和所述第三电连接件(25)和第四之间的第二导体(45)上的第三电连接件(25)和第四电连接件(30) 布置的电连接元件(30),并具有从那里彼此的第二距离(50),其是大于所述第一距离(35)小。
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公开(公告)号:DE19926499A1
公开(公告)日:2001-03-15
申请号:DE19926499
申请日:1999-06-10
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MOECKEL JENS , RUSCH ANDREAS
IPC: H01L23/525 , H01L23/532
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公开(公告)号:DE50203196D1
公开(公告)日:2005-06-30
申请号:DE50203196
申请日:2002-03-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LEHR UWE , MOECKEL JENS , TOEBBEN DIRK
IPC: H01L21/82 , H01L23/525 , H01L23/528
Abstract: On a substrate, first and second electrical connecting elements of an integrated circuit are disposed next to one another along a first direction. The first electrical connecting element is at a first distance from the second electrical connecting element. First and interconnects are disposed on the substrate, the first interconnect being connected to the first electrical connecting element and the second interconnect being connected to the second electrical connecting element. Third and fourth electrical connecting elements are disposed on the substrate and the first and second interconnects are disposed between the third and fourth electrical connecting elements and therebetween are at a second distance from one another, the second distance being smaller than the first distance.
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公开(公告)号:DE10112543A1
公开(公告)日:2002-10-02
申请号:DE10112543
申请日:2001-03-15
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MOECKEL JENS , TOEBBEN DIRK , LEHR MATTHIAS UWE
IPC: H01L21/82 , H01L23/525 , H01L23/528
Abstract: A first electric connecting element (15) and a second electric connecting element (20) are placed next to one another on a substrate (5) along a first direction (Y). The first electric connecting element (15) is located at a first distance (35) from the second electric connecting element (20). A first conductor track (40) and a second conductor track (45) are placed on the substrate (5), and the first conductor track (40) is connected to the first electric connecting element (15), and the second conductor track (45) is connected to the second electric connecting element (20). A third electric connecting element (25) and a fourth electric connecting element (30) are placed on the substrate (5), and the first conductor track (40) and the second conductor track (45) are placed between the third electric connecting element (25) and the fourth electric connecting element (30) and, at this location, are located at a second distance (50) from one another that is less than the first distance (35).
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公开(公告)号:DE10114291C1
公开(公告)日:2002-09-05
申请号:DE10114291
申请日:2001-03-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: WEBER FRANK , FAERBER GERRIT , HUEBNER MICHAEL , MOECKEL JENS , FRITZ MARTIN
Abstract: The testing method uses a contact card (40) for application of a test voltage to one of the supply voltage terminals of each of a number of IC chips (12) incorporated in a semiconductor wafer (10) and measurement of the voltage at a second supply voltage terminal of each IC chip, for comparison with the applied voltage, for acceptance or rejection of the IC chip.
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公开(公告)号:DE10234943B4
公开(公告)日:2004-08-26
申请号:DE10234943
申请日:2002-07-31
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KEMPER FRANZ , MOECKEL JENS
IPC: H01L21/68 , H01L21/768 , H01L23/525
Abstract: A device for processing semiconductor wafers (3) has a rotatable wafer support (6) with a coaxial positioning system (7) and a processing device (1) movable radially across the wafer by a second positioning system (4,5). A positioning unit (8) determines the wafer position with respect to wafer features. An Independent claim is also included for a process to operate the above device.
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公开(公告)号:DE10152086A1
公开(公告)日:2003-05-08
申请号:DE10152086
申请日:2001-10-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MOECKEL JENS , FAERBER GERRIT , FRITZ MARTIN
Abstract: The method involves separating a connection between a defective device and the supply line, which are arranged on the wafer and connected to common data lines. Applying a test signal to the common line in order to test the remaining devices. The response signals from the common line are then assessed.
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公开(公告)号:DE19926499C2
公开(公告)日:2001-07-05
申请号:DE19926499
申请日:1999-06-10
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MOECKEL JENS , RUSCH ANDREAS
IPC: H01L23/525 , H01L23/532
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公开(公告)号:DE10152086B4
公开(公告)日:2007-03-22
申请号:DE10152086
申请日:2001-10-23
Applicant: INFINEON TECHNOLOGIES AG
Inventor: MOECKEL JENS , FAERBER GERRIT , FRITZ MARTIN
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公开(公告)号:DE10234943A1
公开(公告)日:2004-02-12
申请号:DE10234943
申请日:2002-07-31
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KEMPER FRANZ , MOECKEL JENS
IPC: H01L21/68 , H01L21/768 , H01L23/525
Abstract: A device for processing semiconductor wafers (3) has a rotatable wafer support (6) with a coaxial positioning system (7) and a processing device (1) movable radially across the wafer by a second positioning system (4,5). A positioning unit (8) determines the wafer position with respect to wafer features. An Independent claim is also included for a process to operate the above device.
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