Abstract:
PROBLEM TO BE SOLVED: To provide a better method for forming a thin film bulk acoustic resonator filter. SOLUTION: The film bulk acoustic resonator filter 10 is formed of a plurality of interconnected series and shunt film bulk acoustic resonators 38 formed on the same membrane 35. Each of the film bulk acoustic resonator 38 is formed of one common lower conductive layer which is defined to form a bottom electrode 32 of the film bulk acoustic resonator 38. The one common conductive layer is defined to form a top electrode 36 of each of the film bulk acoustic resonator 38. One common piezoelectric film layer 34 which may or may not be not patterned forms one continuous or discontinuous film. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a better method of forming a thin-film bulk acoustic resonator filter. SOLUTION: In the method of manufacturing a thin-film bulk acoustic resonator filer, a thin-film bulk acoustic resonator filter 10 includes a plurality of thin-film bulk acoustic resonators 38a to 38g series-connected and branched on the same film 35. The thin-film bulk acoustic resonators 38a to 38g are made of a single common lower conductive layer to have respective bottom electrodes of the thin-film bulk acoustic resonators. The single common conductive layer is provided to form respective upper electrodes of the thin-film bulk acoustic resonators 38a to 38g. A common piezoelectric thin-film layer, which may or may not be patterned, is formed as a thin film continuous as a single or not continuous. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
A film bulk acoustic resonator filter may be formed with a plurality of interconnected series and shunt film bulk acoustic resonators formed on the same membrane. Each of the film bulk acoustic resonators may be formed from a common lower conductive layer which is defined to form the bottom electrode of each film bulk acoustic resonator. A common top conductive layer may be defined to form each top electrode of each film bulk acoustic resonator. A common piezoelectric film layer, that may or may not be patterned, forms a continuous or discontinuous film.
Abstract:
An FBAR device may be chemically functionalized by depositing an interactive layer so that targeted chemicals are preferentially adsorbed. Such miniaturized chemical sensors may be combined with wireless network technology. For example, a chemical sensor may be integrated in a cell phone, PDA, a watch, or a car with wireless connection and GPS. Since such devices are widely populated, a national sensor network may be established. Consequently, a national toxicity map can be generated in real time. Detailed chemical information may be obtained, such as if a chemical is released by a source fixed on ground or by a moving object, or if is spread by explosives or by wind and so on.
Abstract:
A film bulk acoustic resonator formed on a substrate (710) includes a layer of piezoelectric material (735) having a first major surface, and a second major surface sandwiched between a first conductive (732) and a second conductive layer (736). The substrate on which the film bulk acoustic resonator is formed has an opening (750) therein which exposes the first conductive layer (732) of the film bulk acoustic resonator. The opening (750) is substantially in the shape of a parallelogram having a first pair of parallel sides (751, 752) and a second pair of parallel sides. One of the first pair of parallel sides makes an angle at other than 90 degrees with one of the second pair of parallel sides.
Abstract:
A method and apparatus for calibrating a sigma-delta analogue-to-digital converter (ADC) which comprises an n-bit feedback digital-to-analogue converter as part of its feedback loop, the digital-to-analogue converter (DAC) having a plurality of cells and including at least one calibration digital-to-analogue converter. The calibration DAC may comprise a single global calibration digital-to-analogue converter associated with a plurality of cells. The apparatus may further comprise a state machine which receives a portion of the digital output of the ADC in accordance with a sequence of values measured during a calibration process. The sequence of values may be associated with a cell of the feedback converter.
Abstract:
A FILM BULK ACOUSTIC RESONATOR FILTER (10) MAY BE FORMED WITH A PLURALITY OF INTERCONNECTED SERIES AND SHUNT FILM BULK ACOUSTIC RESONATORS (38) FORMED ON THE SAME MEMBRANE (35). EACH OF THE FILM BULK ACOUSTIC RESONATORS (38) MAY BE FORMED FROM A COMMON LOWER CONDUCTIVE LAYER WHICH IS DEFINED TO FORM THE BOTTOM ELECTRODE (32) OF EACH FILM BULK ACOUSTIC RESONATOR (38). A COMMON TOP CONDUCTIVE LAYER MAY BE DEFINED TO FORM EACH TOP ELECTRODE (36) OF EACH FILM BULK ACOUSTIC RESONATOR (38). A COMMON PIEZOELECTRIC FILM LAYER (34), THAT MAYOR MAY NOT BE PATTERNED, FORMS A CONTINUOUS OR DISCONTINUOUS FILM. FIG 1 & 9.
Abstract:
A film bulk acoustic resonator is formed on a substrate having a major surface. The film bulk acoustic resonator includes an elongated stack. The elongated stack includes a layer of piezoelectric material positioned between a first conductive layer deposited on a first surface of the layer of piezoelectric material, and a second conductive layer deposited on a second surface of the layer of piezoelectric material. The elongated stack is positioned substantially perpendicular with respect to the major surface of the substrate. The first and second conductive layers are placed on the layer of piezoelectric material substantially simultaneously and in one processing step. The major surface of the substrate is in a horizontal plane and the stack of the film bulk acoustic resonator is in a substantially vertical plane. The resonator structure formed may be used either as a resonator or a filter.
Abstract:
A film bulk acoustic resonator filter (10) may be formed with a plurality of interconnected series and shunt film bulk acoustic resonators (38) formed on the same membrane (35). Each of the film bulk acoustic resonators (38) may be formed from a common lower conductive layer which is defined to form the bottom electrode (32) of each film bulk acoustic resonator (38). A common top conductive layer may be defined to form each top electrode (36) of each film bulk acoustic resonator (38). A common piezoelectric film layer (34), that may or may not be patterned, forms a continuous or discontinuous film.
Abstract:
A film bulk acoustic resonator filter (10) may be formed with a plurality of interconnected series and shunt film bulk acoustic resonators (38) formed on the same membrane (35). Each of the film bulk acoustic resonators (38) may be formed from a common lower conductive layer which is defined to form the bottom electrode (32) of each film bulk acoustic resonator (38). A common top conductive layer may be defined to form each top electrode (36) of each film bulk acoustic resonator (38). A common piezoelectric film layer (34), that may or may not be patterned, forms a continuous or discontinuous film.